 | Christophe Girardeaux |
| IM2NP Faculté des Sciences et Techniques Avenue Escadrille Normandie Niemen Case 142 13397 Marseille Cedex 20 France | |
| téléphone : +33 (0) 4 91 28 89 57 fax : + 33 (0) 4 91 28 87 75 | |
| mail : christophe.girardeaux@im2np.fr |
| | Christophe Girardeaux |
| IM2NP Faculté des Sciences et Techniques Avenue Escadrille Normandie Niemen Case 142 13397 Marseille Cedex 20 France | |
| téléphone : +33 (0) 4 91 28 89 57 fax : + 33 (0) 4 91 28 87 75 | |
| mail : christophe.girardeaux@im2np.fr |
Professeur, Université d'Aix-Marseille
Publications récentes :
Erdelyi Z., Girardeaux C., Langer G.A., Rolland A., Beke D.L.- Determination of grain-boundary diffusion coefficients by Auger electron spectroscopy.- Applied Surface Science, vol. 162-63, p. 213-218, 2000
Girardeaux C., Tokei Zs., Rolland A.- First stages in the formation of ultra thin nickel layers on Cu(111) and Ge(111) and dissolution : an AES comparative study.- Applied Surface Science, vol. 162-63, p. 208-212, 2000
Tokei Zs., Erdelyi Z., Girardeaux C., Rolland A.- Effect of sulphur content and preannealing treatment on nickel grain boundary diffusion in pure copper.- Philosophical Magazine A, vol. 80, n° 5, p. 1075-1083, 2000
Erdelyi Z., Girardeaux Ch., Bernardini J., Beke D.L., Rolland A.- Experimental and theoretical study of type C GB and volume diffusion by AES in metal/metal structures.- Diffusion and Defect Data. Solid State Data. Part A, Defect and Diffusion Forum, vol 194-199, 1161-1166, 2001
Erdelyi Z., Girardeaux Ch., Langer G.A., Beke D.L., Rolland A., Bernardini J.- Determination of GB diffusion of Ag in nanocrystalline Cu by Hwang-Balluffi method.- Journal of Applied Physics, vol. 89, p. 3971-3975, 2001
Nyeki J., Girardeaux C., Erdelyi Z., Langer G.A., Erdelyi G., Beke D.L., Rolland A.- AES study of surface segregation of Ge in amorphous Si1-xGex thin film alloys.- Surface Science, vol. 495, n° 3, p. 195-203, 2001
Erdelyi Z., Beke D. L., Bernardini J., Girardeaux Ch , Rolland A.- Investigations of diffusion kinetics by Auger electron spectroscopy.- Diffusion and Defect Data. Solid State Data. Part A, Defect and Diffusion Forum, vol. 203-205, p. 131-146, 2002
Erdelyi Z., Girardeaux C., Tokei Zs., Beke D.L., Cserhati Cs., Rolland A.- Investigation of the interplay of nickel dissolution and copper segregation in Ni/Cu(111) system.- Surface Science, vol. 496, n° 1-2, p. 129-140, 2002
Gas P., Girardeaux C., Mangelinck D., Portavoce A.- Reaction and diffusion at interfaces of micro and nano structured materials.- Material Science and Engineering B, acceptée, 2002
Girardeaux C., Clugnet G., Erdelyi Z., Nyeki J., Bernardini J., Beke D. L., Rolland A.- How to measure accurately mass transport in thin films by AES.- Surface and Interface Analysis, vol. 34, p. 389-392, 2002
Bernardini J., Girardeaux C., Rolland A. and Beke D.L.- Effect of grain boundary segregation and migration on diffusion profiles : analysis and experiments. Interface Science, vol. 11, p. 33-40, 2003
Gas P., Girardeaux C., Mangelinck D., Portavoce A. - Reaction and diffusion at interfaces of micro and nanostructured materials. - Material Science and Engineering B, vol. 101, p. 43-, 2003
Nyeki J., Girardeaux C, Erdelyi G., Rolland A, Bernardini J. - Equilibrium surface segregation enthalpy of Ge in concentrated amorphous SiGe alloys. - Applied Surface Science, vol. 212-213, p. 244-248, 2003
Oughaddou H., Léandri C., Aufray B., Girardeaux C., Bernardini J., Lelay G., Bibérian J.P., Barrett N. - Growth and dissolution kinetics of Au/Pb(111) : an AES-LEED study. - Applied Surface Science, vol. 212-213, p. 291-295, 2003
