communications publiées dans des proceedings

2002

Allan G., Lannoo M., Delerue C.- Bulk and nanocrystalline semiconductors.- in "Tight-binding Hamiltonians and their Applications", Turchi P.E.A. and Gonis A. (eds), Springer-Verlag, à paraître, 2002

Ananou B., Ksari Y., Regnier S., Marfaing J., Stepanov A., Touchard A., Rochette Y.- Temperature dependent study of diluted marine tertiary tephra by X-band ESR.- Proceedings of the European Geophysical Society Conference, Nice, France, EGSO2-A-01385;SE6.04-IM05P-080, 2002

Barthélemy H., Ferri G., Guerrini N.- A 1.5 V CCII-based tunable oscillator for portable industrial applications.- Proceedings of the IEEE International Symposium on Industrial Electronics (ISIE 2002), L'Aquila, Italy, vol. 4, p. 341–1345, 2002

Benielli D., Bergeon N., Dabo Y., Billia B., Jamgotchian H., Nguyen Thi H., Voge P.- Formation de l'état initial en solidification dirigée.- Matériaux 2002 : De la conception à la mise en oeuvre, Tours, 21-25 octobre 2002, CD-ROM, ISBN n° 2-914279-08-6, éditeur : UTMB (Université de Technologie Belfort-Montbéliard), 2002

Bescond M., Lannoo M., Goguenheim D., Autran J.L.- Towards a full microscopic approach to the modeling of nanotransistors.- Proceedings of the 4th Symposium on SiO2 and Advanced Dielectrics, Trento, Italy, à paraître, 2002

Bravaix A., Gauthé L., Goguenheim D., Revil N., Rubaldo L., Vincent E.- Efficiency of interface trap generation under hole injections in 2.1nm thick gate-oxide P-MOSFET's.- Proceedings of the 4th Symposium on SiO2 and Advanced Dielectrics, à paraître, 2002

Bravaix A., Goguenheim D., Revil N., Vincent E.- Comparison of low leakage and high speed deep submicron PMOSFET's submitted to hole injections.- Proceedings of the IEEE Integrated Reliability Workshop (IRW'02), Stanford Sierra Camp, Lake Tahoe, USA, à paraître, 2002

Bravaix A., Trapes C., Goguenheim D., Revil N., Vincent E.- Carrier injection efficiency for the reliability study of 3.5-1.2nm thick gate-oxide CMOS technologies.- Proceedings of the 12th Workshop on Dielectrics in Microelectronics (WoDim'O2), Grenoble, France, à paraître, 2002

Canet P., Bouchakour R., Razafindramora J., Lalande F., Mirabel J.M.- Very fast EEPROM erasing study.- Proceedings of the 28th European Solid-State Circuits Conference (ESSCIRC'2002), Florence, Italy, p. 683-686, 2002

Casadei B., J. P. Le Normond, B. Cunin and Y. Hu.- Design of a fast CMOS APS imager for high speed laser detectors.- Kluwer Academic Publishers, à paraître, 2002

Cavassilas N., Aniel F., Fishman G.- Energy-band structure of strained indirect gap semiconductor : A k.p method.- Proceedings of the 5th International Conference on Computational Nanoscience and Nanotechnology (ICCN 2002), Puerto Rico, USA, 22-25 April 2002, p. 411-414, 2002

Cavassilas N., Autran J.L.- Capacitance-voltage characteristics of metal-oxide-strained semi-conductor Si/SiGe heterostructures.- Proceedings of the 5th International Conference on Modeling and Simulation of Microsystems (MSM'2002), Puerto Rico, USA, 22-25 April 2002, à paraître, 2002

Delauche F., Affour B., Dufaza C.- Parametric yield optimization of MEMS.- Proceedings of the Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP'2002), Cannes, France, p. 126-135, 2002

Deleruyelle D., Fraboulet D., De Salvo B., Buffet N., Martin F., Mariolle D., Baron T., Autran J.L., Guillaumot B.- Electrical characterization of memory cell structures based on multiple tunnel junctions with embedded Si nanocrystals.- Proceedings of the IEEE 2002 Silicon Nanoelectronics Workshop, Honolulu, USA, 9-10 June 2002, à paraître, 2002

Drevet B. , Camel D., Dabo Y., Nguyen Thi H., Billia B.- Ségrégations induites par la fusion et la stabilisation thermique précédant la solidification dirigée : comparaison des systèmes Al-Li et Al-Ni.- Matériaux 2002 : De la conception à la mise en oeuvre, Tours, 21-25 octobre 2002, CD-ROM, ISBN n° 2-914279-08-6, éditeur : UTMB (Université de Technologie Belfort-Montbéliard), 2002

Ersen O., Pierron-Bohnes V., Ulhaq-Bouillet C., Pirri C., Tuilier M.H., Berling D., Gailhanou M., Thiaudiere D.- Crystallographic structure of ternary silicide nanocrystallites in thin films in epitaxy on Si(111): a DAFS and HRTEM study.- 7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science. Lund Univ. 2002, pp. 2. Lund, Sweden

Escoubas L., Drouard E., Flory F., Modeling of optical guided - wave filters.- Proceedings SPIE, Vol. 4640, 22 – 28 (2002)

Flory F., Escoubas L., Drouard E., Study of the refractive index of nano - structured optical materials.- Proceedings SPIE Vol.4640, 205 – 21 (2002)

Goguenheim D., Trapes C., Bravaix A.- Comparison of degradation modes in 1.2-2.1 nm thick oxides submitted to uniform and hot carrier injections in NMOSFETS.- Proceedings of the 4th Symposium on SiO2 and Advanced Dielectrics, Trento, Italy, à paraître, 2002

Guérin R., El Ganaoui M., Haldenwang P.- Spectral and finite volume numerical approximations for solutal convection in melted alloys.- in "High Performance Scientific and Engineering Computing", M. Breuer, F. Durst, C. Zenger (eds), Lecture Notes in Computational Science and Engineering, vol. 21, Springer-Verlag, p. 253-260, 2002

Guérin R., Lamazouade A., El Ganaoui M., Haldenwang P.- Numerical study for solutal convection in liquid Pb-30% Tl alloy by spectral and finite volume approximations.- in "Progress in Industrial Mathematics at ECMI 2000", A.M. Anile, V. Capasso, A. Greco (eds.), Mathematics in Industry Series, vol. 1, Springer-Verlag, p. 210-217, 2002

Ionescu A.M., Munteanu D.- New compact model for generation drain current transients in weak and moderate inversion regimes of submicron floating-body PD SOI MOSFETs.- Proceedings of the 5th International Conference on Modeling and Simulation of Microsystems (MSM'2002), Puerto Rico, USA, 22-25 April 2002, p. 754-758, 2002

Izard V., Record M.C., Tedenac J.C., Haines J.- Sb₃Zn₄, a promising new thermoelectric material. Elaboration and characterisation.- Mat. Res. Soc. Symp. Proc., 691, G8.35.313-318 (2002)

Kussener E., Barthélemy H.- Versatile macromodel for the power supply of submicronic CMOS microprocessors based on voltage down DC-DC converter.- Proceedings of the IEEE International Symposium on Circuits and Systems (DTIP'2002), IEEE Proceedings 02CH37353C, T. Homan (ed), vol. 5, p. 821-824, 2002

Labbé A., Pérez A.- AES implementation on FPGA : time – flexibility tradeoff.- Proceedings of the12th International Conference on Field-Programmable Logic and Applications (FPL’2002), Springer LNCS 2438, Montpellier, France, p. 836-844, 2002

Laffont R., Razafindramora J., Canet P., Bouchakour R., Mirabel J.M.- Decreasing EEPROM programming bias with negative voltage, reliability impact.- Proceedings of the IEEE International Workshop on Memory Technology, Design and Testing, Isle of Bendor, France, p. 168-173, 2002

Lancok J., Jelínek M., Oswald J., Bulir J., Escoubas L., Flory F., Atanasov P. A., Koleva M., Nd doped KGW crystalline waveguides fabricated by pulsed laser deposition.- Proceedings SPIE vol. 4762,p 162 - 165 (2002)

Liebault J., Siesse-Moya D., Moya F., Zarbout K., Damamme G., Moya G.- Determination of charge trapping ability in doped alumina.- Annual Report CEIDP 2002, Cancun, Mexico, IEEE Proceedings 02CH37372, p. 652-655, 2002

Martinuzzi S., Palais O.- Gettering and lifetime engineering in silicon wafers .- High Purity Silicon VII, Ed; by C. Claeys, ECS PV2002-20, p 233-48 ( 2002)

Masson P., Autran J.L., Garros X., Leroux C.- Frequency characterization and modeling of the capacitance response of interface traps in MOS structures with HfO2 gate dielectrics.- Proceedings of the 3rd European Workshop on Ultimate Integration of Silicon (ULIS 2002), Munich, Germany, 7-8 March 2002, à paraître, 2002

Masson P., Militaru L., De Slavo B., Ghibaudo G., Celibert V., Baron T.- Nano-crystal memory devices characterization using the charge pumping technique.- Proceedings of the 32nd European Solid-State Device Research Conference (ESSDERC'2002), Firenze, Italy, G. Baccarani (ed), University of Bologna, p. 235-238, 2002

Monfray S., Skotnicki T., Morand Y., Descombes S., Coronel P., Mazoyer P., Harrison S., Ribot P., Talbot A., Dutartre D., Haond M., Palla R., Le Friec Y., Leverd F., Nier M.E., Vizioz C., Louis D.- 50 nm Gate All Around (GAA) – Silicon On Nothing (SON) – Devices : A simple way to co-integration of GAA transistors with bulk MOSFET process.- Proceedings of the 2002 VLSI Symposium on Technology, Honolulu, USA, 11-13 June 2002, à paraître, 2002

Munteanu D., Autran J.L.- Two-dimensional modeling of quantum ballistic transport in ultimate double-gate SOI devices.- Proceedings of the 3rd European Workshop on Ultimate Integration of Silicon (ULIS 2002), Munich, Germany, 7-8 March 2002, à paraître, 2002

Nguyen Thi H., Gastaldi J., Jamgotchian H., Haertwig J., Baruchel J., Billia B., Dabo Y., Klein H.- Etude de la solidification dirigéee par imagerie X.- Matériaux 2002 : De la conception à la mise en oeuvre, Tours, 21-25 octobre 2002, CD-ROM, ISBN n° 2-914279-08-6, éditeur : UTMB (Université de Technologie Belfort-Montbéliard), 2002

Nowak D., Thomas O., Baker S., Stach E., Balzuweit E.A., Dahmen U.- X-ray diffraction analysis and modeling of strain induced thermal cycling in a thin aluminum (110) bicrystal film .- Mat. Res. Soc. Symp. Proc. 695, 3-8 (2002)

Portal J.M., Forli L., Aziza H., Née D.- An automated design methodology for EEPROM cell (ADE).- Proceedings of the IEEE International Workshop on Memory Technology, Design and Testing, Isle of Bendor, France, p.-, 2002

Portal J.M., Forli L., Aziza H., Née D.- An automated geometric defect diagnosis methodology for EEPROM cell (AGDE).- Proceedings of the IEEE European Test Workshop, Corfu, Greece, p.-, 2002

Portal J.M., Forli L., Aziza H., Née D.- An automated methodology to diagnose geometric defect in the EEPROM cell.- Proceedings of the IEEE International Test Conference, Baltimore, USA, p.-, 2002

Portal J.M., Forli L., Née D.- Floating-gate EEPROM cell model based on MOS model 9.- Proceedings of the IEEE International Symposium on Circuits and Systems (ISCAS), Scottsdale, USA, p.-, 2002

Portal J.M., Forli L., Née D.- Floating-gate EEPROM cell: threshold voltage sensibility to geometry.- Proceedings of the IEEE International Symposium on Circuits and Systems (ISCAS), Scottsdale, USA, p.-, 2002

Rahajandraibe W., Auvergne D., Dufaza C., Cialdella B., Majoux B., Chowdhury V.- Process characterization for a very low power high temperature stability bandgap reference circuit.- Proceedings of the 17th Design of Circuits and Integrated Systems Conference (DCIS' 2002), Santander, Spain, p.- , ISBN 84-8102-311-6, 2002

Rahajandraibe W., Auvergne D., Dufaza C., Cialdella B., Majoux B., Chowdhury V.- Very low power high temperature stability bandgap reference voltage.- Proceedings of the IEEE European Solid-State Circuit Conference (ESSCIRC’ 2002), Florence, Italy, p. 727-730, 2002

Rahajandraibe W., Dufaza C., Auvergne D., Cialdella B., Majoux B., Chowdhury V.- Low current application dedicated process characterization method.- Proceedings of the IEEE International Conference on Microelectronic Test Structures (ICMTS’02), Cork, Ireland, p. 41-44, 2002

Rahajandraibe W., Dufaza C., Auvergne D., Cialdella B., Majoux B., Chowdhury V.- Méthode de caractérisation dédiée aux applications à faible courant de fonctionnement.- Actes du 3ème Colloque CAO de Circuits et Systèmes Intégrés, Paris, France, p. 133-136, 2002

Rahajandraibe W., Dufaza C., Auvergne D., Cialdella B., Majoux B., Chowdhury V.- On chip measurement of IC(VBE) characteristics for high accuracy bandgap applications.- Proceedings of the IEEE International Caracas Conference on Devices, Circuits and Systems (ICCDCS’02), Aruba, Dutch Caribbean, p.-, 2002

Rahajandraibe W., Dufaza C., Auvergne D., Cialdella B., Majoux B., Chowdhury V.- Test structure for IC(VBE) parameter determination of low voltage applications.- Proceedings of Design Automation and Test in Europe (DATE'2002), Paris, France, p. 316-321, 2002

Renard S., Boivin P., Autran J.L.- Wafer-level characterization of EEPROM tunnel oxide using a fast floating-gate technique and a realistic memory vell-based test structure.- Proceedings of the IEEE 2002 International Conference on Microelectronic Test Structures (ICMTS 2002), Cork, Ireland, 8-11 April 2002, à paraître, 2002

Tatinian W., Pannier P., Gillon R.- A new methodology for the computation of the substrate parasitics of octogonal inductors.- Microwave Symposium Digest, 2002 IEEE MTT-S International, Seattle, USA, vol. 1, p. 165-168, 2002

Tatinian W., Pannier P., Gillon R.- A new methodology for the computation of the substrate parasitics of octogonal inductors.- Radio Frequency Integrated Circuits (RFIC) 2002 Symposium, Seattle, USA, Digest of Papers, p. 319-322, 2002

Tedenac J.C., Record M.C., Izard V.- Thermodynamic calculations in new thermoelectric materials. Application to processes.- Mat. Res. Soc. Symp. Proc., 691, G1.3.1-6 (2002)

Trapes C., Bravaix A., Goguenheim D.- Impact of carrier injection in 2.2 nm thick SiO2 oxides after first and substrate enhanced electron injection.- Proceedings of the 4th Symposium on SiO2 and Advanced Dielectrics, Trento, Italy, à paraître, 2002

Trapes C., Goguenheim D., Bravaix A.- Comparaison des injections en mode d'ionisation primaire et secondaire sur des NMOSFET's de 2.2 nm d'épaisseur d'oxyde.- Actes des Vèmes Journées Nationales du Réseau Doctoral de Micro-électronique, Grenoble, p.192-193, 2002

2003

Artigue O., Enguent J.P., Tételin C.- S parameter model for contacless smart card.- Proceedings of the European Microwave Week, European Conference on Wireless Technology, Münich, Germany, récompensé par l'« European Conference Wireless Technologies Young Engineers Prize », 2003

Autran J.L., Munteanu D., Houssa M.- Potential fluctuations in high-k based MOS devices.- Proceedings of the 203rd Meeting of the Electrochemical Society, Symposium F1 "Science and technology of dielectrics in emerging fields", Paris, France, vol. PV2003-01, p. 383-392, 2003

Barthélemy H, Meillère S.- High gain CMOS class AB OpAmp based on current-controlled current-conveyors.- Proceeding of the 2003 European Conference on Circuits Theory and Design, (ECCTD), Kraków, Poland, vol.1, p. 70-73, 2003

Barthélemy H.- Current mode and voltage mode : basic considerations.- Proceeding of the 46th IEEE Midwest Symposium on Circuits and Systems, Cairo, Egypt, 2003

Barthélemy H., Rahajandraibe W.- NMOS transistors based Karsilayan & Schaumann gyrator : lowpass and bandpass filter applications.- Proceeding of the 46th IEEE Midwest Symposium on Circuits and Systems, Cairo, Egypt, 2003

Barvinschi F., Hodroj A., Sylla L., Delannoy Y., Mangelinck-Noël N., Duffar T. et Boulechfar H., Durand F.- Etude des mécanismes des procédés de solidification du silicium multicristallin.- Actes des Rencontres et Journées techniques sur les matériaux et procédés pour la conversion photovoltaïque de l'énergie solaire, Séminaire ADEME-CNRS, Sophia-Antipolis, 18-19 novembre 2003

Bernardini S., Laffont R., Masson P., Ghibaudo G., Lombardo S. De Salvo B., Gerardi C.- A predictive nano-crystal Flash memory simulator.- Proceedings of 4th European Workshop on Ultimate Integration of Silicon (ULIS 2003), Udine, Italy, p. 143-146, 2003

