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Maître de conférences Université d'Aix-Marseille

Equipe "Mémoires"

Domaine d'activité : design et test de mémoires non volatiles type FLASH

Publications

Revues
O. Ginez, P. Girard, C. Landrault, S. Pravossoudovitch, A. Virazel, J.-M. Daga, “Electrical Simulation Model of the 2T-FLOTOX Core cell for Defect Injection and Faulty Behavior Prediction in eFlash”Accepted for publication in JETTA: Journal of Electronics Testing: Theory and Applications, Elsevier Publishers.

H. Aziza, E. Bergeret, J.-M. Portal and O. Ginez“A New Low Power Oriented Design Methodology for Analog Blocks”, Journal of Low Power Electronics 2008, Vol. 4, No. 1, p. 60-67, 2008

Brevet
O. Ginez, B. Godard and J.-M. Daga“Method and System for Providing a Nonvolatile Content Addressable Memory using a single FloTOx Element”US Patent, USPTO-11650104, 5 Janvier 2007.

Conférences internationales avec actes et comité de lecture à diffusion publique
O. Ginez, J.-M. Daga, M. Combe, P. Girard, C. Landrault, S. Pravossoudovitch, A. Virazel“An Overview of Failure Mechanisms in Embedded Flash Memories”24^th IEEE VLSI Test Symposium, Berkeley , USA , May 2006, pp. 108-113, ISBN 0-7695-2514-8, ISSN 1093-0167.

O. Ginez, J.-M. Daga, P. Girard, C. Landrault, S. Pravossoudovitch, A. Virazel“Embedded Flash Testing: Overview and Perspectives”1^st IEEE International Conference on Design and Test of Integrated Systems, Tunis , Tunisia , September 2006, pp. 86-92, ISBN: 0-7803-9727-4.

O. Ginez, P. Girard, C. Landrault, S. Pravossoudovitch, A. Virazel, J.-M. Daga“Retention and Reliability Problems in Embedded Flash Memories: Analysis and Test of Defective 2T-FLOTOX Tunnel Window”25^th IEEE VLSI Test Symposium, Berkeley , USA , May 2007, pp. 47-52, ISBN: 0-7695-2812-0, ISSN: 1093-0167.

O. Ginez, P. Girard, C. Landrault, S. Pravossoudovitch, A. Virazel, J.-M. Daga“Electrical Simulation Model of the 2T-FLOTOX Core cell for Defect Injection and Faulty Behavior Prediction in eFlash”12^th IEEE European Test Symposium, Freiburg , Germany , May 2007, pp. 77-84, ISBN: 0-7695-2827-9, ISSN: 1530-1877.

O. Ginez, P. Girard, C. Landrault, S. Pravossoudovitch, A. Virazel, J.-M. Daga“A Concurrent Approach for Testing Address Decoder Faults in eFlash Memories”IEEE International Test Conference, Santa Clara , USA , October 2007, paper 3.2, ISBN 1-4244-1128-9.

H. Aziza, J.-M. Portal, O. Ginez and E. Bergeret“An Efficient Diagnosis Methodology for Charge Pump Circuits: Application to Flash EEPROM Devices”Accepted to appear in Proc. of the 3^rdIEEE International Conference on Design and Test of Integrated Systems, Tozeur , Tunisia , March 25^th-28^th, 2008.

O. Ginez, H. Aziza, J.-M. Portal“Reliability Issues in Flash Memories: An On-Line Diagnosis and Repair Scheme for Word Line Drivers”Proc. of the 14^th IEEE IMS3TW, Vancouver , Canada , June 18^th-20^th, 2008.

H. Aziza, J.-M. Portal, O. Ginez and E. Bergeret“An efficient Diagnosis Methodology for Analog Blocks: Application to Current Reference Circuits”Accepted to appear in Proc. of the 13^th IEEE European Test Symposium, Lago Maggiore , Italy , May 25^th-29^th, 2008.

Conférences internationales avec actes et comité de lecture à diffusion restreinte

O. Ginez, J-M. Daga, P. Girard, C. Landrault, S. Pravossoudovitch, A. Virazel “New Test Methodologies for Embedded and Stacked Flash Memories”South European Test Symposium (SETS), Pitztal , Austria 2005

Thèse
O. Ginez,“Fault Modeling and Testing of Flash Memories”Thèse de doctorat, Université Montpellier II, Montpellier, 2007,142 pages.

Communications nationales
O. Ginez, J-M. Daga, P. Girard, C. Landrault, S. Pravossoudovitch, A. Virazel“Test des Mémoires Flash Embarquées : Analyse de la perturbation entre cellules FloTOx voisines durant une phase de programmation”JNRDM : Journées Nationales du Réseau Doctoral de Microélectronique, Lille, France, 14-16 Mai 2007.

O. Ginez, J-M. Daga, P. Girard, C. Landrault, S. Pravossoudovitch, A. Virazel“Embedded Flash Testing”Groupement de Recherche SoC/SiP, Paris, France, 6 Juin 2007.

Invitation orales dans conférences internationales
O. Ginez, H. Aziza, J.-M. Portal“A Novel Method to Address Reliability Issues in Flash Memories”23^rdIEEE NVSMW / 3^rd ICMTD, Opio , France , May 18^th-22^th, 2008.

	Olivier Ginez
	IM2NP Site Polytech 38, rue Frédéric Joliot-Curie IMT Technopôle de Château Gombert 13451 Marseille Cedex 20 France
	téléphone : + 33 (0) 4 91 05 47 87
	mail : olivier.ginez@im2np.fr