M. Houssa.- High-k gate dielectrics. IOP, Series in Materials Science and Engineering, 2003
Delerue C., Lannoo M.- Nanostructures. Theory and Modelling. Springer, collection Nanosciences and Technology, 2004
Moya F.- Les alliages dentaires. Propriétés fondamentales des métaux et alliages.- Dossiers ADF, Editeur Association Dentaire Française, Paris, 2004
Courmontagne P.- Traitement du signal : Ingénierie du signal : théorie et pratique. Editions Ellipses, 2005
Goguenheim D., Pic D., Ogier J.L.- Oxide reliability below 3nm for advanced CMOS : issues, characterization, and solutions Tutorial ESREF, 18th European Symposium Reliability on Electron Devices Failure Physics and Analysis (ESREF) Conference, Arcachon, 2007
Munteanu D., Autran J. L.- Modeling and Simulation of Single-Event Effects in Digital Devices and Ics.- Short course RADECS 2007, 53 p.- 10th European Workshop on Radiation and its Effects on Components and Systems (RADECS 2007), Deauville, France, 10-14 septembre 2007
Rogez J., Le Coze J.- Mesures de températures : Questions à se poser avant la mesure.- Techniques de l'Ingénieur, vol. R251, 2009
Priester L., Thibault-Pénisson J.- Les joints de grain : approches théoriques et expérimentales.- Techniques de l’ingénieur, sous presse
Edition scientifique
Autran J.L. (ed), Munteanu D. (ass. ed).- Proceedings of the 6th European Conference "Radiation and its Effects on Components and Systems" (RADECS 2002), Proceedings IEEE 01TH8605C (The Institute of Electrical and Electronics Engineers), 2002
Autran J.L. (guest ed), Munteanu D. (ass. ed).- IEEE Transactions on Nuclear Science, Special Issue, vol. NS-49, n° 3, June 2002
Pichaud B.- Editeur associé de European Physical Journal : Applied Physics pour quelques articles choisis du International workshop on semiconductor defect engineering : progess and prospect 2002
Aufray B., Bernardini J., Dallaporta H., Le Lay G., Soukiassian (eds).- Proceeding of the 11th International Conference on Solid Films and Surfaces (ICSFS 11).- Applied Surface Science, vol. 212-213, p. 1-926, 2003
Autran J.L., Ferrari M., Munteanu D., Passacantando M., Vedda A. (eds).- SiO2 and Advanced Dielectrics III.- Journal of Non-Crystalline Solids, Special Issue, volume 322, Elsevier Science B.V., 2003
Thomas O., Dallaporta H., Gas P.- Editeurs des Proceedings of the European Workshop on Materials for Advanced Metallization 2003, .- Microelectronic Engineering 70 (2003), Elsevier, Houssa M. (ed).- Fundamentals and technological aspects of high-k gate dielectrics.- Institute of Physics Publishing, London, 2004
Van Uffelen M., Sharp R. (Guest Editors), Autran J.L. (IEEE Liaison Editor).- Proceedings of the 7th European Conference Radiation and its Effects on Components and Systems.- Proceedings IEEE 03TH8776, The Institute of Electrical and Electronics Engineers, 2004
Van Uffelen M., Sharp R. (Guest Editors), Autran J.L. (IEEE Liaison Editor).- IEEE Transactions on Nuclear Science.- volume NS-51, n° 5, October 2004
Gerritsen E., Masson P., Mazoyer P. (Guest Editors).- Papers selected from the 1th International Conference on Memory Technology and Design.- ICMTD’05, Special Issue of Solid-State Electronics, vol. 49, n° 11, p. 1713 - 1874, 2005
Pichaud B, Claverie A., Alquier D., Richter H., Kittler M.- Editeurs des proceedings de la conférence GADEST 2005 (gettering and defect engineering in semiconductor technology) Giens (France) 25-30 Septembre 2005, Solid State Phenomena Vol 108-109, Trans Tech Publications
Vedda A., Munteanu D., Paillet P., Ferrari M., Autran J.L. (Editors).- SiO2, advanced dielectrics and related devices.- Journal of Non-Crystalline Solids, Special Issue, vol. 351, Elsevier Science B.V., 2005
