![]() | Abderrahmame Si Ahmed |
| IM2NP Faculté des Sciences et Techniques Avenue Escadrille Normandie Niemen Case 142 13397 Marseille Cedex 20 France | |
| téléphone : + 33 (0) 4 91 28 80 29 fax : +33 (0) 4 91 28 87 75 | |
Ingénieur de recherche, Université d'Aix-Marseille III
Publications récentes :
Kansy J., Si Ahmed A., Liébault J., Moya G.- Surface concentration of defects at grain boundaries in sintered alumina determined by positron annihilation lifetime spectroscopy.- Acta Physica Polonica A, vol. 100, p. 431-435, 2001
Liébault J., Kansy J. , Si Ahmed A., Moya G.- Correlation between the dielectric breakdown strength and the positron life time measurements in sintered alumina.- Le Vide: Science, Technique et Applications, suppl., p. 165-168, 2001
Siles S., Moya G., Si Ahmed A., Kansy J.- Positron annihilation study of collagen biopolymer : comparison between the three-component and the elastic thermalization lifetime analyses.- Materials Science Forum, vol. 363-365, p. 331-334, 2001
Moya G., Kansy J., Si Ahmed A., Liebault J., Moya F., Goeuriot D. - Positron lifetime measurements in sintered alumina. - Physica Status Solidi (a), vol.198, n°1, p.215-223, 2003
Si Ahmed A., Kansy J., Zarbout K., Moya G., Goeuriot D.- Positron trapping within the grain and at grain boudaries in sintered alumina of high impurity content.- Materials Science Forum, vol.445-446, p.177-180, 2004
Gontier-Moya E.G., Si Ahmed A., Moya F.- Interface mass transport in oxide materials. in “Materials for Energy Conversion Devices”, Ch. Sorrell, Suano Sugihara and J. Nowotny (eds), Woodhead Publishers, Cambridge, U.K., p. 286-302, 2005
Si Ahmed A., Kansy J., Zarbout K., Moya G., Liebault J., Goeuriot D.- Microstructural origin of the dielectric breakdown strength in alumina: A study by positron lifetime spectroscopy.- Journal of the European Ceramic Society, vol. 25, p. 2813-2816, 2005
Zarbout K., Moya G., Bernardini J., Moya-Siesse D., Si Ahmed A., Kansy J., Goeuriot D.- Consequences of silicon segregation on the dielectric properties of sintered alumina.- Defect and Diffusion Forum, vol. 249, p. 281-286, 2006
Zarbout K., Si Ahmed A., Moya G., Bernardini J., Goeuriot D., Kallel A.- Stability of trapped charges in sapphires and alumina ceramics: evaluation by secondary electron emission.- Journal of Applied Physics,- vol. 103, n° 6, p.054107/1-054107/7, 2008