Bernardini S., Masson P., Houssa M.- Effect of fixed dielectric charges on tunneling transparency in MIM and MIS structures.- Proceedings of the 13th bi-annual Conference INsulating Film On Silicon, (INFOS'2003), Barcelona, Spain, p. PS12, 2003

Bernardini S., Masson P., Houssa M., Lalande F.- Determination of oxide charge repartition in memory tunnel oxide under stress from Fowler-Nordheim current measurements.- Proceedings of the 33rd European Solid-State Device Research Conference, Estoril, Portugal, p. 589-592, isbn 0-7803-7999-3, 2003

Bernardini S., Masson P., Houssa M., Lalande F.- Impact of oxide charge trapping on I-V characteristics of MIM capacitor.- Proceedings of the 33rd European Solid-State Device Research Conference (ESSDERC'2003), Estoril, Portugal, p. 589-592, 2003

Bescond M., Autran J.L., Lannoo M.- Modélisation atomique d’un transistor MOSFET double grille.- Proceedings 1ères journées « Composants Micro et Nano-électroniques» GDR Nano-électronique, Grenoble, France, p. 97, 2003

Bescond M., Autran J.L., Lannoo M.- Quantum transport simulation in double-gate nano-transistors using the Green’s function approach and the tight-binding approximation.- Proceedings of the 4th European workshop on Ultimate Integration of Silicon (ULIS 2003), Udine, Italy, E. Sangiorgi and L. Selmi (eds), p. 121-124, 2003

Bescond M., Autran J.L., Munteanu D., Cavassilas N., Lannoo M.- Atomic-scale modeling of source-to-drain tunneling in ultimate Schottky barrier double-gate MOSFET’s.- Proceedings of the 33rd European Solid-State Device Research Conference (ESSDERC'2003), Estoril, Portugal, 16-18 September 2003, Editions Frontières, p.395-398, 2003

Bizzari C., Houssa M., Autran J.L.- Simulation of bias temperature instabilities in pMOSFETs with HfxSiOy-based gate dielectrics.- Proceedings of the 204th Meeting of the Electrochemical Society, 12-17 octobre 2003, Orlando, USA

Boucher Y., Drouard E., Escoubas L., Flory F., One-dimensional transfer matrix formalism with localised losses for fast designing of quasi-periodic waveguide filters.- Conférence “Optical Systems Design”, SPIE Proceedings vol. 5249, September-3 October (2003)

Bravaix A., Goguenheim D., Revil N., Vincent E.- Hole injection enhanced hot-carrier degradation in PMOSFETs used for system on chip applications with 6.5-2nm thick gate-oxide.- Proceedings of the 14th European Symposium Reliability of Electron Devices (ESREF), Arcachon, France, 2003

Canet P., Lalande F., Bouchakour R., Martin M.- Non volatile memory cell design : sizing assisted by a predictive model.- Proceedings of the 4th Annual Non-Volatile Memory Technology Symposium, (NVMTS2003), San Diego, California, p.13-1-13-4, 2003

Deleruyelle D., Le Royer C., De Salvo B., Mariolle D., Baron T., Le Carval G., Fraboulet D., Autran J.L., Deleonibus S.- A nano-scaled multiple-tunnel-junction memory employing silicon nano crystals as charge injectors.- Proceedings of the 2003 Silicon Nanoelectronics Workshop, 8-9 juin 2003, Kyoto, Japon

Denais M., Huard V., Parthasarathy C., Ribes G., Perrier F., Revil N., Bravaix A.- Interface traps and oxide traps creation under NBTI and PBTI in advanced CMOS technology with a 2nm gate-oxide.- 2003 IEEE International Integrated Reliability Workshop (IRW) Final Report, p. 1-6, 2003

Drouard E., Escoubas L., Flory F., Design of deeply etched planar waveguide filters of arbitrary spectral response.- Proceedings “European Conference on Optical Communications”, September 22-25, 2003, Rimini, Italie

Drouard E., Escoubas L., Flory F., Tisserand S., Roux L., Ion Implanted Integrated Optics (I3O®) technology for Planar Lightwave Circuits (PLCs) fabrication.- SPIE Proceedings vol. 524, Conférence “Optical Systems Design” St Etienne, 30 September-3 October (2003)

Elalamy Z., Drouard E., Escoubas L., Flory F., dn/dt measurements of solgel ZrO2 thin films.- Conférence “Optical Systems Design” St Etienne, 30 September-3 October (2003), SPIE Proceedings, vol. 5250

Escoubas L., Loli M., Simon J.–J., Giovannini H., Flory F., Lemarquis F., Enoch S., Berginc G., Design and fabrication of biperiodic AR gratings for the infrared.- Proceedings SPIE vol. 5250 (2003)

Flory F., Fabre J.P.- An original syllabus in photonics at the Ecole Généraliste d’Ingénieurs de Marseille.- Proceedings 4th Education and Training in Optics and Photonics, Octobre 2003, Tucson

Forli L., Portal J.M., Née D., Borot B.- Infrastructure IP for back-end yield improvement.- Proceedings of the IEEE European Test Workshop, (ETW'03), Maastricht, Pays-Bas, p. 219-224, 2003

Forli L., Portal J.M., Née D., Borot B.- Infrastructure IP for back-end yield improvement.- Proceedings of the IEEE International Test Conference, Charlotte, NC, USA, p.1129-1134, 2003

Gilibert F., Rideau D., Bernardini S., Scheer P., Minondo M., Roy D., Gouget G., Juge A.- Channel debiasing and gate current modelling in advanced CMOS devices.- Proceedings of 4th European Workshop on Ultimate Integration of Silicon (ULIS 2003), Udine, Italy, p. 61-64, 2003

Girardeaux C., Aufray B., Rolland A. and Bernardini J.- Experimental surface segregation studies : influence of the structure of the surface.- Proceedings of the 4th International Workshop on Surface and Interface Segregation, (IWSIS-4), Faure, South Africa, p. 22-24, 2003

Harrison S., Coronel P., Leverd F., Cerutti R., Palla R., Delille D., Borel S., Jullian S., Pantel R., Descombes S., Dutartre D., Morand Y., Samson M.P., Lenoble D., Talbot A., Villaret A., Monfray S., Mazoyer P., Bustos J., Bru H., Cro A., Munteanu D., Autran J.L., Skotnicki T.- Highly performant double gate MOSFET realized with SON process.- Proceedings of the IEEE 2003 International Electron Device Meeting (IEDM 2003), 7-10 décembre 2003, Washington, Etats-Unis

Houssa M., Aoulaiche M., Autran J.L.- Model for NBTI in pMOSFETs with ultrathin gate oxide layers : Comparison between electron and hole injection.- Abstract book of the 34th IEEE Semiconductor Interface Specialists Conference, 4-6 décembre 2003, Washington DC, USA., p. S7.2, 2003

Labbé A., Portal J.M., Pérez A.- DES-SRAM IP-Core : a SRAM embedding DES feature.- Proceedings of the IEEE International SOC Conference (SOC'03), Portland, USA, p. 11-14, 2003

Labbé A., Pérez A., Portal J.M.- A SRAM modified for DES self-encryption.- Proceedings of the XVII Conference on Design of Circuits and Integrated Systems, DCIS 2003, Ciudad Real, Spain, isbn 84-87087-40-X, p. 362-365, 2003

Laffont R., P. Masson, P. Canet, B. Delsuc, R. Bouchakour, Mirabel J.M.- New Fowler Nordheim current determination in EEPROM cell from transient measurements.- Proceedings of the 33rd European Solid-State Device Research Conference (ESSDERC'2003), Estoril, Portugal, p. 71-74, 2003

Legros M., Dehm G., Balk T-J., Arzt E., Bostrom O., Gergaud P., Thomas O.- Plasticity-related phenomena in metallic films on substrates.- Mat. Res. Symp. Proc. 779, 63-74 (2003)

Lemarquis F., Lequime M., Albrand G., Escoubas L., Simon J. –J., Baudrand J., Riaud P., Rouan D., Boccaletti A., Mawet D.- Manufacturing of 4-Quadrant Phase Mask for nulling Interferometry in thermal infrared.- Proceedings SPIE vol. 5250 (2003)

Lopez L., Masson P., Née D., Bouchakour R.- Temperature and drain voltage dependence of gate induce drain leakage.- Proceedings of the 13th bi-annual Conference INsulating Film On Silicon, (INFOS'2003), Barcelona, Spain, p. PS14, 2003

Munteanu D., Autran J.L., Harrison S., Skotnicki T.- Unified analytical model of threshold voltage in symmetric and asymmetric double-gate MOSFETs.- Proceedings of the 4th European workshop on Ultimate Integration of Silicon (ULIS 2003), 20-21 mars 2003, Udine, Italy, E. Sangiorgi and L. Selmi (eds), p. 35-38, 2003

Nicolas M., Deschamps A.- Modelling of the precipitation evolution during non - isothermal heat treatments in an Al Zn Mg alloy.- Proceedings of Euromat 2003, Lausanne : "Solid State Transformation and Heat Treatment " ed. A. Hazotte, Wiley-VCH 2005, p 61-68 (2003)

Payet F., Cavassilas N., Autran J.L.- Theoretical investigation of hole transport in strained Si inversion layer.- Proceedings of 4th European Workshop on Ultimate Integration of Silicon (ULIS 2003), Udine, Italy, 20-21 March 2003, E. Sangiorgi and L. Selmi (eds), p. 117-120, 2003

Portal J.M., Aziza H., Née D.- EEPROM memory : threshold voltage built in self diagnosis.- Proceedings of the IEEE European Test Workshop, (ETW'03), Maastricht, Pays-Bas, p. 81-87, 2003

Portal J.M., Aziza H., Née D.- EEPROM memory : threshold voltage built In self diagnosis.- Proceedings of the IEEE International Test Conference, Charlotte, NC, USA, p. 23-28, 2003

Portal J.M., Aziza H., Née D.- EEPROM memory diagnosis based on threshold current extraction.- Proceedings of Design of Circuits and Integrated Systems Conference (DCIS‚03), Ciudad Real, Spain, ISBN 84-87087-40-X, p. 133-139, 2003

Portal J.M., Delsuc B., Bouchakour R., Boivin P., Taillet F., Née D.- EEPROM cell : design optimization methodology.- Proceeding of the 46th IEEE Midwest Symposium on Circuits and Systems, Cairo, Egypt, 2003

Rahajandraibe W., Dufaza C., Rashid T., Chowdhury V., Majoux B.- High temperature stability bandgap reference voltage using polysilicon resistors.- in "Computational Methods in Circuits and Systems Applications" (Electrical and Computer Engineering Series Book), WSEAS Press, ISBN 960-8052-88-2, p. 279-284, 2003

Rahajandraibe W., Dufaza C., Rashid T., Chowdhury V., Majoux B.- Performance bandgap reference voltage using polysilicon resistor.- Proceedings of Design of Circuits and Integrated Systems Conference (DCIS‚03), Ciudad Real, Spain, ISBN 84-87087-40-X, p. 509-514, 2003

Reinhart G., Zhou B.H., Nguyen Thi H., Dabo Y., Billia Liu Q.- Comparative Study of influence of natural and forced convection on columnar microstructures in directional solidification of Al – 3.5 wt% Ni.- Proceedings of 4th International Conference on Electromagnetic Processing of Materials 2003, Grenoble, France, 14-17 octobre 2003, CD-ROM

Renovell M., Gallière J.M., Azaïs F., Bertrand Y., Portal J.M., Bouchakour R.- GOSMOS : a gate oxide short defect embedded in a MOS compact model.- Proceedings of the 4th IEEE-Latin American Test Worshop, (LATW'03), Natal, Brazil, p. 6-11, 2003

Scheybal A., Ramsvik T., Bertschinger R., Putero-Vuaroqueaux M., Morf P., Vanoni C., Schelldorfer R., Nolting F., Jung T.A.- Magnetic interaction between a magnetized substrate and adsorbed organic molecules probed by XMCD.- Laboratory for Micro- and Nanotechnology (LMN) scientific annual report, Paul Scherrer Institut, Villigen, Switzerland, 2003

Tatinian W., Pannier P., Gillon R.- A practical simulation-based study on MIM-capacitors processed in MOS technologies.- Proceeding of the 46th IEEE Midwest Symposium on Circuits and Systems, Cairo, Egypt, 2003

Tatinian W., Simoen E., Ouassif N., Desoete B., Gillon R., Pannier P.- Self-heating based model for polysilicon resistors.- Proceeding of the 46th IEEE Midwest Symposium on Circuits and Systems, Cairo, Egypt, 2003

Villain S., Gavarri J.R., Thommerel E., Kopia A., Musso J., Valmalette J.C., Pischedda M.H.- Electrical percolation, reactivity and degradation in resistor-capacitor composite materials : modeling and predictions.- in "Recent Research Developments in Solid State Ionics", S.G. Pandalai (ed), Transworld Research Network, Trivandrum, India, 2003

Villaret A., R. Ranica, P. Masson, P. Mazoyer, S. Cristoloveanu, Skotnicki T.- Mechanisms of charge modulation in floating body of triple-well N-MOSFET capacitor-less DRAMs.- Proceedings of the 13th bi-annual Conference INsulating Film On Silicon, (INFOS'2003), Barcelona, Spain, p. WS3-7, 2003

Zhou B.H., Nguyen Thi H., Reinhart G., Dabo Y., Billia Liu Q., Lyubimova T.P., Roux B.- Directional solidification microstructures under natural and controlled convection conditions.- Proceedings of International Conference on “Advanced Problems in Thermal Convection”, Perm, Russie, 24-27 novembre 2003

2004

Autran J.L., Aubert M., Tintori O., Munteanu D., Decarre E.- An analytical subthreshold current model for ballistic double-gate MOSFETs.- Technical Proceedings of the 2004 NSTI Nanotechnology Conference and Trade Show, vol. 2, p. 171-174, 2004

Autran J.L., Munteanu D., Houssa M.- Electrical modeling and simulation of nanoscale MOS devices with a high-permittivity dielectric gate stack.- Material Research Society Symposium Proceedings, vol. 811, p. D6-1, 2004

Autran J.L., Munteanu D., Tintori O., Harrison S., Decarre E., Skotnicki T.- Quantum-mechanical analytical modeling of threshold voltage in long-channel double-gate MOSFET with symmetric and asymmetric gates.- Technical Proceedings of the 2004 NSTI Nanotechnology Conference and Trade Show, vol. 2, p. 163-166, 2004

Aziza H., Portal J.M., Née D.- EEPROM threshold current extraction : silicon validation.- Proceedings of the European Test Symposium, France, p. 81-87, 2004

Baldacci A., Rivero C., Gergaud P., Grégoire M., Sicardy O., Bostrom O., Boivin P., Micha J.S., Thomas O.- Stresses in copper blanket films and damascene lines: Measurements and finite element analysis.- Proceedings of the 34th European Solid State Device Research Conference, p. 105, 2004

Barakel D., Martinuzzi S.- Donor behaviour of implanted hydrogen ions in silicon wafers.- Mat. Res. Soc. Symp. Proc. 813,49-54 (2004)

Barthelemy H., Meillère S., Bourdel S.- Single ended rail-to-rail CMOS OTA based variable-frequency ring-oscillator.- Proceedings of the 2004 International Symposium on Circuits and Systems (ISCAS '04), vol. 4, p. 537-540, May 2004

Bernardini S., Masson P., Portal J.M., Gallière J.M., Renovell M.- Impact of gate oxide reduction failure on analog application : example of the current mirror.- Proceedings of the 5th Latin-American Test Workshop (LATW’04), Cartagena, Colombia, isbn 958-33-5900-9, p. 12-17, 2004

Bernardini S., Portal J.M., Masson P.- A tunneling model for gate oxide failure in deep sub-micron technology.- Proceedings of the Design, Automation and Test in Europe Conference and Exhibition, (DATE'04), vol. 2, isbn 0-7695-2085-5, p. 1404-1406, 2004

Bescond M., Autran J.L., Cavassilas N., Munteanu D., Lannoo M.- Treatment of point defects in nanowire MOSFETs using the nonequilibrium Green's function formalism.- Proceedings of the 10th IEEE International Workshop on Computational Electronics (IWCE10), Purdue University, Indiana, USA, p. 84-85, 2004

Bescond M., Néhari K., Autran J.L., Cavassilas N., Munteanu D., Lannoo M.- 3D quantum modeling and simulation of multi-gate nanowire MOSFETs.- Proceedings of the 50th IEEE International Electron Device Meeting (IEDM 2004), San Francisco, Etats-Unis, p. 617-620, 2004

Borgetto M., Jauffret C., Rigaud V.- Underwater image mosaic correction.- 14ème conférence ISOPE, vol. II, p. 427-432, mai 2004

Bourdel. S., Pannier. P., Barthelemy H., Dehaese N.- Low cost solutions for 802.15.4 RF architectures.- Proceedings of the 8th IEEE International Symposium on Spread Spectrum Techniques and Applications, p. 967-971, September 2004