Autran J.L. (Guest Editor).- Proceedings of the 2005 Radiation and Its Effects on Components and Systems (RADECS) Conference, Cap d'Agde, France, September 19-23, 2005.- Proceedings IEEE n°05TH8849, Octobre 2006
Girardeaux C., Aufray B., Bernardini J., Dallaporta H., LeLay G., Soukassian P.- Conference : ICFSI-10 - 10th International Conference on the Formation of Semiconductor Interfaces - Aix-en-Provence, France - 3-8 July, 2005 - Préface des éditeurs.- Journal de Physique IV, vol. 132, 2006
Schwank J.R. (Guest Editor), Paillet P., Felix J.A., Autran J.L. (Assistant Editors).- Selected Papers from the 2005 Radiation and Its Effects on Components and Systems (RADECS) Conference, Cap d'Agde, France, September 19-23, 2005.- IEEE Transactions on Nuclear Science, vol. 53, n°4, part I, August 2006
Agnello S., Boscaino R., Munteanu D. (Editors) - SiO2, Advanced Dielectrics & Related Devices.- Special Issue Journal of Non-Crystalline Solids, vol. 353, issue 5-6, 1 avril 2007
Berbezier I. (Guest Editor).- Surface Science, n° 601, July 2007
Berbezier I. (Guest Editor).- Superlattices and Microstructures, n° 44, October 2008
Noheda B. and Muller Ch. (Guest Editors) - Special issue "Phase transitions in functional thin films", Phase Transitions, vol. 81, n° 7-8, July-August 2008 - http://dx.doi.org/10.1080/01411590802260423
Berbezier I. (Guest Editor).- Superlattices and Microstructures, n° 46, July 2009
Berbezier I., Ronda A. (Guest Editor).- Material Sciences in Semiconductor Processing, n° 12, February 2009
Flory F., Escoubas L. (editors).- Special Issue on “Nanostructured Materials for Photonics Applications”.- International Journal of Materials and Product Technology, vol. 34, n° 4, Interscience, 2009
Robert-Inacio F.- Cours et Applications Industrielles de l'Image Numérique Couleur.- Ed. FredValou, isbn 978-2-9532792-0-7, 2009
Chapitres invités
Allan G., Delerue C., Krzeminski C., Lannoo M.- Nanoelectronics.- in "Nanostructured Materials. Selected Synthesis Methods and Applications", P. Knauth and J. Schoonman (eds), Kluwer, 2002
Bernardini J, Beke D. L.- Diffusion in nanomaterials.- in "Nanocrystalline metals and oxides : Selected properties and applications", P. Knauth and J. Schoonman (eds), Kluwer Academic Publishers, Boston, p. 41-79, 2002
Bouchakour R.- Revue des modèles Spice du transistor MOSFET.- in "Traité EGEM - Modèles électriques pour la conception des circuits intégrés silicium", Hermès, 2002
D'Heurle F.M., Gas P., Lavoie C., Philibert J.- Reactive phase formation : some theory and application. in "Diffusion Processes in Thin Films and Microelectronic Materials", D. Gupta (ed), Noyes Publisher, New Jersey, USA, à paraître, 2002
Jauffret C.- 1er chapitre du livre « Décision statistique et Reconnaissance des Formes en Signal » : Eléments de théorie de la décision statistique I : Bases.- Hermes, 2002
Villain S., Gavarri J.R., Thommerel E., Kopia A., Musso J., Valmalette J.C., Frémy M.A., Nigrelli E., Pischedda M.H.- Electrical percolation, reactivity and degradation in resistor-capacitor composite materials : modeling and predictions.- in "Recent Research Developments in Solid State Ionics", S.G. Pandalai (ed), Transworld Research Network, Trivandrum, India, à paraître, 2002
Escoubas L., Flory F.- Optical thin films for micro-components.- in "Optical Interference Coatings", N. Kaiser, J. Pulker (eds), Springer Verlag, 2003
Autran J.L., Munteanu D., Houssa M.- Electrical characterization, modeling and simulation of high-k based MOS devices.- in “Fundamental and Technological Aspects of High-k Gate Dielectrics”,
M. Houssa (ed), Institute of Physics Publishing, London, Chapter 3.4, p. 251-289, 2004
Bendahan M., P. Lauque, J.L. Seguin, C. Lambert-Mauriat, C. Jacolin, P. Knauth.- High selectivity copper bromide microsensors for ammonia gas.- in "Recent Research Developments in Solid State Ionics 2", Transworld Research Network, Trivandrum, India, 2004