Rolland A., Bernardini J., Moya G. et Girardeaux C.- Kinetics of tin segregation on crystalline semi-conductor surfaces: effect of the defects induced by ion bombardment.- Surface Science, vol. 566-568, p. 1163-1168, 2004
Bernardini J., Girardeaux C., Erdélyi Z. and Lexcellent C.- Grain boundary diffusion and segregation in nanolayered materials.- in “Nanodiffusion, Diffusion in Nanostructured Materials”, Journal of Metastable and Nanocrystalline Materials, vol. 19, D.L. Beke (ed), Scitec et Trans Tech Publications Ltd., Zurich, 2004
Leandri C., Le Lay G., Aufray B., Girardeaux C., Avila J., Dávila M.E., Asensio M.C., Ottaviani .-C., Cricenti A.- Self-aligned silicon quantum wires on Ag (110).- Surface Science, vol. 574, n° 1, p. L9-L15, 2005
Nyéki J., C. Girardeaux, Z. Erdélyi, A. Csik, L. Daroczi, G. Langer, D.L. Beke, A. Rolland, J. Bernardini and G. Erdélyi Sb diffusion and segregation in amorphous Si thin films.- Defect and Diffusion Forum, vol. 237-240, p. 1246, 2005
Bergman C.,Girardeaux C., Perrin C., Gas P., Chatain D., Dubois J.M., Rivier N.R. Wetting of decagonal Al13Co4 and cubic AlCo thin films by liquid Pb. Philosophical Magazine, vol. 86, n° 68, p. 849854, 2006 2006
Bernardini J, Girardeaux C., Rolland A. Experimental evidence of iron segregation in copper grain boundaries as deduced from type B diffusion measurements. Defect and Diffusion Forum, vol. 249, p. 161, 2006 2006
Dalmas J., Oughaddou H., Lelay G., Aufray B., Treglia G., Girardeaux C., Bernardini J, Fujii J., Panaccione G. Photoelectron spectroscopy study of Pb/Ag(111) in the submonolayer range. Surface Science, vol. 600, n° 6, p. 1227-1230, 2006 2006
Girardeaux C., Aufray B., Bernardini J., Dallaporta H., Le Lay G. and Soukiassian P. Préface. Journal de Physique IV - Proceedings, vol. 132, III-3, 2006 2006
Leandri C., Aufray B., Le Lay G., Girardeaux C., Ottaviani C. and Cricenti A. Ordered silicon structures on silver (100) at 230°C. Journal de Physique IV - Proceedings, vol. 132, p. 311, 2006 2006
Nyeki J.,Girardeaux C., Rolland A., Bernardini J. AES measurements of Sb mass transport in amorphous Si thin films. Journal de Physique IV - Proceedings, vol. 132, p. 255-, 2006 2006
Rodriguez N., Adrian J., Grosjean C., Haller G., Girardeaux C., Portavoce A. Evaluation of scanning capacitance microscopy sample preparation by focused ion beam. Microelectronics Reliability, vol. 46, n° 9-11, p. 1554-1557, 2006 2006
Adrian J; Rodriguez, N; Essely, F, Haller G, Grosjean C, Portavoce A, Girardeaux C. Investigation of a new method for dopant characterization. Microelectronics Reliability, vol. 47, n° 9-11, p. 1599-1603, 2007 2007
Balogh Z., Erdelyi Z., Beke DL., Langer GA., Csik A., Boyen HG., Wiedwald U., Ziemann P., Portavoce A., Girardeaux C. Transition from anomalous kinetics toward Fickian diffusion for Si dissolution into amorphous Ge. Applied Physics Letters, vol. 92, n° 14, p. 143104, 2008 2008
Bergman C., Girardeaux C., Perrin-Pellegrino C., Gas P., Dubois JM., Rivier N. Contact angles of liquid metals on quasicrystals. Journal of Physics-Condensed Matter, vol. 20, 31, p. 314010, 2008 2008
Lalmi B, Girardeaux C., Portavoce A., Bernardini J., Aufray B. Growth and dissolution kinetics of ultra thin silicon films on Cu(100). Journal of Nanoscience and Nanotechnology, acceptée, 2009 2009
Lalmi B., Bernardini J., Rolland A., Portavoce A., Girardeaux C., Rangis A., Biberian J.P., Aufray B. Kinetics and structural aspects of the first stages of silicides formation : Si/Ni (111). Journal of Nanomaterials, acceptée, 2009 2009
