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ARCSIS
BP 19
Place Paul Borde
13790 ROUSSET
France
Phone: +33 4 42 53 81 50
Fax: +33 4 42 53 81 51
E-mail: contact@arcsis.org
www.arcsis.org
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ARCSIS is the trade association for the microelectronic/semiconductor activities in the Provence-Alpes-Cote d’Azur (PACA) region of France, focusing on secure communicating objects. It includes research and industry partners, with 52 members. ARCSIS manages a major collaborative research and development program CIM PACA (PACA Integrated Microelectronics Center). CIM PACA groups the microelectronic community around three dedicated platforms of collaborative development for secure communicating objects: design, characterization and micro-packaging. ARCSIS is a key member of the Pole of Competitivity Secure Communicating Solutions which has been designated at the world-class level by the French government in July 2005.
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Exhibit contact :
Vincent BOISARD vincent.boisard@arcsis.org |
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FONDIS ELECTRONIC
Quartier de l’Europe
4, rue Galilée
78285 GUYANCOURT Cedex
France
Phone: +33 1 34 52 10 30
Fax: +33 1 30 57 33 25
E-mail: jp.saez@fondiselectronic.com
www.fondiselectronic.com
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FONDIS ELECTRONIC is recognized on the French market in analytical instruments dedicated for Material Science Research and Semi-conductors Applications providing AFM Microscopes from PSIA, Optical Profilers from OPM etc... |
Exhibit contact :
Jean-Pierre SAEZ
jp.saez@fondiselectronic.com |
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LEYBOLD VACUUM France
7 Avenue du Québec
91942 Courtaboeuf
France
Phone: +33 1 69 82 48 00
Fax: +33 1 69 07 57 38
E-mail: valerie.balletti@leybold.com
www.leybold.com |
We are world-wide providers of vacuum solutions responding quickly to customer’s requirements and are inherently reliable with respect to products, services and organization.
We build: Rotary Vane Vacuum Pumps, Diffusion Pumps, Valves, Fittings, Gauges, Leak Testing Instruments, … |
Exhibit contact :
Benoit Hoppenot
benoit.hoppenot@leybold.com
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OMICRON NANO TECHNOLOGY
Le Plan d’Aigues, RN 7
13760 ST-CANNAT
France
Phone: +33 4 42 50 68 64
Fax: +33 4 42 50 68 65
E-mail: omicron.nanotechnology@wanadoo.fr
www.omicron.de |
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Exhibit contact :
Claude VIGUIER
omicron.nanotechnology@wanadoo.fr
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ORSAY PHYSICS
ZA Saint Charles
95 avenue des Monts Auréliens
13710 FUVEAU
France
Phone: +33 4 42 53 80 90
Fax: +33 4 42 53 80 91
E-mail: nano@orsayphysics.com
www.orsayphysics.com
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Orsay Physics is a world leader in the field of focused ion/electron beam design and production.
Owing to its experience and flexibility, Orsay Physics has developed high performance equipment with a large number of customised optics, ranging from photon/ion coaxial beams design to mass-filtered columns for R&D applications of local implantation.
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Exhibit contact :
Vincent MORIN
vincent.morin@orsayphysics.com
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RAITH GmbH
Hauert 18
Technologiepark
44227 DORTMUND
Germany
Phone: +49 231 97 50 00-0
Fax: +49 231 97 50 00-5
E-mail: postmaster@raith.com
www.raith.com |
Raith manufactures a variety of electron beam lithography systems for research and development applications designed to meet the needs of researchers, designers, and engineers in both university and industry settings. Raith nanolithography products range from stand alone electron beam writing tools to retrofit lithography attachments for SEM/FIB.
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Exhibit contact :
Frank NOUVERTNE
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VEECO INSTRUMENTS
Z.I. de la Gaudrée
11 rue Marie Poussepin
B.P. 43
91412 DOURDAN Cedex
France
Phone: +33 1 64 59 35 20
Fax: +33 1 64 59 72 22
E-mail: sales@veeco.fr
www.veeco-europe.com
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Veeco has long held a leadership role in advanced 3D instrumentation for metrology for research and production.
Veeco tailors AFM technology for specific applications many on the atomic level. The new Nanoscope V controller further extends the industry-leading capabilities of Veeco’s broad range of scanning probe microscope (SPM) systems, including the Dimension® V, Nanoman® V, and Multimode® V.
Wyko® NT Series non-contact Optical Profilers provide an unmatched combination of speed, resolution and repeatability, for measurement of surface features.
Dektak® stylus profilers accurately assess step heights, trench depths, stress and surface roughness.
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Exhibit contact :
Marie-France CLEVENOT
mfclevenot@veeco.fr
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