Bernardini J., Girardeaux C., Erdélyi Z. and Lexcellent C.- Grain boundary diffusion and segregation in nanolayered materials.- in “Nanodiffusion, Diffusion in Nanostructured Materials”, Journal of Metastable and Nanocrystalline Materials, vol. 19, D.L. Beke (ed), Scitec et Trans Tech Publications Ltd., Zurich, 2004
d’Heurle F.M., Gas P., Lavoie C., Philibert J.- Diffusion Processes in Thin Films and Microelectronic Materials.- in "Reactive phase formation : some theory and application", D. Gupta (ed), Noyes, New Jersey, USA, 2004
Flory F., Escoubas L.- Film thickness measurement.- Encyclopedia of Optical Engineering, R. Driggers (ed), Marcel Dekker Inc., 2004
Houssa M.- Defect generation under electrical stress: experimental characterization and modeling.- in “Fundamentals and technological aspects of High-k Gate Dielectrics”, M. Houssa (ed), Institute of Physics Publishing, London, Chapter 4.6, p. 467-495, 2004
Houssa M., Heyns M.M.- High-k Gate Dielectrics : why do we need them ?.- in “Fundamentals and technological aspects of High-k Gate Dielectrics”, M. Houssa (ed), Institute of Physics Publishing, London, Chapter 1.1, p. 3-13, 2004
Deschamps A., Nicolas M., Perrard F., Bley F., Livet F., Doisneau-Cottignies B., Donnadieu P.- Caractérisation quantitative de la précipitation durcissante dans les matériaux de structure par la technique de diffusion centrale des rayons X et des neutrons.- Materiaux & Techniques, 92(5-6), 41-52 (2004)
Deschamps A., Nicolas M., Perrard F., Perez M.- Caractérisation quantitative et modélisation des cinétiques de précipitation : vers la précipitation anisotherme et les phénomènes couplés .- Revue de Métallurgie -CIT/Science et Génie des Matériaux, 101(5) 361-379 (2004)
Thomas O., Labat S., Bigault T., Gergaud P., Bocquet F.- Stresses and interfacial structure in metal films and multilayers of nanometre thickness.- J. Metastable and Nanocryst. Materials 19, 129 (2004)
Gontier-Moya E.G., Si Ahmed A., Moya F.- Interface mass transport in oxide materials.- in “Materials for Energy Conversion Devices”, Ch. Sorrell, Suano Sugihara and J. Nowotny (eds), Woodhead Publishers, Cambridge, U.K., p. 286-302, 2005
Pillon D., Jauffret C.- Trajectographie passive par Mesures d’Angles.- in "Techniques de l’Ingénieur",2005
Buffet A., Reinhart G., Schenk T., Nguyen-Thi H., Gastaldi J., Mangelinck-Noël N., Jung H., Härtwig J., Baruchel J., Billia B. - A new setup combining radiography and diffraction topography to study the solidification of Al-based alloys in situ.- invited paper in "ESRF Highlights", 13112006, 2006
Escoubas L., Flory F. Simon J.J., and Torchio Ph.- Guided-wave Characterizations of Optical, Thermal and Electro-optical Properties of Thin Film Materials.- International Journal of Materials and Product Technology, Special Issue: "Challenges in Materials Properties Measurements", Editor B. Vinet (Inderscience), vol. 26, n° 3-4, p. 372-387, 2006
Gergaud P., Goudeau P., Sicardy O., Tamura N., Thomas O.- Residual stress analysis in micro- and nao-structures materials by X-ray diffraction.- International Journal of Materials and Product Technology, vol. 26, p. 3-4, 2006
Lauque P., M. Bendahan, J.L. Seguin,, P. Knauth.- Copper and silver halides for gas detection.- in “Encyclopedia of Sensors”, vol. 10, p. 1-9, Craig A. Grimes (ed.), American Scientific Publishers, 2006
Nony L., Gnecco E., Meyer E.- Investigation of Organic Supramolecules by Scanning Probe. Microscopy in Ultra-High Vacuum.- in "Applied Scanning Probe Methods III (Eds B. Bhushan, H. Fuchs), Springer collection Nanosciences and Technology, 2006
Seguin J.L., Gomri S., Guérin J., Aguir K.- Bases of noise spectroscopy for enhancing metallic oxide gas sensors selectivity.- in "Science and Technology of Gas Sensors", D.K. Aswal, S.K. Gupta (eds), Nova Publishers, 2006
