Corinne Bestory
	IM2NP - Polytech Dpt Microélectronique et Télécommunications 38, rue Frédéric Joliot-Curie IMT Technopôle de Château Gombert 13451 Marseille Cedex 20
	téléphone : +33 (0)4 91 05 47 83
	mail : corinne.bestory@im2np.fr

---

Postdoc

• Equipe "RFID Capteurs"

---

Domaine d'activité : Electronique organique pour systèmes RFID

Fabrication, modélisation et caractérisation de composants électroniques à base de polymères organiques

---

Publications :

Bestory, C; Marc, F; Duzellier, S; Levi, H. 2009. Electrical aging behavioral modeling for reliability analyses of ionizing dose effects on an n-MOS simple current mirror. MICROELECTRONICS RELIABILITY 49 (9-11):946-951, .

DOI 10.1016/j.microrel.2009.07.025

Bestory, C; Marc, F; Levi, H. 2007. Statistical analysis during the reliability simulation. MICROELECTRONICS RELIABILITY 47 (9-11):1353-1357, .

DOI 10.1016/j.microre1.2007.07.079

Marc, F; Mongellaz, B; Bestory, C; Levi, H; Danto, Y. 2006. Improvement of aging simulation of electronic circuits using behavioral modeling. IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY 6 (2):228-234, .

DOI 10.1109/TDMR.2006.879117

Marc, F; Mongellaz, B; Bestory, C; Levi, H; Danto, YTung, CH; Lim, S; Chin, JM; Trigg, A. 2005. Improvement of ageing simulation of electronic circuits based on behavioural modelling. IPFA 2005: Proceedings of the 12th International Symposium on the Physical & Failure Analysis of Integrated Circuits 195-199.

Essely, F; Bestory, C; Guitard, N; Bafleur, A; Wislez, A; Doche, E; Perdu, P; Touboul, A; Lewis, D. 2004. Study of the ESD defects impact on ICs reliability. MICROELECTRONICS RELIABILITY 44 (9-11):1811-1815, .

DOI 10.1016/j.microrel.2004.07.090

Mongellaz, B; Marc, F; Bestory, C; Danto, YIEEE. 2004. A CMOS analogue function VHDL-AMS behavioral ageing model. Proceedings of the IEEE-ISIE 2004, Vols 1 and 2 187-192.

---