Canet P., Lalande F., Razafindramora J., Bouquet V., Postel-Pellerin J., Bouchakour R., Mirabel J.M.- Integrated reliability in EEPROM nonvolatile memory cell design.- Proceedings of IEEE Non-Volatile Semiconductor Memory Workshop, Orlando, Florida, USA, p. 66–69, 2004

Castellani-Coulié K., Munteanu D., Ferlet-Cavrois V., Autran J.L.- Simulation analysis of the bipolar amplification in fully-depleted SOI technologies under heavy-ion irradiations.- Proceedings of the European Workshop on Radiation and its Effects on Components and Systems (RADECS’2004), Madrid, Espagne, p. 127-130, 2004

Castellani-Coulié K., Sagnes B., Saigné F., Palau J.M., Autran J.L., Calvet M.C.- Simulation studies of the parasitic structures involved in the SEU mechanisms in SRAMs.- Proceeding of the European Workshop on Radiation and its Effects on Components and Systems (RADECS’2004), Madrid, Espagne, p. 7-11, 2004

Chmielowska M., Kopia A., Kusinski J., Leroux Ch., Gavarri J.R.- Texture modifications in copper doped ceria thin films by pulsed laser deposition technique.- Proceedings of the XVIIth Physical Metallurgy and Materials Science Conference, Advanced Materials & Technologies, (AMT'2004), Lodz-Artorowek, Poland, Inzynieria Materialowa, NR3, 140, XXV Maj-Czerwiec, PL ISSN 0208-6247, Advanced Materials & technologies, p. 561-563, 2004

Coronel P., Harrison S., Cerutti R., Monfray S., Skotnicki T.- 3D integration of ultimate devices thanks to SiGe.- Proceedings of the 206th Meeting of the Electrochemical Society (ECS 04), Honolulu, USA, Symposium M2 (SiGe: Materials, Processing, and Devices), p. 701-718, 2004

Coronel P., Harrison S., Cerutti R., Monfray S., Skotnicki T.- Highly performant Double-Gate MOSFET realized with SON process. How do we address the design and process for the GAA SON challenges.- Proceedings of the International Conference on Integrated Circuit Design and Technology (ICICDT 04), Austin, USA, p. 81-89, 2004

De Jaeger R., Houssa M., A. Satta, S. Kubicek, P. Verheyen, J. Van Steenbergen, J. Croon, B. Kaczer, S. Van Elshocht, A. Delabie, E. Kunnen, E. Sleeeckx, I. Teerlinck, R. Lindsay, T. Schram, T. Chiarella1, R. Degraeve, T. Conard, J. Poortmans, G. Winderickx, W. Boullart, M. Schaekers, P.W. Mertens, M. Caymax, W. Vandervorst, E. Van Moorhem, S. Biesemans, K. De Meyer, L. Ragnarsson, S. Lee, G. Kota, G. Raskin, P. Mijlemans, Autran J.L., V. Afanas’ev, A. Stesmans, M. Meuris, M. Heyns.- Ge deep submicron pFETs with etched TaN metal gate on a high-k dielectric, fabricated in a 200 mm silicon prototyping line.- Proceedings of the 34th European Solid State Device Research Conference (ESSDERC’2004), Leuven, Belgique, p. 189-192, 2004

Dehaese N., Bourdel S.- System modeling for 802.15.4 RF architectures.- Proceedings of the 16th International Conference on Microelectronics, ICM 2004, p. 518-521, December 2004

Denais M., Bravaix A., Huard V., Parthasarathy C., Ribes G., Perrier F., Revil N.- New hole trapping characterization during NBTI in 65nm node technology with distinct nitridation processing.- Proceedings of the IEEE Integrated Reliability Workshop (IRW'04), p. 121-124, 2004

Denais M., Bravaix A., Huard V., Parthasarathy C., Ribes G., Perrier F., Rey-Tauriac Y., Revil N.- “On-the-fly” characterization of NBTI in ultra-thin gate-oxide PMOSFET’s.- International Electron Device Meeting Technical Digest (IEDM'04), p. 109-112, 2004

Denais M., Huard V., Parthasarathy C., Ribes G., Perrier F., Revil N., Bravaix A.- New methodology of NBTI xharacterization in order to reduce recovery effect.- Proceedings of the European Solid State Device Research Conference (ESSDERC’04), Leuven, Belgique, p. 265-268, 2004

Denais M., Huard V., Parthasarathy C., Ribes G., Perrier F., Revil N., Bravaix A.- Oxide field dependence of interface trap generation during negative bias temperature instability in PMOS.- Proceedings of the IEEE Integrated Reliability Workshop, p. 119-122, 2004

Drillet P., Pazsko F., Mangelinck D., Gas P., Clugnet G., Bergman C., Dulcy C. Vaughan G.- Real time synchrotron analysis of the initial stages of galvaannealing in Al containing Zn baths.- Proceedings of the 6th International Conference on Zinc and Zinc Alloy Coated Steel Sheet, (Galvatech'04), Association for Iron § Steel Technology (ed.), 186 Thorn Hill Road, Warrendale, PA 15086, p. 667-, 2004

Egels M., Gaubert J., Pannier P., Bas G.- A 2.4 GHz RF CMOS receiver for low cost digital wireless communication for 802.15.4 standard.- Proceedings of the 16th International Conference on Microelectronics, ICM2004, Tunis, Tunisie, p. 299-302, 6-8 décembre 2004

Elalamy Z., Lo Monaco M., Simon J.J., Escoubas L., Enoch S., Flory F., Giovannini H., Germanium Anisotropic Etching for Infrared Antireflective Gratings.- Proceedings 4th Workshop on Physical Chemistry of Wet Etching of Silicon, PCWES 2004, May 26-28, 2004

Fabre A. , H. Barthélemy, B. Godara.- A low-power adjustable band-pass filter using only two controlled conveyors.- Proceedings of OPTIM 2004, Brasov, Roumania, vol. IV, p. 3-6, 20-21 May 2004

Forli L., Portal J.M., Nee D., Borot B.- Test chip and infrastructure IP solutions to improve the back-end process during all phases from a new technology development to manufacturing.- Proceedings of the Fifth IEEE International Conference on Devices, Circuits and Systems, Caracas, Venezuela, vol. 1, p. 77-82, 2004

Garros X., Leroux C., Reimbold G., Mitard J., Guillaumot B., Martin F., Autran J.L.- Reliability assessment of ultra-thin HfO2 oxides with TiN gate and polysilicon N+ gate.- IEEE Reliability Physics Symposium (IRPS) Proceedings, p. 176-180, 2004

Goguenheim D., Bravaix A., Gomri S., Moragues J.M., Monserie C., Legrand N., Boivin P.- Improved methodology based on hot carriers injections to detect wafer charging damage in advanced CMOS technologies.- Proceedings of 24th International Conference on Microelectronics (MIEL'04), Nis, Serbie, p.649-652, 16-19 May 2004

Harrison S., Coronel P., Leverd F., Cerutti R., Palla R., Delille D., Borel S., Pantel R., Dutartre D., Morand Y., Samson M.P., Lenoble D., Talbot A., Boeuf F., Sanquer M., Jehl X., Bustos J., Brut H., Cros A., Munteanu D., Autran J.L., Skotnicki T.- High performance SON (Silicon-On-Nothing) double gate MOSFET with perfect electrostatic integrity for nanoscale regime.- Proceedings of the 2004 IEEE Silicon Nanoelectronic Workshop (SNW’2004), Honolulu, Hawaii, USA, p. 3-4, 2004

Harrison S., Cros A., Coronel P., Leverd F., Beverina A., Cerutti R., Wacquez R., Bustos J., Delille D., Tavel B., Barge D., Bienacel J., Samson MP., Martin F., Maitrejean S., Munteanu D., Autran J.L., Skotnicki T.- Poly-Gate REplacement Through Contact Hole (PRETCH): A new method for high-k/metal gate and multi-oxide implementation on chip.- Proceedings of the 50th IEEE International Electron Device Meeting (IEDM 2004), San Francisco, Etats-Unis, p. 291-294, 2004

Harrison S., Munteanu D., Autran J.L., Cros A., Cerutti R., Skotnicki T.- Electrical characterization and modeling of high-performance SON DG MOSFETs.- Proceedings of the 34th European Solid State Device Research Conference (ESSDERC’2004), Leuven, Belgique, p. 373-376, 2004

Houssa M., De Gendt S., Autran J.L., Groeseneken G., Heyns M.M.- Detrimental aspect of hydrogen on negative bias temperature instabilities in HfO2-based pMOSFETs.- Technical Digests of the 2004 Symposium on VLSI Technology, Honolulu, Hawaii, USA, p. 212-213, 2004

Idrissi H., Lancin M., Douin J., Regula G., Pichaud B., El Bouayadi R., Roussel J. M.- Study by Weak Beam and HRTEM of double stacking faults created by external mechanical stress in 4H-SiC.- Mat. Res. Soc. Symp. Proc. 815,115-20 (2004)

Labat S. , Bocquet F., Bigault T., Roussel L., Mikaelian G. , Alfonso C., Charai A., Thomas O.- The early stages of stress development during epitaxial growth of Ag/Cu multilayers.- Mat. Res. Soc. Symp. Proc. 791, 163-8 (2004)

Labbe A., Perez A., Portal J.-M.- Efficient hardware implementation of a CRYPTO-MEMORY based on AES algorithm and SRAM architecture.- Proceedings of the 2004 International Symposium on Circuits and Systems (ISCAS '04), USA, vol. 2, p. 637-640, 2004

Le Quang N. , Goaer G., Coustier F., Gauthier M., Duffar T., Delannoy Y., Mangelinck N., Barvinschi F.- Thickness reduction of large size high efficiency screen-printed multicrystalline silicon solar cells – possibilities and limitations for industrial production.- Proceedings of the 19th European Photovoltaic Solar Energy Conference and Exhibition, p. -, 2004

Leroux Ch., Saitzek S., Villain S. Gavarri J.-R., Klimczak M. Kopia A. Kusinski J.- Nano-powders and thin film of Cu-doped CeO2 for gas sensors.- Proceedings of the 13th European Microscopy Congress (EMC 2004), Antwerp, Belgium, vol II, p 95-96, 2004

Lopez L., Nee D., Masson P., Bouchakour R.- A low cost test vehicle for embedded DRAM capacitor : Investigation and monitoring of the process.- Proceedings of the IEEE International Reliability Physics Symposium, USA, p. 498-501, 2004

Madigou V., Villain S., Nihoul G.- Structure of ferroelectric Aurivillius phases studied by transmission electron microscopy.- Proceedings of the XVIIth Physical Metallurgy and Materials Science Conference, Advanced Materials & Technologies, (AMT'2004), Lodz-Artorowek, Poland, Inzynieria Materialowa, NR3, 140, XXV Maj-Czerwiec, PL ISSN 0208-6247, Advanced Materials & technologies, p. 389-391, 2004

Martinuzzi S., Palais O.- Hydrogen passivation of bulk defects and surface in silicon.- Mat. Res. Soc. Symp. Proc. 813,87-92 (2004)

Mazingue T., Escoubas L., Flory F., Forestier C., Jelinek M., Aguir K., Optical Characterization of thin films for gas sensors.- Proceedings OSA Conf. Optical Society of America, “Optical Interference Coatings” June 27 – July 2 (2004)

Molas G., Deleruyelle D., De Salvo B., Ghibaudo G., Gely M., Jacob S., Lafond D., Deleonibus S.- Impact of few electron phenomena on floating-gate memory reliability.- Proceedings of the IEEE International Electron Devices Meeting (IEDM), USA, p. 877-880, 2004

Munteanu D., Autran J.L., Bescond M., Houssa M.- Impact of high-k gate dielectric on decananometer double-gate MOSFETs : gate-fringing field and parasitic charge effects.- Proceedings of the 5th European Workshop on Ultimate Integration of Silicon (ULIS 2004), Leuven, Belgium, p. 39-42, 2004

Perniola L., Bernardini S., Iannaccone G., De Salvo B., Ghibaudo G., Masson P., Gerardi C.- Electrostatic effect of localised charge in dual bit memory cells with discrete traps.- Proceedings of the 34th European Solid-State Device Research Conference (ESSDERC), Leuven, Belgium, p. 249-252, 2004

Portal J.M., Saillet B., Nee D.- Flash memory cell diagnosis : high level model.- Proceedings of the Non-Volatile Memory Technology Symposium, USA, p. 100-104, 2004

Ragad H., Bouchakour R., Lalande F., Portal J.M., Mirabel J.M.- A pseudo 2D analysis of the velocity saturation region for flash cell modelling.- Proceedings of the Non-Volatile Memory Technology Symposium, USA, p. 92-99, 2004

Ranica R., Villaret A., Fenouillet-Beranger C., Malinge P., Mazoyer P., Masson P., Delille D., Charbuillet C., Candelier P., Skotnicki T.- A capacitor-less DRAM cell on 75nm gate length, 16nm thin fully depleted SOI device for high density embedded memories.- Proceedings of the IEEE International Electron Devices Meeting (IEDM), USA, p. 277-280, 2004

Ranica R., Villaret A., Malinge P., Mazoyer P., Lenoble D., Candelier P., Jacquet F., Masson P., Bouchakour R., Fournel R., Schoellkopf J.P., Skotnicki T.- A one transistor cell on bulk substrate (1T-Bulk) for low-cost and high density eDRAM.- Proceedings of the VLSI Technology Symposium, Hawai, p. 128-129, 2004

Rideau D., Dray A., Gilibert F., Agut F., Giguerre L., Gouget G., Minondo M., Juge A.- Characterization & modeling of low electric field gate-induced-drain-leakage [MOSFET].- Proceedings of the International Conference on Microelectronic Test Structures (ICMTS '04), Japan, p. 149-154, 2004

Saitzek S., Guirleo G., Guinneton F., Sauques L., Villain S., Aguir K., Leroux C., Gavarri J-R.- Structural and optical properties of thermochromic bilayers Ceo2-Vo2.- Proceedings of the XVIIth Physical Metallurgy and Materials Science Conference, Advanced Materials & Technologies, (AMT'2004), Lodz-Artorowek, Poland, Inzynieria Materialowa, NR3, 140, XXV Maj-Czerwiec, PL ISSN 0208-6247, Advanced Materials & technologies, 2004

Saitzek S., Villain S., Fremy M-A., Leroux C., Nolibe G., Gavarri J-R.- Nanostructured pure and doped ceria catalysts for gas sensor applications.- Proceedings of the XVIIth Physical Metallurgy and Materials Science Conference, Advanced Materials & Technologies, (AMT'2004), Lodz-Artorowek, Poland, Inzynieria Materialowa, NR3, 140, XXV Maj-Czerwiec, PL ISSN 0208-6247, Advanced Materials & technologies, p. 231-233, 2004

Scheybal A., Bertschinger R., Nolting F., Jung T.A., Ramsvik T., Putero M.- Induced magnetic ordering in a molecular monolayer.- Laboratory for micro- and nanotechnology (LMN) scientific annual report, Paul Scherrer Institute, Villigen, Switzerland, 2004

Spitale E., Corso D., Crupi I., Nicotra G., Lombardo S., Deleruyelle D., Gely M., Buffe, N., De Salvo B., Gerardi C.- Effect of high-k materials in the control dielectric stack of nanocrystal memories.- Proceedings of the 34th European Solid-State Device Research Conference (ESSDERC), Leuven, Belgium, p. 161-164, 2004

Sylla L., Hodroj A., Mangelinck-Noël N., Duffar T.- Measurement of silicon undercooling for better understanding of solidification phenomena during the elaboration of polycrystalline silicon.- Proceedings of the 19th European Photovoltaic Solar Energy Conference and Exhibition, p. -, 2004

Texier M., Bonneville J., Proult A., Rabier J., Thilly L.- Low temperature deformation mechanisms of icosahedral AlPdMn quasicrystals.- Mat. Res. Soc. Symp. Proc., 805, LL.5.3.1 (2004)

Xerri B., Borloz B.- Detection by SNR maximization : application to the blind source separation problem.- 5^th International Conference on Independent Component Analysis and Blind Signal Separation, p. 602-610, ICA (IEEE) Granada (Espagne), septembre 2004

Zaid L., Cheynet De Beaupre V., Rahajandraibe W., Sangiovanni A.- A fully differential 5V buffer for RF mixer output with current and linearity control.- Proceedings of the 5th IEEE International Conference on Devices, Circuits and Systems, Caracas, Venezuela, vol. 1, p. 46–50, November 2004

Zhou B.H., Nguyen Thi H., Reinhart G., Dabo Y., Billia Liu Q., Lyubimova T.P., Roux B.- Directional solidification microstructures under natural and controlled convection conditions.- Proceedings of International Conference on Advanced Problems in Thermal Convection, Perm, Russie, p. 357-364, 2004

2005

Barthélemy H., Fillaud M.- Simple CMOS 1/Lw inductive transconductance amplifier.- Proceedings of the 2005 European Conference on Circuit Theory and Design (ECCTD Cork 2005), Cork, Ireland, vol. 3, p. 329-332, 2005

Bécu S., Crémer S., Noblanc O., Autran J.L., Delpech P.- Characterization and modeling of Al2O3 MIM capacitors: temperature and electrical field effects.- Proceedings of the 35th European Solid State Device Research Conference (ESSDERC’2005), Grenoble, 12-16 septembre 2005, Editions Frontières, p. 265-268, 2005

