 | Franck Bocquet |
| IM2NP Faculté des Sciences et Techniques Avenue Escadrille Normandie Niemen Service 151 13397 Marseille Cedex 20 France téléphone : + 33 (0) 4 91 28 85 68 |
| | Franck Bocquet |
| IM2NP Faculté des Sciences et Techniques Avenue Escadrille Normandie Niemen Service 151 13397 Marseille Cedex 20 France téléphone : + 33 (0) 4 91 28 85 68 |
Maître de conférences, Université Paul Cézanne Aix-Marseille III
Equipe Nanostructuration
Membre titulaire de la commission de spécialistes (33)
Domaines d'activité :
nc-AFM, Ultravide, Assemblage moléculaire en surface, isolantsPublications récentes dans des revues avec comité de lecture
« On the relevance of the atomic-scale contact potential difference by amplitude-modulation and frequency-modulation Kelvin probe force microscopy » L. Nony, F.Bocquet, Ch.Loppacher and Th.Glatzel, Nanotechnology 20, 264014 (2009)
« Understanding the Atomic-Scale Contrast in Kelvin Probe Force Microscopy » L.Nony, A.S.Foster, F.Bocquet and Ch.Loppacher, Physical Review Letters 103, 036802 (2009)
« Analytical approach to the local contact potential on (001) ionic surfaces : implications for Kelvin probe force microscopy », F. Bocquet, L. Nony, C. Loppacher, T. Glatzel, Physical Review B, vol. 78, p. 035410 (2008)
A methodolgy to improve accuracy of the sp2/sp3 quantification from C-K edge EELS spectra in carbon based materials.- N. Bernier, F. Bocquet A. Allouche, W. Saikaly, C. Brosset, J. Thibault, and A. Charaï.- Actuellement en révision à Journal of Electron Spectroscopy
Evolution of ELNES spectra as function of experimental settings for any uniaxial specimen: a fully relativistic study.- F. Bocquet, N. Bernier, W. Saikaly, C. Brosset, J. Thibault, and A. Charaï.- Ultramicroscopy, 107 (2007), 81-94
Pit formation and segregation effect during Cu thin film growth on Ag(111).- C. Maurel, M. Abel, M. Koudia, F. Bocquet, and L. Porte.- Surface Science 596, (2005) 45-52
Segregation mediated capping of Volmer-Weber Cu islands grown on Ag(111).- F. Bocquet, C. Maurel, J.M. Roussel, M. Abel, M. Koudia, and L. Porte.- Phys. Rev. B 71, (2005) 075405
Stresses and Interfacial Structure in Metal films and Multilayers of Nanometer Thickness.- O. Thomas, S. Labat, T. Bigault, P. Gergaud and F. Bocquet.- Journal of Metastable and Nanocrystalline materials , 19, 129-152 (2004)
Stresses and interfacial structure in Au-Ni and Ag-Cu metallic multilayers.- S. Labat, F. Bocquet, B. Gilles, O. Thomas.- Scripta Materialia 50, 717 (2004)
In-Situ Stress measurements during the growth, at different temperatures of Ag-Cu (111) multilayers.- F. Bocquet, T. Bigault, C. Alfonso, S. Labat, O. Thomas, A. Charai.- Journal of Applied Physics , 95 (3), (2004) 1152-1161
X-Ray diffraction from inhomogeneous thin films of nanometre thickness: modelling an experiment.- F. Bocquet, P. Gergaud, O. Thomas.- Journal of Applied Crystallography, 36 (2003) 154-157
Piezoelectric tantalum pentoxide studied for optical tunable application.- R. Parmentier, F. Lemarchand, M. Cathelino, M. Lesquine, C. Amra, S. Labat, S. Bozzo, F. Bocquet, A. Charai, O. Thomas.- Applied Optics, 41, 16 (2002) 3270-3276
Chemically diffuse interface in (111) Au-Ni multilayers: an anomalous X-Ray diffraction analysis.- T. Bigault, F. Bocquet, S. Labat, O. Thomas, H. Renevier.- Applied Surface Science 188 (2002) 110-114
