![]() | Jean-Marc Themlin |
| IM2NP Faculté des Sciences et Techniques Avenue Escadrille Normandie Niemen Service 151 13397 Marseille Cedex 20 France | |
| téléphone : + 33 (0) 4 91 28 81 30 fax : + 33 (0) 4 91 28 87 75 | |
| mail : jean-marc.themlin@im2np.fr |
Professeur, Université d'Aix-Marseille
Domaine d'activité :
Publications récentes :
Charrier A., F. Thibaudau, J.M. Themlin, I. Forbeaux, J.M. Debever.- Electronic structure of alpha and gamma phases of Si(111)-Root(3)xRoot(3)-Sn.- Applied Surface Science, vol. 162/163, p. 375-379, 2000
Forbeaux I., J.M. Themlin, A. Charrier, F. Thibaudau, J.M. Debever.- Solid-state graphitization mechanisms of silicon carbide 6H-SiC polar faces.- Applied Surface Science, vol. 162/163, p. 406-412, 2000
Strocov V.N., P. Blaha, H. I. Starnberg, M. Rohlfing, R. Claessen, J.M. Debever and J.M. Themlin.- Three-dimensional unoccupied band structure of graphite : very-low-energy electron diffraction and band calculations.- Physical Review B, vol. 61, p. 4994-5001, 2000
Strocov V.N., P. Blaha, H.I. Starnberg, R. Claessen, J.M. Themlin, J.M. Debever.- The 3D unoccupied band structure of graphite by very-low-energy electron diffraction.- Applied Surface Science, vol. 162/163, p. 508-512, 2000
Charrier A., R. Pérez, F. Thibaudau, J.M. Debever, J. Ortega, F. Flores, and J.M. Themlin.- Contrasted electronic properties of Sn-adatom-based (Root(3)xRoot(3))R30° reconstructions on Si(111).- Physical Review B, vol. 64, p. 115407-, 2001
Charrier A., R. Pérez, F. Thibaudau, J.M. Debever, J. Ortega, F. Flores, and J.M. Themlin.- Correlated surface bands of the prototypical interface Sn/Si(111)-Root(3)xRoot(3).- Applied Surface Science, vol. 175/176, p. 195-200, 2001
Charrier A., R. Pérez, F. Thibaudau, J.M. Debever, J. Ortega, F. Flores, and J.M. Themlin.- Many-body effects in the electronic structure of Sn/Si(111)-Root(3)-alpha.- Journal of Physics C : Condensed Matter, vol. 13, p. L1-L8, 2001
Flores F., J. Ortega, R. Pérez, A. Charrier, F. Thibaudau, J.M. Debever and J.M. Themlin.- Electron correlation effects at the Sn/Si(111)-3x3, Root(3)xRoot(3) and Ge/Si(111)-3x3, Root(3)xRoot(3) reconstructions.- Progress in Surface Science, vol. 67 , p. 299-, 2001
Strocov V.N., A. Charrier, J.M. Themlin, M. Rohlfing, R. Claessen, N. Barrett, J. Avila, J. Sanchez, M.C. Asensio.- Photoemission from graphite: Intrinsic and self-energy effects.- Physical Review B, vol. 64, p. 075105-, 2001
Charrier A., A. Coati, T.Argunova, F. Thibaudau, Y. Garreau, R. Pinchaux, I. Forbeaux, J.M. Debever, M. Sauvage-Simkin, and J.M. Themlin.- Solid-state decomposition of silicon carbide for growing ultra-thin heteroepitaxial graphite films.- Journal of Applied Physics, vol. 92, n° 5, p. 2479-, 2002
Palmino F., Ehret E., Mansour L., Labrune J.-C. , Lee G., Kim H., Themlin J.M. - 3x2 reconstruction of the Sm/Si(111) interface. - Physical Review B, vol. 67, p. 195413-, 2003
Barrett N., Krasovskii E.E., Themlin J.-M., Strocov V.N.- Elastic scattering effects in the electron mean free path in a graphite overlayer studied by photoelectron spectroscopy and LEED.- Physical Review B, vol. 71, p. 035427, 2005
Amsalem P., Giovanelli L., Themlin J.M., Koudia M., M. Abel M., Oison V., Ksari Y., Mossoyan M., Porte L. Interface formation and growth of a thin film of ZnPcCl8/Ag(111) studied by photoelectron spectroscopy. Surface Science, vol. 601, p. 4185, 2007
Giovanelli L., Vilmercati P., Castellarin-Cudia C., Themlin J-M., Porte L. Goldoni A. Phase separation in potassium-doped ZnPc thin films. Journal of Chemical Physics, vol. 126, p. 44709, 2007
Palmino F., Duverger E., Labrune J.-C., Mossoyan M., Themlin J.-M. Molecular self-alignment on pre-structured Sm/Si(111) RDI at room temperature. Surface Science, vol. 601, p. 2588, 2007
Giovanelli L., Amsalem P., Themlin J. M., Ksari Y., Abel M., Nony L., Koudia M., Bondino F., Magnano E., Mossoyan-Deneux M., Porte L. Evolution of the electronic structure at the interface between a thin film of halogenated phthalocyanine and the Ag(111) surface. Journal of Physical Chemistry C, vol. 112, p. 8654, 2008