Berbezier I., M. Descoins, B. Ismail, H. Maaref, A. Ronda.- Structural and optical properties of Ge QDs deposited by MBE.- JAP FORUM FIB : Fabrication, Organisation and Use of Memories fabricated by FIBI, Berbezier, A. Karmous, A. Ronda, T. Stoica, L. Vescan, G. Remco, A. Olzierski, E. Tsoi, A. Nassiopoulou (eds), I.O.P., à paraitre

Bergeret E., Margalef A., Pannier P., Gaubert J.- Contraintes sur la conception d’un tag RFID UHF.- Actes du 6ème Colloque sur le Traitement Analogique de l'Information, du Signal et ses Applications (TAISA 2005), Marseille, France, p. 119-122, 2005

Bergeret E., Pannier Ph., Gaubert J.- Optimization of UHF voltage multiplier circuit for RFID application.- Proceedings of the 17th International Conference on Microelectronics (ICM2005), Islamabad, Pakistan, p. 172-177, 2005

Bescond M., Cavassilas N., Kalna K., Nehari K., Raymond L., Autran J.L., Lannoo M., and Asenov A.- Ballistic transport in Si, Ge, and GaAs nanowire MOSFETs.- 51st IEEE International Electron Device Meeting (IEDM 2005), Washington, Etats-Unis, IEDM Techical Digest, p. 533-536, 2005

Bescond M., Cavassilas N., Nehari K., Autran J.L., Lannoo M., Asenov A.- Impact of point defect location in nanowire silicon MOFSETs.- Proceedings of the 35th European Solid State Device Research Conference (ESSDERC’2005), Grenoble, 12-16 septembre 2005, Editions Frontières, p. 221-224, 2005

Bescond M., Cavassilas N., Raymond L., Asenov A.- Simulation study of arbitrarily oriented Si, Ge and GaAs ballistic Nanowire MOSFETs.- Proceedings of the 14th Intenational Conference on Nonequilibrium Carrier Dynamics in Semiconductors (HCIS 14), Chicago, USA, 24-30 July 2005, IOP Conference Series, 2005

Bouquet V., Canet P., Lalande F., Devin J., Leconte B.- Fowler-Nordheim erasing time prediction in Flash memory.- Proceedings of the 6th Annual Non-Volatile Memory Technology Symposium (NVMTS’2005), Dallas, Texas, November 7-10, 2005, CD-ROM, 2005

Bouquet V., Canet P., Lalande F., Devin J., Leconte B., Mariéma N.- Variation of flash memory threshold voltage correlated with applied voltage slope in Fowler Nordheim erase mode.- Proceedings of Ph.D. Research In Micro-Electronics & Electronics (PRIME’2005), Lausanne, Switzerland, July 25-28 2005, vol. 1, p. 86-88, 2005

Bourdel S., Gaubert J., Pannier Ph., Barthélémy H., Battista M., Bachelet Y., Bas G.- Intégration d’un récepteur UWB en technologie CMOS pour les modulations PPM.- Actes du 6ème Colloque sur le Traitement Analogique de l'Information, du Signal et ses Applications (TAISA 2005), Marseille, France, p. 95-98, 2005

Bravaix A., Goguenheim D., Huard V., Denais M., Parthasarathy C., Perrier F., Revil N., Vincent E.- Impacts of the recovery phenomena on the worst-case of damage in DC/AC stressed ultra-thin NO gate-oxide MOSFETs.- Proceedings of the 16th European Symposium on Reliability of Electron Devices, Failure physics and analysis, (ESREF’05), Bordeaux, France, 10th-14th October 2005, p. 1370-1375, 2005

Buckley J., De Salvo B., Deleruyelle D., Gely M., Damlencourt J.F., Holliger P., Martin F., Deleonibus S.- Study of fixed charges in atomic layer deposited Al2O3 dielectrics.- Proceedings of the 14th biennial Conference on Insulating Films on Semiconductors (INFOS 2005), Leuven, Belgium, June 2005, p. -, 2005

Casadei B., Dufaza C., Martin L.- Modèles de simulation de pixels actifs à photogrille.- Colloque READ'05 : Rétine Electronique, ASIC-FPGA et DSP pour la Vision et le Traitement d'Images en Temps réel, Evry, France, p. 107-112, 1-3 juin 2005

Casadei B., Dufaza C., Martin L.- Simulation model for active pixel sensor.- Proceedings of the 9th WSEAS International CSCC Multiconference, Vouliagmeni-Athens, Greece, 11-16th July 2005, ISBN 960-8457-29-7, p. 497-813, 2005

Castellani-Coulié K., Munteanu D., Autran J.L., Ferlet-Cavrois V., Paillet P., Masson P.- Device simulation study of SEU in SRAMs based on double-gate MOSFETs.- Proceedings of the 1st International Conference on Memory Technology and Design (ICMTD 2005), 21-24 mai 2005, Giens, France, p. 93-96, 2005

Chaillan F., Fraschini C., Amate M., Courmontagne P. Multiresolution analysis of SAS images.- Electronic Proceedings of IEEE OCEANS'05, Brest, France, vol. 2, p. 1127-1132, 2005

Chaillan F., Fraschini C.,Courmontagne P.- Stochastic matched filtering method applied to SAS imagery.- Proceedings of IEEE OCEANS'05, Brest, France, vol. 1, p. 233-238, 2005

Cheynet de Beaupré V., Rahajandraibe W., Zaid L.- Methode de compensation en température d’un oscillateur en anneau fonctionnant à 2,45GHz.- Actes du 6ème Colloque sur le Traitement Analogique de l'Information, du Signal et ses Applications (TAISA 2005), Marseille, France, p. 103-106, 2005

Cheynet de Beaupré V., Rahajandraibe W., Zaid L., Bas G. CMOS 2.45GHz ring oscillator with temperature compensation.- Proceedings of the 12th IEEE International Conference on Electronics, Circuits ans Systems (ICECS’05), Gammarth, Tunisia, vol. 1, isbn 9973-61-100-4, p. 405-408, 2005

Collard Bovy A., Courmontagne P.- An all digital signal receiver for transmissions/reception of Radio-Frequencies.- Proceedings of IEEE-PRIME 2005, Lausanne, Suisse, vol. 2, p. 259-262, juillet 2005

Dehaese N., Bourdel S., Bachelet Y., Bas G.- FSK zero-crossing demodulator for 802.15.4 low-cost receivers.- Proceedings of the 12th IEEE International Conference on Electronics, Circuits and Systems (ICECS), Tunis, Tunisie, vol. 2, p. 446-449, 2005

Deleruyelle D., Molas G., De Salvo B., Gely M., Lafond D.- Single-electron phenomena in ultra-scaled floating-gate devices and their impact on electrical characteristics.- Proceedings of ICMTD’05, 1st International Conference on Memory Technology and Design, Giens, France, mai 2005, p. 25-27, 2005

Denais M., Huard V., Parthasarathy C., Ribes G., Perrier F., Roy D., Bravaix A.- New perspectives on NBTI in advanced technologies : modelling and characterization.- Proceedings of the 35th European Solid State Device Research Conference (ESSDERC’2005), Grenoble, 12-16 septembre 2005, Editions Frontières, p. 265-268, 2005

Deschamps A., Nicolas M., Perrard F., Lae L.- Understanding non isothermal precipitation in complex systems : interplay between experiments and modelling.- Proceedings of the International Conference on Solid-Solid Phase Transformations in Inorganic Materials, Phoenix, may 2005

Di Gilio T., Bravaix A.- Lifetime prediction of ultra-thin gate-oxide PMOSFETs submitted to hot-carrier injections.- Proceedings of the IEEE Integrated Reliability Workshop (IRW'05), Stanford Sierra Camp, Fallen Leaf Lake, USA, 17th-20th October 2005, p. 54-57, 2005

Egels M., Gaubert J., Pannier P.- Guidelines for standard CMOS travelling wave amplifier design.- Proceedings of the 17th International Conference on Microelectronics (ICM2005), Islamabad, Pakistan, p. 19-23, 2005

Ehouarne L., Mangelinck D., Gas P., Putero M., Mercier J.P., Coppard R.- Limitations du cobalt dans le procédé salicide et comparaison avec le nickel.- Proceedings des 8èmes Journées Nationales du Réseau Doctoral de Microélectronique, JNRDM 2005, Paris, p. 491, 2005

Fournigault M., Trémeau A., Robert-Inacio F.- Characteristic centre points for quasi-convex shapes.- Proceedings of the 9th European Congress on Stereology and Image Analysis, Zakopane, Poland, vol. 2, p. 299-304, 2005

Fournigault M., Trémeau A., Robert-Inacio F.- Generalization of the circumscribed disk algorithm extension.- Proceedings of the IS&T International Conference on Imaging : Technology and Applications for the 21st century, Beijing, China, p. 332-333, 2005

Fraschini C., Chaillan F., Courmontagne P.- An improvement of the discriminating capability of the active SONAR by optimization of a criterion based on the Cramer-Rao lower bound.- Proceedings of IEEE OCEANS'05, Brest, France, vol. 2, p. 804-809, 2005

Fraschini C., Chaillan F., Courmontagne P.- On the fluctuations of the ambiguity function in RADAR and SONAR.- Proceedings of IEEE OCEANS'05, Brest, France, vol. 2, p. 1181-1186, 2005

Gaubert J., Bourdel S., Pannier Ph., Barthélemy H., Battista M., Egels M.- Méthodes de conception pour amplificateurs faible bruit pour systèmes intégrés UWB 3.1-10.6 GHz.- Actes du 6ème Colloque sur le Traitement Analogique de l'Information, du Signal et ses Applications (TAISA 2005), Marseille, France, p. 17-20, 2005

Gilibert F., Rideau D., Payet F., Boeuf F., Batail E., Minondo M., Bouchakour R., Skotnicki T., Jaouen H.- Strained Si/SiGe MOSFET capacitance modeling based on band structure analysis.- Proceedings of the 35th European Solid State Device Research Conference (ESSDERC’2005), Grenoble, 12-16 septembre 2005, p. 281–284, 2005

Goux L., Lisoni J.G., Schwitters M., Paraschiv V., Maes D., Haspeslagh L., Wouters D.J., Menou N., Turquat Ch., Madigou V., Muller Ch., Zambrano R.- Composition control and ferroelectric properties of sidewalls in integrated 3-Dimensional Sr0.8Bi2.2Ta2O9-based ferroelectric capacitors.- Proceedings of ICMTD’05, 1st International Conference on Memory Technology and Design, Giens, France, mai 2005, p. 163-165, 2005

Gregoire M., Kordic S., Gergaud P., Thomas O., Ignat M.- Thermomechanical behaviour and properties of PVD and ECD Cu thin films .- Mat. Res. Soc. Symp. Proc., 875, O.4.5.1 (2005)

Guérin C., Huard V., Bravaix A., Denais M., Roux J.M., Perrier F., Baks W.- Combined effects of NBTI and channel hot-carrier effects in pMOSFETs.- Proceedings of the IEEE Integrated Reliability Workshop (IRW'05), Stanford Sierra Camp, Fallen Leaf Lake, USA, 17th-20th October 2005, p. 10-15, 2005

Guigues F., Rudolff F., Kussener E.- Static analog design methodology applied to self cascode PTAT voltage reference.- Proceedings of FTFC'2005, Faible Tension, Faible Consommation, 18-20 mai 2005, Paris, France, p. 123- 126, 2005

Hoummada K., Mangelinck D., Bergman C., Gas P., Lee P. S., Osipowicz T.- Redistribution du platine lors de la formation des siliciures de nickel par réaction d’un film de Ni (5%Pt) avec Si (100).- Proceedings des 8èmes Journées Nationales du Réseau Doctoral de Microélectronique, JNRDM 2005, Paris, p. 197, 2005

Lexcellent C., Roinet P., Bernardini J., Beke D.L., Olier P.- High temperature creep measurements in equiatomic Ni-Ti shape memory alloy.- Proceedings of the 1st International Conference « Diffusion in Solids and Liquids », Aviero, Portugal, p. 25, 2005

Lin N., Dmitriev A., Spillmann H., Weckesser J., Abel M., Messina P., Barth J.V., Kern K.- Observing and steering the formation of coordination compounds on surfaces at the single-molecule level.- Proceedings of the Conference “Clusters and Nano-Assemblies - Physical and Biological Systems”, Richmond, Virginia, USA 10-13 November 2003, World Scientific Publishers, P. Jena, S. N. Khanna & B. K. Rao Eds, p.301-307, 2005

Lopez L., Masson P., Nee D., Bouchakour R.- A model to explain the C-V curves of DRAM capacitors with silicon electrodes and trapping dielectrics.- Proceedings of ICMTD’05, 1st International Conference on Memory Technology and Design, Giens, France, mai 2005, p. 85-88, 2005

Lopez L., Portal J.M., Née D.- A new embedded measurement structure for eDRAM capacitor.- Proceedings of the IEEE International Conference on Design Automation and Test in Europe (DATE'05), München, Germany, vol. 1, p. 462-463, 2005

Loubens A., Rivero C., Boivin P., Charlet B., Fortunier R., Thomas O.- Investigation of local stress fields: finite elements modelling and high resolution X-ray diffraction.- Mat. Res. Symp. Proc. 840, O.8.3.1 (2005)

Meillère S., Barthélemy H., Martin M.- Démodulateur ASK pour un lecteur RFID à 13.56MHz.- Actes du 6ème Colloque sur le Traitement Analogique de l'Information, du Signal et ses Applications (TAISA 2005), Marseille, France, p. 45-48, 2005

Munteanu D., Autran J.L., Loussier X., Harrison S., Cerutti R., Skotnicki T.- Quantum short-channel compact modeling of drain-current in double-gate MOSFET.- Proceedings of the 35th European Solid State Device Research Conference (ESSDERC’2005), Grenoble, 12-16 septembre 2005, Editions Frontières, p. 137-140, 2005

Nehari K., Autran J.L., Munteanu D., Bescond M.- A compact model for the threshold voltage of silicon nanowire MOS transistors including 2D-quantum confinement effects.- Technical Proceedings of the 8th International Conference on Modeling and Simulation of Microsystems (MSM'2005), 8-12 mai 2005, Anaheim, Californie, USA, Computational Publications, p. 175-178, 2005

Nehari K., Cavassilas N., Autran J.L., Bescond M., Munteanu D., Lannoo M.- Influence of band-structure on eectron ballistic transport in silicon nanowire MOSFET’s : an atomistic study.- Proceedings of the 35th European Solid State Device Research Conference (ESSDERC’2005), Grenoble, 12-16 septembre 2005, Editions Frontières, p. 229-232, 2005

Nehari K., Munteanu D., Autran J.L., Harrison S., Tintori O., Skotnicki T.- Compact modeling of threshold voltage in double-gate MOSFET including quantum mechanical and short channel effects.- Technical Proceedings of the 8th International Conference on Modeling and Simulation of Microsystems (MSM'2005), 8-12 mai 2005, Anaheim, Californie, USA, Computational Publications, p. 179-182, 2005

Nemouchi F., Mangelinck D., Bergman C., Gas P., Clugnet G.- Formation linéaire-parabolique de Ni2Si caractérisée par diffraction de rayons X et calorimétrie différentielle à balayage.- Proceedings des 8èmes Journées Nationales du Réseau Doctoral de Microélectronique, JNRDM 2005, Paris, p. 488, 2005

Ntsoenzok E., Ashok S., Regula G., Pichaud B.- Helium implant depth dependence on thermal growth of nanocavities in silicon.- IEEE Proc., 04EX862, 3, 2382-6 (2005)

Ntsoenzok E., El Bouayadi R., Regula G., Pichaud B., Ashok S.- Thermal growth of He-cavities in Si studied by cascade implantation.- Mat. Res. Symp. Proc. 864, 461-6 (2005)

Parthasarathy CR, Denais M., Huard V., Ribes G., Vincent E., Bravaix A.- Characterization and modeling NBTI for design-in-reliability.- Proceedings of the IEEE Integrated Reliability Workshop (IRW'05), Stanford Sierra Camp, Fallen Leaf Lake, USA, 17th-20th October 2005, p. 158-162, 2005

Pfeiffer O., Gnecco E., Zimmerli L., Maier S., Meyer E., Nony L., Bennewitz R., Diederich F., Fang H., Bonifazi D.- Force microscopy on insulators: Imaging of organic molecules.- Journal of Physics : Conference Series, Conference on Atoms and Molecules Near Surfaces, Weiner J., Feenstra L., Schmiedmayer J. Eds, vol. 19, p. 166-174, 2005

Portavoce A., Berbezier I., Ronda A., Gas P., Christensen J.S., Kuznetsov A.Yu., Svensson B.G.- Diffusion in solids – Past, present and future.- Proceedings of the 5th International Conference on Diffusion in Solids - Past, Present and Future, Moscow, Russia, 22-25 May 2005, p. 135-142, 2005

Ranica R., Villaret A., Malinge P., Candelier P., Masson P., Bouchakour R., Mazoyer P., Skotnicki T.- 1T-Bulk DRAM cell with improved performances: the way to scaling.- Proceedings of ICMTD’05, 1st International Conference on Memory Technology and Design, Giens, France, mai 2005, p. 59-52, 2005

