Olivier Ginez
	IM2NP 38, rue Frédéric Joliot-Curie IMT Technopôle de Château Gombert 13451 Marseille Cedex 20 France
	téléphone : + 33 (0) 4 91 05 47 87
	mail : olivier.ginez@im2np.fr

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ATER Université d'Aix-Marseille

• Equipe "Mémoires"
  

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Domaine d'activité : design et test de mémoires non volatiles type FLASH

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Publications

O. Ginez, J.-M. Daga, M. Combe, P. Girard, C. Landrault, S. Pravossoudovitch, A. Virazel, “An Overview of Failure Mechanisms in Embedded Flash Memories”, Proc. of IEEE VLSI Test Symposium., Berkeley, 2006, pp. 108-113.

O. Ginez, J.-M. Daga, P. Girard, C. Landrault, S. Pravossoudovitch, A. Virazel, “Embedded Flash Testing: Overview and Perspectives”, Proc. of IEEE DTIS., Tunis, 2006, pp. 86-92.

O. Ginez, P. Girard, C. Landrault, S. Pravossoudovitch, A. Virazel, and J.-M. Daga, “Retention and Reliability Problems in Embedded Flash Memories: Analysis and Test of Defective 2T-FLOTOX Tunnel Window”, Proc. of IEEE VLSI Test Symposium, 2007.

O. Ginez, P. Girard, C. Landrault, S. Pravossoudovitch, A. Virazel, and J.-M. Daga, “Electrical Simulation Model of the 2T-FLOTOX Core-Cell for Defect Injection and Faulty Behavior Prediction in eFlash”, Proc. of IEEE European Test Symposium, 2007.

O. Ginez, P. Girard, C. Landrault, S. Pravossoudovitch, A. Virazel, and J.-M. Daga, “A Concurrent Approach for Testing Address Decoder Faults in eFlash Memories” To appear in Proc. of IEEE International Test Conference, 2007.

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