Berbezier I., Karmous A., Ronda A.- Ge nanodroplets self-assembling on Focused Ion Beam patterned substrates.- in "Nanoscience and Technol.", Chap. 15, Ed. O. Schmidt , - Springer-Verlag Berlin Heidelberg, 2007
Berbezier I., Ronda A., Karmous A.- Ge quantum dot self-alignment on vicinal substrates. - in "Nanoscience and Technol.", Chap. 6, Ed. O. Schmidt , - Springer-Verlag Berlin Heidelberg, 2007
Martinuzzi S.- Le spectre solaire – L’absorption de l’énergie lumineuse. Les cellules solaires au silicium cristallin.- Reflets de la Physique 5, p.7-12, 2007
Berbezier I., Ronda A.- Si/SiGe Heterostructures for advanced microelectronic devices.- Phase transitions, 81, 751, 2008
Bergman C., Girardeaux C., Perrin-Pellegrino C., Gas P., Dubois JM., Rivier N.- Contact angles of liquid metals on quasicrystals.- Journal of Physics-Condensed Matter, Special Section on Quasicrystals at Interfaces, vol. 20, 31, p. 314010, 2008 - http://dx.doi.org/10.1088/0953-8984/20/31/314010
Courmontagne Ph.- Synthetic Aperture Sonar Image Despeckling – The joint use of an auto-adaptive mean filter and the stochastic matched filter.- Sea Technology Magazine, Vol. 49, n°12, pp. 41-45, 2008
Fecht H.J., Billia B.- Breaking the mould: Metallurgy in microgravity.- in “Looking Up: Europe’s quiet revolution in microgravity research”, Scientific American, New York, p. 68-73, 2008
Jauffret C., Pillon, D.- Trajectographie Passive par Mesures d’Angles et d’Autres Mesures.- Techniques de l’Ingénieur, 2008 -
Ouzaouit K., A. Benlhachemi, S. Villain, A. Essoumhi, H. Benyaich and J-R. Gavarri.- New Method for Preparation of Polycrystalline Langasite for Gas Sensors: Structural Studies, NATO Science for Peace and Security Series B: Physics and Biophysics.- Smart Materials for Energy, Communications and Security10.1007/978-1-4020-8796-7_13, Part III. (191-203) 2008
Haddad F., Zaïd L., Rahajandraibe W., Frioui O.- Polyphase Filter Design Methodology for Wireless communication Applications.- Chapitre du livre : Mobile and Wireless Communications: Key Technologies and Future Applications.- British Telecommunication Plc Ed., A paraître en Novembre 2009 - ISBN : 978-3-902613-47-9
Jelinek M., Escoubas L., Flory F.- Pulsed laser deposition : Passive and active waveguides.- International Journal of Materials and Product Technology, Special issue on "Nanostructured Materials for Photonics Applications", vol. 34, n° 4, 2009
Moya G.- Méthodes microscopiques : application de la spectroscopie d’annihilation des positons à la caractérisation des effets de charge.- in « Isolants: Physique, Caractérisation et Applications », Ch. Bonnelle and C. Le Gressus, Coll. Hermes, Lavoisier, Paris, 2009
Palais O.- Solar cells: current crystalline silicon technologie and prospective.- Matériaux & Techniques, 2009 -
Rahajandraibe W., Zaïd L., Haddad F.- Fully Integrated CMOS Low-Gain-Wide Range 2.4-GHz Phase Locked Loop for LR-WPAN Applications.- Chapitre de livre : Mobile and Wireless Communications: Key Technologies and Future Applications.- British Telecommunication Plc Ed., A paraître en Novembre 2009 - ISBN : 978-3-902613-47-9
Simon J.J., Escoubas L., Monestier F., Torchio Ph., Flory F.- Optical properties engineering for organic solar cells.- International Journal of Materials and Product Technology, Special issue on "Nanostructured Materials for Photonics Applications", vol. 34, n° 4, p. 469-487, 2009
Micolau G., Deleruyelle D.- A Single Nano-Dot in a Plate Capacitor.- In "Handbook of Nanophysics", Edited by K. Sattler, Taylor & Francis, à paraître
Muller Ch., Deleruyelle D., Ginez O.- Emerging Memory Concepts: Materials, Modeling and Design.- In "Heterogeneous Embedded Systems – Design, Theory and Practice", Edited by I. O'Connor, G. Nicolescu, C. Piguet, Springer, à paraître