Ranica R., Villaret A., Malinge P., Gasiot G., Mazoyer P., Roche P., Candelier P., Jacquet F., Masson P., Bouchakour R., Fournel R., Schoellkopf J.P., Skotnicki T.- Scaled 1T-Bulk devices built with CMOS 90 nm technology for low-cost eDRAM applications.- Proceedings of VLSI Technology Symposium, Kyoto, Japan, June 14-16 2005, p. 38-39, 2005

Régnier A., Portal J.M., Bouchakour R., Renovell M.- Modeling halo implant failures in MOS sub-micron technology.- Proceedings of the IEEE Latin American Test Workshop, (LATW’05), Salvador da Bahia, Brazil, p. 29-33, 2005

Regula G., El Bouayadi R., Lancin M.,. Ntsoenzok E, Pichaud B., Ruault M-O.- Roles of impurities and implantation depth on He⁺ cavity shape in silicon.- Mat. Res. Symp. Proc. 864, 345-50 (2005)

Rey-Tauriac Y., Badoc J., Reynard B., Bianchi R.A., Lachenal D., Bravaix A.- Hot-carrier reliability of 20V MOS transistors in 0.13 µm CMOS technology.- Proceedings of the 16th European Symposium on Reliability of Electron Devices, Failure physics and analysis, (ESREF’05), Bordeaux, France, 10th-14th October 2005, p. 1349-1354, 2005

Robert-Inacio F.- Distance maps for shape classification.- Proceedings of the IS&T International Conference on Imaging : Technology and Applications for the 21st century, Beijing, China, p. 300-301, 2005

Robert-Inacio F., Mézerette S., Charollais F., Cellier F.- Characterization of HTR nuclear fuel particles by distance mapping.- Proceedings of the 9th European Congress on Stereology and Image Analysis, Zakopane, Poland, vol 1, p. 93-97, 2005

Saillet B., Portal J.M., Née D.- Flash memory cell : an automated diagnosis tool for geometric failures.- Proceedings of ICMTD’05, 1st International Conference on Memory Technology and Design, Giens, France, mai 2005, p. 271-274, 2005

Saillet B., Portal J.M., Née D.- Flash memory cell : parametric test data reconstruction for process monitoring.- Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 3-5 October 2005, Monterey, CA, USA, p.131-139, 2005

Thomas O., Loubens A., Gergaud P., Labat S.- X-ray diffraction: a wonderful tool to probe lattice strains in materials with small dimensions.- Mat. Res. Symp. Proc. 840, Q.3.2.1 (2005)

Tintori O., Munteanu D., Autran J.L.- Compact modeling of symmetric Double-Gate MOSFET for circuit simulation.- Proceedings of the 6th European workshop on Ultimate Integration of Silicon (ULIS 2005), 7-8 avril 2005, Bologne, Italie, p. -, 2005

Tramoni A., Tetelin C., Enguent J-P.- Method to simulate contactless system based on S-parameters measurements.- Proceedings of the 35th European Microwave Week (EuMW2005), Paris, France, p. 375-378, 2005

Tramoni A., Tetelin C., Malherbe A., Conraux J.- Best compromise between tele supply and modulated rate of backscattered signal in RFID systems.- Proceedings of the 2005 International Symposium on Intelligent Signal Processing and Communication Systems (ISPACS’05), Hong Kong, China, p. 621-625, 2005

Vervisch W., Ventura L., Pichaud B., Ducreux G., Lhorte A.- Pt_s-O_i complex formation in platinum diffused silicon.- Mat. Res. Symp. Proc. 864, 59-64 (2005)

2006

Aguir K., A. Labidi, C. Lambert-Mauriat.- Contribution of the impedance spectroscopy to identify the conduction mechanisms in WO3 sensors, IEEE Sensors 06, - Daegu Corea, oct. 22-25 2006

Alexandre L., K. Rousseau, C. Alfonso, W. Saikaly, J. Thibault, A. Chrai, L. Fares, C. Grosjean.- Lattice parameter measurements by CBED in Si : is FIB preparation suitable ? - Proceedings of ICEM 16, p 1010, 2006

Arab M., F. Berger, F. Picaud, Ch. Ramseyer, R. M. Babaa, F. Valsaque E. McRae. J. Glory and M. L'hermite - Mayne. - Direct growth of the Multi Walled Carbon nanotubes as a tool to detect ammonia at room temperature.- 3ème colloque européen: Nano-E & GDR- E. Sciences & Application of nanotubes, Obernai. France 16 -19 October 2006

Autran J.L., Roche P., Borel J., Sudre C., Castellani K., Munteanu D., Parrassin T., Gasiot G., Schoellkopf J.P.- Altitude SEE Test European Platform (ASTEP): project overview, first results in CMOS 130nm and perspectives.- IEEE Proceedings of 9^th European Workshop on Radiation and its Effects on Components and Systems, RADECS, p. -, 2006

Aziza H., Delsuc B., Portal J-M., Née D.- Speeding up simulation time in EEPROM memory designs.- Proceedings of IEEE Design and Test of Integrated Systems in Nanoscale Technology, Tunis, Tunisia, September 5-7, 2006, p. 285-288 - http://dx.doi.org/10.1109/DTIS.2006.1708695

Barakel D., O. Palais, S. Martinuzi, M. Gauthier, N. Le Quang and G. Goaer - Bulk lifetime determination through a multicrystalline silicon ingot and related solar cells properties.- EPSECE 21st- Proceedings of 21st European Photovoltaic Solar Energy Conference and Exhibition, Barcelona, Spain, 2006

Barral V., Poiroux T., Vinet M., Widiez J., Previtali B., Grosgeorges P., Le Carval G., Barraud S., Deleonibus S., Autran J.L., Munteanu D.- Experimental determination of the channel backscattering coefficient on 10nm- metal-gate Double-Gate transistors.- Proceedings of 7^th European workshop on Ultimate Integration of Silicon (ULIS 2006), p. 13-16, 2006

Barthélemy H., Bourdel S., Dehaese N., Egels M., Gaubert J., Pannier P., Bas G.- RF CMOS transceiver for 802.15.4 SoC.- IEEE Radio and Wireless Symposium (RWS), San Diego, USA, p. 575-578, 2006

Bastide S., R. Tena-Zaera, C. Levy-Clément, D. Barakel, O. Palais and S. Martinuzzi - Photo-Electrochemical Texturisatgion of n-type Crystalline Si.- EPSECE 21st- Proceedings of 21st European Photovoltaic Solar Energy Conference and Exhibition, Barcelona, Spain, 2006

Bouchet D., S. Lartigue-Korinek, R. Molens, J . Thibault.- Yttrium segregation and intergranular defcts in alumina.- Proceedings of ICEM 16, Int Cong. Electron Microscopy, - p 1433, 2006

Boulmani R., M. Bendahan, J. Guerin, C. Lambert Mauriat, K. Aguir.- WO3 sensor response according to operating temperature: experiment and modelling MNE 2006.- International Conference on Micro-and Nano- Engineering, Barcelone - Espagne, 17-20 sept 2006

Cayzac R., F.Boulc'h, C.Lambert-Mauriat, M.Bendahan, P.Lauque, P.Knauth.- Preparation and physico-chemical characterization of nanostructured thin layers of CuInS2 for application in solar cells.- Journées Italo-Françaises de Chimie 2006, Turin, Italie, 22-24 mai 2006

Chabriel G., Barrère J.- Second-order blind source separation: a new expression of instantaneous separating matrix for mixtures of delayed sources.- Proceedings of the 7th IEEE International Workshop on Signal Processing Advances in Wireless Communications (SPAWC'06), Vols 1 and 2, p 358-362, 2006 - Doi : 10.1109/SPAWC.2006.346397

Chaillan F., Courmontagne Ph.- On the Use of the Stochastic Matched Filter for Ship Wake Detection in SAR Images.- Proceedings of OCEANS’06, Vol. 1-4, pp. 521-526, 2006 - DOI: 10.1109/OCEANS.2006.307122

Chaillan F., Courmontagne Ph.- Coupling the Stochastic Matched Filter and the à Trous Algorithm for SAS Images De-noising.- Proceedings of OCEANS’06 ASIA Pacific, Vol. 1-2, pp. 234-241, 2006 - DOI: 10.1109/OCEANSAP.2006.4393855

Chaillan F., Courmontagne Ph.- Detection of Short Signals in a Noisy Underwater Environment.- Proceedings of OCEANS’06 ASIA Pacific, Vol. 1-2, pp. 260-266, 2006 - DOI: 10.1109/OCEANSAP.2006.4393859

Chalabi H., K. Aguir, Ph. Menini.- Development of integrated smart nose based on wo3 gas sensors.- Eurosensors XX, - Goteborg, Sweden, September 17-20, 2006

Charbouillot S., Pérez A., Fronte D.- A Programmable Hardware Cellular Automaton : Example of Data Flow Transformation.- Proceedings of the 13th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2006), Nice, France, dec.10-13 2006, p.1232-1235 - DOI:10.1109/ICECS.2006.379684

Chérioux F., F. Palmino, E. Duverger, Y. Makoudi, M. Arab, F. Picaud and C. Ramseyer , 2,4,6-tri(2'-thienyl)-1,3,5-triazine deposited on SiB(111) interface: Synthesis, STM images and molecular modeling. - 1er prix Poster Elecmol'06, - December, 11-15th, Grenoble, 2006

Cismondi F., Rigollet F., Jauffret C., Xerri B., Schlosser J.- Contrôle non destructif par thermographie infrarouge de composants face au plasma : identification de la résistance thermique de contact dans l’espace de Laplace.- Société Française de Thermique, Ile de Ré, 16-19 Mai 2006

Collard Bovy A., Durand B., Courmontagne Ph.- An Integrating Low Cost and Low Power All-digital Signal Receiver For Narrow-Band Radio Frequency Architectures in Interfered Channel.- Proceedings of CITSA’06, Vol. 3, pp. 73-78, 2006

Commin L., Masse J.-E., Dumont M., Barrallier L.- Microstructure Features of Hot Rolled AZ31 Magnesium Alloy for Friction Stir Welding.- Proceedings of the 7th International Conference on Magnesium, Dresden, pxxx, 6-9 nov. 2006

Courmontagne Ph., Chaillan F.- The Adaptive Stochastic Matched Filter for SAS Images De-noising.- Proceedings of OCEANS’06, Vol. 1-4, pp. 538-543, 2006 - DOI:10.1109/OCEANS.2006.307125

Courmontagne Ph., Chaillan F., Lerda O.- SAS Image De-noising by the Curvelet Stochastic Matched Filter Transform.- Proceedings of OCEANS’06 ASIA Pacific, Vol. 1-2, pp. 220-226, 2006 - DOI: 10.1109/OCEANSAP.2006.4393853

Courtade L., Turquat Ch., Muller Ch., Lisoni J.G., Goux L., Wouters D.J., Goguenheim D.- Microstructure and resistance switching in NiO binary oxide films obtained from Ni oxidation.- Proceedings of 7^th IEEE Non-Volatile Memory Technology Symposium (NVMTS 2006), San Mateo, USA, November 5-8, 2006, p. 94-99 - http://dx.doi.org/10.1109/NVMT.2006.378885

Couzinié J.P., J. Thibault, B . Décamps, L. Priester.- Extended interfacial structure between two asymmetrical facets of a S=9 GB in copper.- Proceedings of ICEM 16, Sapporo, p 1390, 2006

Dehaese N., Bourdel S., Barthélemy H., Bas G.- Simple demodulator for 802.15.4 low-cost receivers.- IEEE Radio and Wireless Symposium (RWS), San Diego, USA, p. 315-318, 2006

Deschamps A., Dumont M., Lae L., Bley F.- Use of Small-Angle X-ray Scattering for the characterisation of precipitates in Aluminium alloys.- Materials Science Forum, International Conference on Aluminium Alloys ICAA10, Vancouver, vol. 519-521, pp. 1349-1354, 2006

Dubois S., Palais O., M. Pasquinelli and S. Martinuzzi.- Influence of Iron and Chromium bulk contamination on the performances of p-type boron doped single-crystalline silicon solar cells.- EPSECE 21st- Proceedings of 21st European Photovoltaic Solar Energy Conference and Exhibition, Barcelona, Spain, 2006

Eberlein M., Escoubas S., Gailhanou M., Thomas O., Rohr P., Coppard R.- Diffraction from periodic arrays of oxide-filled trenches in silicon: investigation of local strain.- Materials Research Society Symposium Proceedings, vol. 913, p. 0913.D05.02, 2006

Einhaus R., Kraiem J., Cocco F., Caratini Y., Bernou D., Sarti D., Rey G., Monna R., Trassy C., Degoulange J., Delannoy Y., Martinuzzi S., Périchaud I., Record M.C., Rivat P.- PHOTOSIL : Simplified production of solar silicon from metallurgical silicon.- Proceedings 21th PVSEC, European Photovoltaic Solar Energy Conference, Dresden, Germany, - p. 580-586, 2006, september 4-8, 2006

Fiawoo M-F., A. Loiseau, A.-M Bonnot, A. Iaia, V. Bouchiat and J. Thibault.- TEM sample preparation for studying the interface CNTs-catalyst-substrateCarbon Nanaotubes.- Proceedings of the NATO Advanced Study Institute on Carbon Nanotubes: From Basic Research to Nanotechnology, Sozopol, Bulgaria, 21-31 May 2005.- Valentin N. Popov, Philippe Lambin (Eds), Springer, p. 47-, 2006

Fournigault M., Liardet PY., Teglia Y., Trémeau A., Robert-Inacio F.- Reverse engineering of embedded software using syntactic pattern recognition.- Lecture Notes in Computer Science, First International Workshop on Information Security (IS'06) Montpellier, France, Oct 30 - Nov 1 2006, 4277, p. 527-536, 2006

Gergaud P., Baldacci A., Rivero C., Sicardy O., Boivin P., Micha J-S., and Thomas O.- Stresses in Copper Damascene Lines: In-situ Measurements and Finite Element Analysis.- in "Stress-induced phenomena in metallization". 8th International Workshop on Stress-Induced Phenomena in Metallization, AIP Conference Proceedings, vol. 817, p. 205-210, 2006

Gillet E., Masek K., Lollman D., Gillet M.- Oxidation states of WO3 thin film upon annealing in reducing and oxidising atmospheres.- Joint Vacuum Conference 1, Prague, 24 - 28 septembre 2006

Gomri S., JL. Seguin, R. Delamare, K. Aguir.- Noise spectroscopy for enhancing the selectivity of metallic oxide gas sensors: models and experimental methods.- Eurosensors XX, - Goteborg, Sweden, September 17-20, 2006

Hÿtch M., J.L. Putaux, J. Thibault.- Stress and strain around GB dislocation measured by HREM.- Proceedings of ICEM 16, p 1391, 2006

Juennard N., Borloz B., Xerri B.- Detection by the stochastic classification matched filter.- Proceedings of 5th WSEAS Conference on Signal Processing, Robotics, and Automation, ISPRA06, Madrid (Spain), p. 341-344, 2006

Jung H., Mangelinck-Noël N., Nguyen-Thi H., Billia B.- Columnar to equiaxed transition in directional solidification processing of aluminium alloys.- in "Modeling of Casting, Welding and Advanced Solidification Processes XI", Ch-A.Gandin, M. Bellet Eds (TMS - The Minerals, Metals & Materials Society, Warrendale, USA, 2006), p. 399, 2006

Labidi A., C. Lambert-Mauriat, M. Gillet, M. Maaref, K. Aguir.- Au and Pd effect on WO3-based sensors towards ethanol and ozone. - Eurosensors XX, - Goteborg, Sweden, September 17-20, 2006

Lancin M., Regula G., Douin J., Idrissi H., Ottaviani L., Pichaud B.- Investigation of mechanical stress-induced double stacking faults in (11-20) highly n-doped 4H-SiC combining optical microscopy TEM contrast simulation and dislocation core reconstruction.- Mat. Sci. Forum, vol. 527-529, p. 379-82, 2006

Loussier X., Munteanu D., Autran J.L., Harrison S., Cerutti R.- Compact model of drain-current in Double-Gate MOSFETs including carrier quantization and short-channel effects.Proceedings of 9^th International NSTI Nanotech Conference (Nanotech'2006) – Workshop on Compact Modeling (WCM 2006), Technical proceedings ed. by Computational Publications, p. 808-811, 2006

Loussier X., Munteanu D., Autran J.L., Tintori O.- Impact of device architecture on speed performances and power consumption in Double-Gate-based circuits.- Proceedings of 7^th European workshop on Ultimate Integration of Silicon (ULIS 2006).- p. 173-176, 2006

Mallet J., Courmontagne Ph.- A New Wavelet Thresholding Approach for SAS Images De-noising.- Proceedings of OCEANS’06, Vol. 1-4, pp. 806-811, 2006 - DOI: 10.1109/OCEANS.2006.306816

Muller Ch., Courtade L., Turquat Ch., Goux L., Wouters D.J.- Reliability of three-dimensional ferroelectric capacitor memory-like arrays simultaneously submitted to x-rays and electrical stresses.- Proceedings of 7^th IEEE Non-Volatile Memory Technology Symposium (NVMTS 2006), San Mateo, USA, November 5-8, 2006, p. 40-44 - http://dx.doi.org/10.1109/NVMT.2006.378873

Munteanu D., Autran J.L., Castellani K., Ferlet-Cavrois V., Paillet P., Baggio J.- 3D Quantum Numerical Simulation of Single-Event Transients in Multiple-Gate Nanowire MOSFETs.- IEEE Proceedings of 9^th European Workshop on Radiation and its Effects on Components and Systems, RADECS, p. -, 2006

Ngo K. A., Lauque P., Aguir K.- Qualitative and quantitative analysis of toxic gases using a metal oxide sensor array.- IEEE Sensors 2006, - Daegu, Corée, Oct. 22-25 2006

Portavoce A., Berbezier I., Ronda A., Gas P, Christensen J.S., Kuznetsov A.Y., Svensson B.G. - Dopant diffusion in Si1-xGex thin films: Effect of epitaxial stress.- Diffusion in Solids – Past, present and future, 249, 135, 2006

Puget S., Bossu G., Regnier A., Ranica R., Villaret A., Masson P., Ghibaudo G., Mazoyer P., Skotnicki T.- Quantum effects influence on thin silicon film capacitor-less DRAM performance.- Proceedings of IEEE International SOI Conference, Niagara Falls, Canada, October 2-5, 2006, p. 157-158 - http://dx.doi.org/10.1109/SOI.2006.284485

Regnier A., Portal J-M., Aziza H., Masson P., Bouchakour R., Relliaud C., Née D., Mirabel J-M.- EEPROM Compact Model with SILC Simulation Capability.- Proceedings of 7^th IEEE Non-Volatile Memory Technology Symposium (NVMTS 2006), San Mateo, USA, November 5-8, 2006, p. 26-30 - http://dx.doi.org/10.1109/NVMT.2006.378870

Regula G., Raissi M., Lazzari J.-L., Chevrier F., Burle N., Ntsoenzok E.- Rare gas ion implanted-silicon template for the growth of relaxed Si1-xGex /Si (100).- AIP proceeding, IIT2006 11-16 06 2006, - Palais du Pharo, Marseille, 2006

Reinhart G., Nguyen-Thi H., Mangelinck-Noël N., Schenk T., Billia B., Gastaldi J., Härtwig J., Baruchel J. - In situ observation of transition from columnar to equiaxed growth in Al-3.5 wt% Ni alloys by synchrotron radiography.- in "Modeling of Casting, Welding and Advanced Solidification Processes XI", Ch-A.Gandin, M. Bellet Eds (TMS - The Minerals, Metals & Materials Society, Warrendale, USA 2006) - p. 359-366 , 2006

Robert-Inacio F.- Circularity parameter extended to discrete distances.- Proceedings of the 6th International Conference on Stereology, Spatial Statistics and Stochastic Geometry, Prague, Czech Republic, p. 509-516, June 26-29, 2006

Robert-Inacio F., Caudal F., Rousset C.- Biometrics for human face recognition in 3D.- 40th IEEE Asilomar Conference on Signals, Systems and Computers, Pacific Grove CA, USA, Oct 29 – Nov 1, 2006

Robert-Inacio F., Dinet E.- An adaptive median filter for colour image processing.- Proceedings of the 3^rd IS&T International Conference on Colour in Graphics, Imaging and Vision, Leeds, United Kingdom, p. 205-210, June 19-22, 2006

Robert-Inacio F., Patrone L.- Characterization of small molecular islands of carbon chains self-assembled on silicon.- 3rd IASTED International Conference on Signal Processing, Pattern Recognition, and Applications (SPPRA 2006), Innsbruck, Austria, 15-17 february 2006, p. 304-309

Saillet B., Regnier A., Portal J-M., Delsuc B., Laffont R., Masson P., Bouchakour R.- MM11 based flash memory cell model including characterization procedure.- Proceedings of IEEE International Symposium on Circuits and Systems (ISCAS 2006), Island of Kos, Greece, May 21-24, 2006, p. 3518-3521 - http://dx.doi.org/10.1109/ISCAS.2006.1693385

Sati P., Morhain C., Regnier S., and Stepanov A.- EPR and magnetic properties of ZnO:Co thin films grown by MBE.- The 4-th International Workshop on ZnO and Related Materials. - University of Guissen, Germany, 3-6 octobre 2006

Sati P., Morhain C., Schäfer S., and Stepanov A.- Antiferromagnetic correlations in single crystalline Zn1-xCoxO thin films.- GDR-SESAM, - Fréjus, France, 3- 4 avril, 2006

Sgarlata A., Balzarotti A., Berbezier I., Szkutnik P.D., Rosei F., Motta N.- Towards nanomemories : Ge growth on naturally and artificially nanostructured Si surfaces.- Proceedings ICONN, 514, 2006

Simola R., Mangelinck D., Portavoce A., Bernardini J., Fornara P.- Boron redistribution during crystallization of phosphorus-doped amorphous silicon.- American Institute of Physics Conference Proceedings, vol. 866, p. 125-128, 2006

Tintori O., Munteanu D., Loussier X., Autran J.L., Regnier A., Bouchakour R.- Compact modeling and performance analysis of Double-Gate MOSFET-based circuits.- Proceedings of 9^th International NSTI Nanotech Conference (Nanotech'2006) – Workshop on Compact Modeling (WCM 2006), Technical proceedings ed. by Computational Publications, p. 812-815, 2006

Tintori O., Munteanu D., Loussier X., Autran J.L., Regnier A., Bouchakour R.- Compact modeling and performance analysis of Double-Gate MOSFET-based circuits.- Proceedings of 7th European workshop on Ultimate Integration of Silicon (ULIS 2006), p. 153-156, 2006

Vervisch V., Barakel D., Torregrosa F., Ottaviani L., Pasquinelli M.- Plasma Immersion Ion Implantation applied to p+n junction solar cells.- IIT'06 - 16th conference on Ion Implantation Technology, Marseille (France), - pp.253-256, 2006

Yu P.Y., Gardner G., Nozaki S., Berbezier I.- Light scattering Spectroscopies of Semiconductor Nanocrystals (Quantum Dots).- Journal of Physics : Conference Series, 28, 1, 2006

Zaïdat K., Mangelinck-Noël N., Moreau R. - Control of the solidification of Al-Ni alloys using a travelling magnetic field: macrosegregation.- in "Modeling of Casting. Welding and Advanced Solidification Processes - XI". Ch-A. Gandin, M. Bellet Eds (TMS - The Minerals, Metals & Materials Society, Warrendale, USA, 2006) - p. 341, 2006

2007

Alexandre L., G. Jurczak, C. Alfonso, W. Saikaly, A. Charai, J. Thibault.- CBED and FE study of thin foil relaxation in cross section samples of Si/SiGe and Si/SiGe/Si heterostructures.- Microscopy of Semiconducting Materials 2007, Proc. of the 22nd Congress on Microscopy of Semiconducting Materials, Cambridge, UK, p 415-418, 2-5 April 2007 - http://dx.doi.org/10.1007/978-1-4020-8615-1

Autran J.-L., Roche P., Gasiot G., Munteanu D., Parrassin T., Borel J., Schoellkopf J.P. - Real-time soft-error rate testing of semiconductor memories on the european test platform ASTEP. - Proceedings of the 2nd International Conference on Memory Technology and Design (ICMTD 2007), - Giens, France, p. 161-164, 7-10 mai 2007

Aziza H., Bergeret E., Pérez A.- An automated design methodology for charge pump circuits.- Proceedings of 14^th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2007), Marrakech, Morocco, December 11-14, 2007, p. 214-217 - http://dx.doi.org/10.1109/ICECS.2007.4510968

Aziza H., Bergeret E., Pérez A., Portal JM.- An efficient Model to evaluate the impact of design parameters on Charge Pump circuits’ performances: Application to RFID circuits.- Proceedings of the International Conference on Design & Technology of Integrated Systems (DTIS 2007), Rabat, Marocco, sept.2-5 2007, p.108-113 - DOI:10.1109/ICECS.2007.4449502

Aziza H., Bergeret E., Pérez A., Portal J-M.- An efficient charge pump model to evaluate impact of design parameters on charge pump circuits performances: application on RFID circuits.- Proceedings of IEEE International Conference on Design and Test of Integrated Systems in Nanoscale Era (DTIS 2007), Rabat, Morocco, September 2-5, 2007, p. 108-113 - http://dx.doi.org/10.1109/DTIS.2007.4449502

Aziza H., Portal J.M., Née D., Reliaud C., Argoud F.- Peripheral circuitry impact on EEPROM threshold voltage.- IEEE Proceedings of Non-Volatile Memory Technology Symposium, Albuquerque, November 10-13 2007, p. 20-24, 2007

Barral V., Poiroux T., Andrieu F., Buj-Dufournet C., Faynot O., Ernst T., Brevard L., Fenouillet-Beranger C., Lafond D., Hartmann J.M., Vidal V., Allain F., Daval N., Cayrefourcq I., Tosti L., Munteanu D., Autran J.L. and Deleonibus S. - Strained FDSOI CMOS technology scalability down to 2.5nm film thickness and 18nm gate length with a TiN/HfO2 gate stack.- Proceedings of the IEEE International Electron Device Meeting (IEDM 2007), - p. 61-64, 2007

Barral V., Poiroux T., Rochette F., Vinet M., Barraud S., Faynot O., Tosti L., Andrieu F., Cassé M., Prévitali B., Ritzenthaler R., Grosgeorges P., Bernard E., LeCarval G., Munteanu D., Autran J.L. and Deleonibus S. - Will strain be useful for 10nm quasi-ballistic FDSOI devices? An experimental study.- Proceedings of the IEEE VLSI Symposium, Kyoto, Japan, - p.xxx, June 2007

Barthélemy H., Bourdel S., Dehaese N., Bas G.- Gm-C low-pass-filter designed for a Zero-IF base-band demodulator.- Proceedings of IEEE International Symposium on Industrial Electronics (ISIE2007), - pp 2295-2300, June 2007

Batail E., Monfray S., Rideau D., Szczap M., Tabone C., Hartmann J.-M., Borel S., Damlencourt J.-F., Clavelier L., Bescond M., Ghibaudo G., Skotnicki T. - Germanium-On-Nothing (GeON): an innovative technology for ultrathin Ge film integration.- Proceedings of the 37th European Solid-State Device Research Conference (ESSDERC), Munich (Germany), - p.450-453, 10-14 Septembre 2007

Benoudia M.C., Roussel J.M., Labat S., Thomas O., Beke D.L., Langer G., Kis-Varga M.- Investigating interdiffusion in Mo/V multilayers from x-ray scattering and kinetic simulations.- Defect and Diffusion Data, vol. 264 13, 2007

Bergeret E., Gaubert J., Pannier Ph.- Standard CMOS voltage multipliers architectures for UHF RFID applications: study and implementation.- IEEE International Conference on RFID 2007 Grapevine Texas, USA, March 27-28, 2007

Bernardini S., O. Buiu, M. MacKenzie, P. Bailey, T.C.Q. Noakes, W.M. Davey, B. Hamilton, S. Hall.- Chemical and optical profiling of ultra thin kigh k dielectrics on silicon. - 5th International Conference on Silicon Epitaxy and Heterostructures, - Marseille 2007

Bonneton F. et Jauffret C.- Bearing Line Tracking and Bearing-Only Target Motion Analysis.- IEEE Aerospace Conference, Big Sky, Montana, USA, Mars 2007

Bouffaron R., Escoubas L., Simon J-J., Torchio Ph., Berginc G., Masclet Ph.- Modeling of Micro-Structured Surfaces for Antireflecting Properties in the Infrared Domain. - Proceedings de la conference ACES (Applied Computational Electromagnetic Society), Vérone Italie, 2007

Bourdel S., Gaubert J., Battista M., Bachelet Y., Bas G.- CMOS UWB transceiver for Impulse Radio 2007. IEEE International Conference on Ultra-Wideband, ICUWB 2007, - IEEE International Conference on Ultra-Wideband, ICUWB 2007, Singapore, September 24-26, 2007

Brown A.R., Martinez A., Bescond M., Asenov A.- Nanowire MOSFET variability: a 3D density gradient versus NEGF approach.- Proceedings of the Silicon Nanoelectronics Workshop (SNW), Kyoto (Japan), - p. 127, 10-11 Juin 2007

Buran C., Pala M.G., Bescond M., Mouis M.- Surface roughness mobility in Si-nanowires from quantum magnetoresistance simulations.- Proceeding of the 12th International Workshop on Computational Electronics (IWCE12), University of Massachussets, Amherst (USA), - p.154-155, October 8-10 2007

Chmielowski R., V. Madigou, M. Blicharski, Ch. Leroux.- Electron microscopy characterization of bilayers Bi3.25La0.75Bi3O12 /Sr4Ru2O9 . - Autumn School on Materials Sciences and Electron Microscopy, - Berlin, october 2007

Collard Bovy A., Courmontagne Ph., Chalopin H. - A ground reflection theory for UWB transmission in the case of CEPT band limited spectrum.- Electronic Proceedings of IEEE-PRIME 2007, p. 261-264, 2007 - DOI: 10.1109/RME.2007.4401862

Courmontagne Ph.- SAS Images De-noising: The Jointly Use of an Autoadaptive Mean Filter and the Stochastic Matched Filter.- Proceedings of OCEANS’07, Vol. 1-3, pp. 594-599, 2007 - DOI: 10.1109/OCEANSE.2007.4302299

Courmontagne Ph.- A review on Stochastic Matched Filter based denoising methods for SAS images despeckling.- Proceedings of OCEANS’07, Vol. 1-3, pp. 653-658, 2007 - DOI: 10.1109/OCEANSE.2007.4302311

Courmontagne Ph., Vergnes N., Jauffret C. - An optimal subspace projection for signal detection in noisy environment.- Proceedings of OCEANS’07, Vol. 1-5, pp. 2000-2005, 2007 - DOI: 10.1109/OCEANS.2007.4449416

Courtade L., Turquat Ch., Muller Ch., Lisoni J.G., Goux L., Wouters D.J., Goguenheim D.- Improvement of resistance switching characteristics in NiO films obtained from controlled Ni oxidation.- IEEE Proceedings of Non-Volatile Memory Technology Symposium, Albuquerque, November 10-13 2007, p. 1-4, 2007

Cubillo J.R., Gaubert J., Bourdel S., Barthélemy H., Battista M., Egels M.- Ultra Wide Band Band Pass filter embedding a MLF low cost package with wire bound attach process.- 14th IEEE International Conference on Electronics, Circuits and Systems, Marrakech, Morocco, December 11-14, 2007

Cubillo J.R., Gaubert J., Bourdel S., Barthélemy H.- Simulation study of characterization test plan for a PCB to DIE transition in a fcCBGA application.- 14th IEEE International Conference on Electronics, Circuits and Systems, Marrakech, Morocco, December 11-14, 2007.

Deleruyelle D., Guiraud A., Micolau G.- Study of electronic properties of nanocrystals from different point of view: from a simple 2D electrostatic approach to 3D Poisson Schrödinger simulations.- Proceedings of European COMSOL Conference, vol. 2, p. 636-641, 2007 - http://www.comsol.com/papers/2889/

Dinet E., Robert-Inacio F.- Color Median Filtering: a Spatially Adaptive Filter.- Proceedings of IVCNZ07, Hamilton, New Zealand, pp 71-76, 5-7 décembre., 2007

Dubois S., Palais O., Pasquinelli M., Dugas J., Martinuzzi S., Ribeyron P. J.- Dissolved Chromium in Crystalline Silicon - Detection and Impact on Solar Cell Performances. - EPSECE 22nd -European Photovoltaic Solar Energy Conference and Exhibition, pxxx, september 2007

Dumont M., Coulet V., Regula G., Bley F.- Characterization of nanocavities in silicon using small angle X-ray scattering.- Mater. Res. Soc. Symposium, MRS Spring Meeting 2007, San Francisco, Etats Unis, 9-13 Avril 2007, vol. 994, p. 119-124, 2007

Efthymiou E., S. Bernardini, B. Hamilton, J.F. Zhang, S.N. Volkos and A.R. Peaker.- Degradation of ultra thin SiO2 and HfSixOy/SiO2 gate stacks by remote hydrogen and deuterium plasma treatment.- 5th International Conference on Silicon Epitaxy and Heterostructures, Marseille 2007

Fanei A., Pannier Ph., Gaubert J., Battista M., Bachelet Y.- Experimental results and EM simulation of substrate noise in wideband low noise amplifier for UWB systems.- 2007 International Conference on Design & Technology of Integrated Systems, 2-5, Rabat, Morocco, September 2007.

Fanei A., Pannier Ph., Gaubert J., Battista M., Bachelet Y., Barthélemy H.- Substrate noise EM simulation of LC-matched ultra-wideband low noise amplifier.- 2007 IEEE Conference on Electron Devices and Solid-State Circuits, Taiwan, December 20-22, 2007

Fiorido T., M. Bendahan, K. Aguir, C. Martini, H. Brisset, C. Videlot-Ackermann, J. Ackermann, F. Fagès, M. Barret, S. Sanaur.- Realization of new photosensitive sensors based on Ds2T thin films; - Organic Electronics Conference (OEC), Frankfurt, Germany, 24th to 26th september 2007

Flory F., Escoubas L., Simon J.J., Torchio Ph., Mazingues T, and Mangeat T.- Refractive Index of Micro/Nano Structured Dielectric Materials.- SPIE Proceedings of the Eighth Conference on Optics, ROM OPTO'2006 (ROM), - Vol. 6785, pp. 67851R-1, 2007

Frioui O., Haddad F., Zaïd L., Rahajandraibe W.- A Low Phase Noise CMOS Quadrature VCO for 2.4 GHz Bluetooth/WLAN.- Applications IEEE DTIS 2007, Rabat, Morocco, 2- 5 September 2007

Frioui O., Haddad F., Zaïd L., Rahajandraibe W.- A Very Low Phase Noise Fully Integrated CMOS Quadrature LC Oscillator for 2.4 GHz .Bluetooth/WLAN Applications - Proceedings of the IEEE ISCIT 2007, Sydney, Australia, 16-19 October 2007

Gaubert J., Pannier Ph., Bourdel S, Egels M.- A 52 GHz, 8.5 dB Traveling Wave Amplifier in 0.13 µm standard CMOS process. - 2007 IEEE RFIC Symposium, Honolulu, Hawaii, 3-5 June, 2007

Goguenheim D., Pic D., Ogier J.L.- Oxide reliability below 3nm for advanced CMOS : issues, characterization, and solutions.- Proceedings of the 18th European Symposium Reliability on Electron Devices, Failure Physics and Analysis (ESREF) Conference, Arcachon, p. 1322-1329, October 2007

Gouya G., Malinge P., Garni B., Genevaux F., Ferrant R., Puget S., Gravoulet V., Bonnaud O.- 1T-capacitorless bulk memory: scalability and signal impact.- IEEE Proceedings of European Solid State Device Research Conference, - p. 330-333, 2007 - http://dx.doi.org/10.1109/ESSDERC.2007.4430945

Guerin C., Huard V., Bravaix A.- Hot-carrier damage from high to low voltage using the energy-driven framework.- Proceedings of the 15th Insulated Films on Silicon (INFOS), - vol. 47, Issue 9-11, p.xxx , 2007

Guérin C., Huard V., Bravaix A.- The energy driven hot-carrier degradation modes.- Proceedings of the IEEE International Reliability Physics Symposium (IRPS), Phoenix, Arizona, USA, 15-19 avril 2007, p. 692-693, 2007

Guerin C., Parthasarathy C., Huard V., Bravaix A.- New hot carrier lifetime technique from high to low voltage operation.- Proceedings of the 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Bangalore, Inde, 11-13 juillet 2007, p. 173-179, 2007

Haddad F., Bouchakour R., Rahajandraibe W., Zaid L., Frioui O.- Radio frequency passive polyphase filter design for wireless communications.- IEEE Proceedings of International Symposium on Communications and Information Technologies, Sydney, Australia, vol. 1-3, p. 264-268, 2007 - http://dx.doi.org/10.1109/ISCIT.2007.4392027

Haddad F., Bouchakour R., Rahajandraibe W., Zaid L., Frioui O.- Radio frequency passive polyphase filter design for wireless communications.- IEEE International Workshop on Radio-Frequency Integration Technology, p. 175-178, 2007

Haddad F., Bouchakour R., Rahajandraibe W., Zaid L., Frioui O.- Radio frequency polyphase filter design in 0.13 µm m CMOS for wireless communications.- IEEE Proceedings of International Conference on Electronics, Circuits and Systems, - vol. 1-4, p. 833-836, 2007

Haddad F., Frioui O., Rahajandraibe W., Zaid L., Bouchakour R.- Design of radio frequency polyphase filter and its application in low-IF receivers for large image rejection.- Proceedings of IEEE International Conference on Design and Test of Integrated Systems in Nanoscale Era (DTIS 2007), Rabat, Morocco, September 2-5, 2007, p. 142-147

Ille A., Stadler W., Gossner H., Brodbeck T., Pompl T., Bravaix A.- Thin gate oxides time-to-breakdown in the ESD time domain and the consequences for applications. - Proceedings of the IEEE International ESD Workshop, - p. 176-186, 2007

Ille A., Stadler W., Kerber A., Pompl T., Brodbeck T., Esmark K., and Bravaix A.- Ultra-thin gate oxide reliability in the ESD time domain.- Proceedings of the IEEE International EOS/ESD symposium, - p. 123-132, 2007

Ille A., Stadler W., Pompl T., Gossner H., Brodbeck T., Esmark K., Riess P., Alvarez D., Chatty K., Gauthier R., Bravaix A.- Reliability aspects of gate oxide under ESD pulse stress.- Proceedings of the IEEE International EOS/ESD symposium, - Anaheim, Californie, USA, 17 septembre 2007

Jung H., Mangelinck-Noel N., Nguyen-Thi H., Billia B., Sturz L., Zimmermann G. - Columnar to equiaxed transition in nonrefined Al-based alloys during directional solidification in microgravity and on earth.- in "Solidification Processing SP07", 5th Decennial Int. Conf. on Solidification Processing - SP07, H. Jones Ed. (University of Sheffield, 2007) - p. 186 , 2007

Lachenal D., Bravaix A., Monsieur F., Rey-Tauriac Y.- Degradation mechanism understanding of NLDEMOS SOI in RF applications.- Proceedings of the 18th European Symposium Reliability on Electron Devices, Failure Physics and Analysis (ESREF) Conference, Arcachon, France, - p.1634-1638, 2007

Lachenal D., Monsieur F., Rey-Tauriac Y., Bravaix A.- HCI degradation model based on the diffusion equation including the MVHR model.- Proceedings of the 15th Insulated Films on Silicon (INFOS), Glyfada Athène, Grèce, 20-23 juin 2007, vol. 47, Issue 9-11, p. 1634-1638, 2007

Lancin M., Regula G., Douin J., Idrissi H., Ottaviani L., Pichaud B.- Investigation of Mechanical Stress-Induced Double Stacking Faults in (11-20) Highly N-doped 4H-SiC combining Optical Microscopy, TEM, Contrast Simulation and Dislocation Core Reconstruction. - Materials Science Forum. ECSCRM'06 - European Conference on Silicon Carbide and Related Materials, Newcastle (Royaume-Uni), 3 - 7 Septembre 06.- Vols 527-529 pp.379-382, 2007

Le Roux C., Lopez L., Firiti A., Ogier J-L., Lalande F., Laffont R., Micolau G.- An experimental method allowing quantifying and localizing failed cells of an EEPROM CAST after a retention test.- Proceedings of IEEE International Semiconductor Device Research Symposium, College Park, USA, December 12-14, 2007, p. 252-253 - http://dx.doi.org/10.1109/ISDRS.2007.4422357

Lesea A., Castellani K., Waysand G., Le Mauff J., Sudre C.- Qualification Methodology of Sub-Micron ICs in the Low Noise Underground Laboratory of Rustrel.- Proceedings of 9^th IEEE Radiation and its Effects on Components and Systems (RADECS 2007) - Deauville, France, September 10-14, 2007, p. 350-355 - http://dx.doi.org/10.1109/RADECS.2007.5205485

Lesea A., Castellani-Coulié K.- Experimental Study and Analysis of Soft Errors in 90nm Xilinx FPGA and Beyond.- Proceedings of 9^th IEEE Radiation and its Effects on Components and Systems (RADECS 2007), Deauville, France, September 10-14, 2007, p. 641-645 - http://dx.doi.org/10.1109/RADECS.2007.5205556

Mangelinck-Noel N., Nguyen-Thi H., Reinhart G., Jung H., Billia B., Buffet A., Schenk T., Gastaldi J., Hartwig J., Baruchel J. - Dynamics of Al-based alloy solidification by in situ and in real-time Synchrotron X-ray Radiography and Topography.- in "Solidification Processing SP07", H. Jones Ed. (University of Sheffield, 2007) - p. 331, 2007

Martinuzzi S., Perichaud I., Palais O., Barakel D., Gauthier M.- Electrical and photovoltaic properties through a large multicrystalline Si ingot.- Conference on Photovoltaic Cell and Module Technologies, SPIE Proc., - Vol. 6651, p.G6510-G6510, 2007

Mazingue T., Kribich R., Jabbour J., Gatti S., Escoubas L., Mihailescu I., Etienne P., Moreau Y., and Flory F.- Chemical sensors based on optical sensitivity of metal oxide materials deposited on multimode interference couplers. - Proc. SPIE, 6785, 67850G, 2007

Munteanu D., Autran J.L., Loussier X., Tintori O. - Compact modeling of drain current in independently driven double-gate MOSFETs.- Proceedings of the 10th International NSTI Nanotech Conference (Nanotech'2007) - Workshop on Compact Modeling (WCM 2007), Santa Clara, California, USA, - p. 574-577, 20-24 mai 2007

Nowakowski P., Villain S., Gavarri J. R., Kopia A., Kusinski J.- Simulated catalytic properties of CeO2 and RuO2 nanostructured dioxides under air-CH4 gas flow.- AMT 2007, Advanced Materials & Technologies, XVIII Physical Metallurgy and Materials Science conference, Warsaw, Poland, 18-21 june 2007

Ottaviani L., Barakel D., Yakimov E., Pasquinelli M.- Electrical Characterisation of 4H-SiC Epitaxial Samples Treated by Hydrogen or Helium.- ECSCRM'06 - European Conference on Silicon Carbide and Related Materials, Newcastle (Royaume-Uni), 3 - 7 Septembre 06, Materials Science Forum, Vols 556-557 pp.347-350, 2007

Parthasarathy C.R., Bravaix A., Guérin C., Denais M., Huard V.- Design-in reliability for 90-65nm CMOS nodes submitted to hot-carriers and NBTI degradation.- Proceedings of the 17th Power and Timing Modeling Optimization and Simulation (PATMOS) Conference, Gothenburg Suède, 03-05 septembre 2007, vol. 4644, p. 191-200, 2007

Parthasarathy C.R., Guérin C., Huard V., Bravaix A.- Unified perspectives of NBTI and hot-carrier degradation in CMOS using on-the-fly bias patterns.- Proceedings of the IEEE International Reliability Physics Symposium (IRPS), Phoenix, Arizona, USA, 15-19 avril 2007, p. 696-697, 2007

Pérez A., Charbouillot S., Huynh Van Thieng C., Fronte D.- Application de la Physique Statistique à la cryptographie.- Actes du Congrès général de la Société Française de Physique (SFP 2007), Grenoble, France, p.438, Jul. 9-13 2007

Pic D., Ogier J.L., Goguenheim D.- A comprehensive study of stress induced leakage current using a floating gate structure for direct applications in EEPROM memories".- Proceedings of the 18th European Symposium Reliability on Electron Devices, Failure Physics and Analysis (ESREF) Conference, Arcachon, p.1373-1377, October 2007

Portavoce A., Simola R., Mangelinck D., Bernardini J., Fornara P.- Dopant diffusion during amorphous silicon crystallization.- Diffusion and Defect Data, vol. 264, p. 33-, 2007

Puget S., Bossu G., Guerin C., Ranica R., Villaret A., Mason P., Portal J.M., Bouchakour R., Mazoyer P., Huard V., Skotnicki T.- 1TBulk eDRAM a reliable concept for nanometre scale high density and low power applications.- IEEE Proceedings of International Conference on Memory Technology and Design, - Giens, France, May 22-24, 2007, p. 155-158

Rafhay Q., Clerc R., Bescond M., Ferrier M., Ghibaudo G.- Further investigations of the impact of channel orientation on ballistic current of nDGFETs with alternative channel materials.- Proceedings of the 8th International Conference on Ultimate Integration of Silicon (ULIS 2007), Leuven (Belgique), - p.51-54, 15-16 March 2007

Raguet J.R., Bidal V., Regnier A., Mirabel J.M., Laffont R., Bouchakour R.- New EEPROM concept for single bit operation.- IEEE Proceedings of International Semiconductor Device Research Symposium, - College Park, USA, December 12-14, 2007, p. 104-105

Rahajandraibe W., Zaïd L., Cheynet de Beaupré V., Bas G.- 2.4-GHz Frequency Synthesizer with Open Loop FSK Modulator for WPAN Applications.- Proceedings of the IEEE MWSCAS/NEWCAS 2007, Montréal, 5- 8 August 2007, - pp. 1453-1456, 2007

Rahajandraibe W., Zaïd L., Cheynet de Beaupré V., Bas G. - Temperature Compensated 2.45 GHz Ring Oscillator with Double Frequency Control.- Proceedings of the IEEE Radio Frequency Integrated Circuits Symposium (RFIC'07), Honolulu, Hawaii, 3-8 June 2007, pp. 409 - 412, 2007

Rahajandraibe W., Zaïd L., Cheynet de Beaupré V., Roche J. - Low-Gain-Wide-Range 2.4-GHz Phase Locked Loop.- Proceedings of IEEE ICECS 2007, Marrakech, Morocco, 11-14 December, 2007 - pp. 26-29, 2007

Rahajandraibe W., Zaïd Z., Cheynet de Beaupré V., Bas G.- Frequency Synthesizer and FSK Modulator for IEEE 802.15.4 Based Applications.- Proceedings of the IEEE Radio Frequency Integrated Circuits Symposium (RFIC'07), Honolulu, Hawaii, 3-8 June 2007, - pp. 229 - 232, 2007

Rigaud F., Portal J-M., Aziza H., Nee D., Vast J., Auricchio C., Borot B.- Test structure for process and product evaluation.- Proceedings of IEEE International Conference on Microelectronic Test Structures (ICMTS 2007), Tokyo, Japan, March 19-22, 2007, p. 140-144 - http://dx.doi.org/10.1109/ICMTS.2007.374471

Robert-Inacio F.- A Relation between a Similarity Parameter, the Asplund Distance and Discrete Distance Maps.- Proceedings of IVCNZ07, Hamilton, New Zealand, pp 254-259,, 5-7 décembre., 2007

Robert-Inacio F.- Automatic control and correction of milling defaults for printed circuits by colour image analysis.- Proceedings of the XII International Congress for Stereology, Saint-Etienne, France, 3-7 Sept., 2007

Robert-Inacio F.- Shape parameters estimating the symmetry with respect to a point.- Proceedings of the 8^th International Symposium on Mathematical Morphology, Vol. 2, Rio de Janeiro, Brazil, 10-13 oct., 2007

Robert-Inacio F., Raybaud A., Clément E.- Multispectral Target Detection and Tracking for Seaport Video Surveillance.- Proceedings of IVCNZ07, Hamilton, New Zealand, pp 169-174, 5-7, décembre., 2007

Rogdakis K., Bescond M., Bano E., Zekentes K.- Theoretical comparison of 3C-SiC and Si nanowire FETs in ballistic regime.- Proceedings of the International Conf. on SiC and Related Materials (ICSCRM'07), Otsu (Japon), October 14-19, p.xxx, 2007

Santori A., Barrere J., Chabriel G., Jauffret C et Medynski D.- Array Shape Self-Calibration for Large Flexible Antenna.- IEEE Aerospace Conference, Big Sky, Montana, USA, Mars 2007 - Doi : 10.1109/AERO.2007.353067

Santori A., Barrere J., Chabriel G., Jauffret C, Medynski D.- A modulus Compensation Algorithm for Shape Self-Calibration of Paired Sensors Based Antennas.- IEEE Aerospace Conference, Big Sky, Montana, USA, Mars 2007 - Doi : 10.1109/AERO.2007.353069

Turquat Ch., Demolliens A., Merlen A., Valmalette J-Ch., Muller Ch., Müller R., Goux L., Wouters D.J.- Microstructure and switching characteristics of CuTCNQ nanowires developed for high-density memory devices.- Proceedings of 8^th IEEE Non-Volatile Memory Technology Symposium (NVMTS 2007), Albuquerque, USA, November 10-13, 2007, p. 45-48

Waysand G., Barroy P., Blancon R., Gaffet S., Guilpin C., Marfaing J., Pozzo Di Borgo E., Pyee M., Auguste M., Boyer D., Cavaillou A.- Détection de réponses sismo-ionosphériques par SQUID souterrain en environnement Bas Bruit au LSBB Rustrel-Pays d'Apt,.- Proceedings 4ème Colloque Interdisciplinaire en Instrumentation C2I 2007(Editions Hermès Scinece- Lavoisier), Nancy Octobre 2007, p.351-357

Zaid L., Haddad F., Frioui O., Roche J., Rahajandraibe W., Bouchakour R., Sangiovanni A.- A differential 3.3V BICMOS buffer with current consumption and linearity control for RF mixer.- Proceedings of IEEE International Conference on Microelectronics, Cairo, Egypt, December 29-31, 2007, p. 37-40

Zarbout K., Si Ahmed A., Moya G., Damamme G., Bernardini J., Kallel A.- Method for characterizing charges spreading in sintered alumina by secondary electron emission : effect of microstructure and temperature.- Proceedings of the International Conference on Electrical Insulation and Dielectric Phenomena, (CEIDP 2007), Vancouver, October 14-17, 2007. Ed by IEEE Annual Report, Catalog n° 07CH37929, ISBN 1-4244-1482-2, Piscataway (NJ), USA, - p.457-460, 2007

2008

Aziza H., Bergeret E., Pérez A.- A novel Design Methodology for Current Reference Circuits.- IEEE Proceedings of International Conference on Electronics, Circuits and Systems, Malte, Malta Republic, Aug.31-Sept.3 2008, p.238-241 - DOI:10.1109/ICECS.2008.4674835

Ajroudi L., A. Essoumhi, S.Villain, V.Madigou, N.Mliki, and Ch. Leroux.- CoxFe3-xO4 catalytic materials for gaz sensors - European Microscopy Congress, EMC2008, Aachen, Germany, september 2008, vol. 2, p. 233-234

Alfonso C., Alexandre L., Jurczak G., Ch. Leroux, Saikaly W., Charaï A., Thibault J.- HOLZ lines splitting on relaxed samples: an analytical approach.- Proceedings of the European Microscopy Congress, EMC2008, Aachen, Germany, vol. p, 2008

Autran J.L., Roche P., Sauze S., Gasiot G., Munteanu D., Loaiza P., Zampaolo M. et Borel J. - Real-time neutron and alpha soft-error rate testing of CMOS 130nm SRAM: altitude versus underground measurements.- Proceedings of the IEEE International Conference on Integrated Circuit Design and Technology (ICICDT), Grenoble, - p. 233-236, 2-4 Juin 2008

Autran J.L., Roche P., Sauze S., Gasiot G., Munteanu D., Loaiza P., Zampaolo M., Borel J.- Altitude and underground real-time SER characterization of CMOS 65nm SRAM.- Proceedings of the European Workshop on Radiation and its Effects on Components and Systems (RADECS 2008), Jyväskylä, Finlande, p. 519-524, 10-12 septembre, 2008

Ayoub J.-P., Texier M., Regula G., Lancin M., Pichaud B.- Defect generation and characterization in 4H-SiC.- European Microscopy Congress 2008 Proc., Aachen, Germany, 1-5 septembre 2008, ed. Richter S. and Schwedt A., Vol 2, p. 677, 2008

Ayoub J.-P., Texier M., Regula G., Pichaud B., Lancin M.- Links between etching grooves of partial dislocations and their characteristics determined by TEM in 4H SiC.- Materials Research Society Proc., Vol 1069, p. D02-04, 2008

Aziza H., Plantier J, Portal J-M., Ginez O.- A novel Flash EEPROM Diagnosis Methodology based on I-V Signatures Extraction.- Proceedings of 9^th IEEE Annual Non-Volatile Memory Technology Symposium (NVMTS 2008), Pacific Grove CA, USA, November 11-14, 2008, p. 105-110 - http://dx.doi.org/10.1109/NVMT.2008.4731204

Aziza H., Portal J-M., Ginez O., Bergeret E.- An efficient diagnosis methodology for charge pump circuits: Application to flash EEPROM devices.- Proceedings of 3^rd IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS 2008), Tozeur, Tunisia, March 25-27, 2008, p. 3-6 - http://dx.doi.org/10.1109/DTIS.2008.4540242

Barral V., Poiroux T., Barraud S., Bonno O., Andrieu F., Buj-Dufournet C., Brevard L., Lafond D., Faynot O., Munteanu D., Autran J.L. and Deleonibus S. - Electron mean-free-path experimental extraction on ultra-thin and ultra-short strained and unstrained FDSOI n-MOSFETs.- Proceedings of the Silicon Nanoelectronic Workshop (SNW), Hawaii, USA, p.xxx , June 2008

Benard C., Ogier J.L., Goguenheim D.- Advanced On-The-Fly method with correction of initial values to characterize negative bias temperature instability reliability.- Proceedings of the 2008 IEEE International Integrated Reliability Workshop, South Lake Tahoe (USA), 12-16^th October 2008, IEEE IIRW Final report (Catalog Number CFP08IRW-PRT), p. 12-15, 2008

Benard C., Ogier J.L., Goguenheim D.- Total recovery of defects generated by negative bias temperature instability.- Proceedings of the 2008 IEEE International Integrated Reliability Workshop, South Lake Tahoe (USA), - p.xxx, 12-16th 2008

Benard C., Ogier J.L., Goguenheim D. - Defects and relaxation during negative bias temperature instability in PMOSFET.- Proceedings of the 26th International Conference on Microelectronics (MIEL'08), Nis, Serbie-Monténégro, - p. 545-548, 11-14 May 2008

Bergeret E., T. Deleruyelle, Ph. Pannier, J. Gaubert.- UHF RFID Tag Robustness.- XXIX General Assembly of the International Union of Radio Science, URSI08, Chicago, Illinois, USA, August 07-16, 2008

Bouffaron R., Escoubas L., Simon JJ, Torchio Ph., Berginc G., Masclet Ph., Perret C., and Schiavone P.- Design and Fabrication of Infrared Antireflecting Bi-periodic Micro-structured Surfaces.- Proceedings of SPIE Photonics Europe International Symposium, - Vol. 6992, 69920H, 2008

Bourdel S. - Système UWB & Générateur de pulse pour Radio Impulsionelle.- Journée GRD SoC-SiP, Institut Supérieur d'Electronique et du Numérique, Vendredi 19 décembre 2008

Cavallini A., Cavalcoli D., Rossi M., Tomasi A., Pichaud B., Texier M., Le Donne A., Pizzini S., Chrastina D. and Isella G.- Hydrogenated nanocrystalline silicon investigated by conductive atomic force microscopy.- Microscopy of Semiconducting Materials XV proc., ed. A.G. Cullis, P.A. Midgley, Springer proceedings in Physics, Vol 120, p. 301, 2008 - http://dx.doi.org/10.1007/978-1-4020-8615-1_65

Cayzac R., Boulc'h F., Bendahan M., Pasquinelli M. and Knauth P.- Preparation and optical absorption of electrodeposited or sputtered, dense or porous nanocrystalline CuInS2 thin films".- Comptes Rendus de l'Académie des Sciences - Chimie, pxxx, 2008

Collard Bovy A., Chalopin H., Bas G., Courmontagne Ph.- IR-UWB: An high speed digital receiver for very short range transmissions.- Proceedings of Radio and Wireless Symposium, p. 363-366, 2008 - DOI: 10.1109/RWS.2008.4463504

Contaret T., S. Gomri, J-L Seguin and K. Aguir.- Noise spectroscopy measurements in metallic oxide gas microsensors.- The Seventh IEEE Conference on Sensors, IEEE Sensors 2008, Lecce (ITALY), october 26-29, 2008 - http://dx.doi.org/10.1109/ICSENS.2008.4716417

Courmontagne Ph.- A new approach for mine detection in SAS imagery.- Proceedings of OCEANS 2008 – MTS/IEEE Kobe Techno-Ocean, Vol. 1-3, pp. 448-455, 2008 - DOI: 10.1109/OCEANSKOBE.2008.4530974

Courmontagne Ph., Fages G., Beaujean P.-P.- A chirp FSK improvement for communications in shallow water using bandwidth overlapping.- Proceedings of OCEANS 2008 MTS/IEEE, Vol. 1-4, pp. 1090-1096, 2008 - DOI: 10.1109/OCEANS.2008.5151966

Courtade L., Demolliens A., Turquat Ch., Goguenheim D., Ducruet C., Maunoury C., Conraux Y., MacKay K., Prejbeanu I.L., Nozières J-P., Muller Ch.- Reliability of MgO-based tunnel junctions developed for thermally assisted magnetic memories.- Proceedings of the 3rd International Conference on Memory Technology and Design (ICMTD 2008), Opio, France, p.xxx , 18-22 May 2008

Courtade L., Turquat Ch., Lisoni J.G., Goux L., Wouters D.J., Deleruyelle D., Muller Ch.- Integration of resistive switching NiO in small via structures from localized oxidation of nickel metallic layer.- Proceedings of 38^th IEEE European Solid State Device Research Conference (ESSDERC 2008), Edinburgh, Scotland, September 15-19, 2008, p. 218-221 - http://dx.doi.org/10.1109/ESSDERC.2008.4681737

Cubillo J.R, J. Gaubert, S. Bourdel.- Using die to chip carrier wire bond transition to build a 4^th order differential LP filter for 10GBps O/E receiver.- 12th IEEE Workshop On Signal Propagation On Interconnects, May 12-15, 2008, Avignon, France, pp 1-4

Cubillo, J.R.; Gaubert, J.; Bourdel, S.- Optimizing CPW to MSL transition in the mm domain thanks to the LP filter theory.- Electronics System integration Technology Conference, 2008. ESTC 2008. - 1-4 Sept. 2008 Page(s): 531 – 534 - http://dx.doi.org/10.1109/ESTC.2008.4684405

Deleruyelle D., Guiraud A., Bassani F.- Theoretical and experimental investigation of electronic properties of semiconductor quantum-dots for non-volatile memory applications.- Proceedings of Nanoscale VI Conference, Berlin, Germany, 9-11 July 2008, p.146, 2008

Deleruyelle T., P. Pannier, E. Bergeret, S. Bourdel.- Dual Band UHF and Microwave RFID Antenna.- 38th European Microwave Conference, EuMC 2008, pp 1763-1766, Amsterdam, Octobre 2008 - http://dx.doi.org/10.1109/EUMC.2008.4751818

Deleruyelle T., P. Pannier, E. Bergeret, S. Bourdel.- Dual Band UHF and Microwave RFID Antenna.- Europe Conference on Wireless Technology, 2008. EuWiT 2008, - pp 342-345 ; 27,28 Octobre 2008

Deleruyelle T., P. Pannier, S. Bourdel.- Multi-Standard Slot Antenna in 860-960 MHz and2.45 GHz RFID Band.- International Symposium of Antennas and Propagation Society ; AP-S 2008, pp 1 – 4, San-Diego, 5-11 Juilly 2008 - http://dx.doi.org/10.1109/APS.2008.4619588

Duché D., Escoubas L., Simon J.J., Torchio Ph.- Photonic crystals for enhancing the absorption of organic photovoltaic materials.- SPIE Proceedings of the Photonics Europe International Symposium, Vol. 7002, 70020O, 2008

Fanei A., M. Battista, J. Gaubert, S. Bourdel, Ph. Pannier, Y. Bachelet.- Substrate Noise Analysis in a CMOS UWB Digital Receiver.- 2eme colloque du GDR SoC-SiP, 4-6 Juin 2008, Paris

Fillaud M., Barthélemy H. - Design of a Wide Tuning Range VCO Using an Active Inductor.- IEEE NEWCAS & TAISA International Conference, Montreal June 22-25, 2008, pp.13-16 - DOI : 10.1109/NEWCAS.2008.4606309

Fiorido T., M. Bendahan, K. Aguir, M. Barret, S. Sanaur, C. Martini, H. Brisset, C. Videlot-Ackermann, J. Ackermann, F. Fages.- Inkjet printing of new photosensitive sensors based on organic thin films - IEEE PUBLICATION, International Conference on Design and Technology of Integrated Systems in nanoscale aera (DTIS'08), Tozeur - Tunisie, 25-28 mars 2008

Fourquin O., J. R. Cubillo, J. Gaubert, S. Bourdel, M. Battista, N. Dehaese.- Design method for high frequency carrier to die transitions in UWB SiP.- 2eme colloque du GDR SoC-SiP, 4-6 Juin 2008, Paris

Fourquin O., J.R. Cubillo, J. Gaubert, S.Bourdel, M. Battista.- Enhanced Wire Bond Transition from Die to Chip Carrier for 3.1-10.6 GHz UWB applications.- IEEE Electrical Design of Advanced Packaging and Systems EDAPS symposium 2008, Seoul, South Korea, Dec 2008, pp 218-221 - http://dx.doi.org/10.1109/EDAPS.2008.4736039

Fronte D., Pérez A., Payrat E.- The AES in a Systolic Fashion: Implementation and Results on Celator Processor.- Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems (ICECS’08), Malte, Malta Republic, Aug.31-Sept.3 2008, p.380-383 - DOI:10.1109/ICECS.2008.4674870

Fronte D., Pérez A., Payrat E.- Celator : a multi-algorithm cryptographic co-processor.- Proceedings of the 2008 International Conference on Reconfigurable Computing and FPGAs (ReConFig’08), Cancun, Mexico, Dec.3-5 2008, p.438-443 - DOI:10.1109/ReConfFig.2008.76

Gaubert J. - LNA UWB & Intégration en technologie SiP Journée GRD SoC-SiP.- Journée GRD SoC-SiP, Institut Supérieur d'Electronique et du Numérique, Vendredi 19 décembre 2008

Gaubert J., Bourdel S., Battista M., (H. Barthélemy).- Design of IR-UWB Transceiver for Low Cost Applications.- NEWCAS-TAISA’08, IEEE International Conference on; Half Day Tutorial, 2008 -

Ginez O., Portal J-M., Aziza H.- Reliability Issues in Flash Memories: An On-Line Diagnosis and Repair Scheme for Word Line Drivers.- Proceedings of 14^th IEEE International Mixed-Signals, Sensors, and Systems Test Workshop (IMS3TW 2008), Vancouver, Canada, June 18-20, 2008, p. 176-181 - http://dx.doi.org/10.1109/IMS3TW.2008.4581627

Ginez O., Portal J-M., Aziza H.- A High-Speed Structural Method for Testing Address Decoder Faults in Flash Memories.- Proceedings of the IEEE International Test Conference (ITC 2008), Santa Clara CA, USA, October 28-30, 2008, p. 786-795 - http://dx.doi.org/10.1109/TEST.2008.4700633

Guerin C, Huard V., Parthasarathy V., Roux J.M., Bravaix A., Vincent E. - Novel hot-carrier AC-DC design guidelines for advanced CMOS nodes.- Proceedings of the IEEE International Reliability Physics Symposium (IRPS), Phoenix, Arizona, USA, 27 avril – 01 mai, 2008, p. 623-625, 2008

Haddad F., Frioui O., Rahajandraibe W., Zaid L., Bouchakour R.- CMOS Passive Polyphase Filter Design for 2.4 GHz Wireless Communication Applications.- Proceedings of IEEE Joint North-East Workshop on Circuits and Systems and TAISA Conference, Montreal, Canada, June 22-25, 2008, p. 293-296 - DOI: 10.1109/NEWCAS.2008.4606379

Jauffret C., Blanc-Benon P. et Pillon D. - Multi Frequencies and Bearing TMA: Properties and Sonar Applications.- The 11^th International Conference on Information Fusion, Cologne, Germany, juillet 2008

Jauffret C., Pillon D. et Pignol A.C.- Bearings-Only TMA without Observer Maneuver.- The 11^th International Conference on Information Fusion, Cologne, Germany, juillet 2008

Juennard N., Jauffret C., Xerri B.- Detection and localization of very high energy neutrinos by a passive underwater acoustic telescope.- Passive’08 , IEEE OES, Hyères, 14-17 octobre 2008

Laneuville D. et Jauffret C.- Bearing Line Tracking and Bearing-Only Target Motion Analysis.- IEEE Aerospace Conference, Big Sky, Montana, USA, mars 2008

Lefebvre W., Hoummada K., Decreus B., De Geuser F. and Deschamps A.- Characterization of pre-precipitation stages by Atom Probe Tomography and Small-Angle X-ray scattering in an Al-Li-Cu-Mg-Ag alloy.- in “Aluminium Alloys. Their Physical and Mechanical Properties”, Wiley VCH, Hirsch J., Skrotzki B. and Gottstein G. (eds), vol. 1, p 801, 2008

Leroux Ch., Chmielowski R., Madigou V., Blicharski M.- Microstructure of Sr4Ru2O9 thin films obtained by pulsed laser deposition.- EM’ 2008 XIII International Conference on Electron Microscopy, Zakopane, Poland, 8-11 june 2008

Markevich V.P., Bernardini S., Hawkins I.D., and Peaker A.R.- Electrically active defects induced by hydrogen and helium implantations in Ge.- EMRS spring meeting, symposium J, Strasbourg 2008

Martinie S., Le Carval G., Munteanu D., Jaud M.-A., Autran J.L. - A simple compact model to analyze the impact of ballistic and quasi-ballistic transport on ring oscillator performance.- Proceedings of the IEEE International Conference on Integrated Circuit Design and Technology (ICICDT), Grenoble, - p. 273-276, 2-4 Juin 2008

Martinie S., Munteanu D., Le Carval G., Autran J.L. - A new unified compact model for quasi-ballistic transport: application to the analysis of circuit performances of a double-gate architecture.- Proceedings of the IEEE International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2008), p. 377-380, 9-11 Sept. 2008

Martinie S., Munteanu D., Le Carval G., Jaud M.A., Autran J.L. - Analytical modelling and performance analysis of Double-Gate MOSFET-based circuit including ballistic/quasi-ballistic effects.- Proceedings of the 11th International NSTI Nanotech Conference (Nanotech'2008) - Workshop on Compact Modeling (WCM 2008), 1-6 juin 2008, Boston, USA, - p. 837-840, 2008

Martinie S., Vedraine S., Munteanu D., Le Carval G., Barral V., Autran J.L.- Numerical simulation of quasi-ballistic transport in fully-depleted SOI and double-gate MOSFETs: application to the analysis of circuit performances.- Proceedings of the 38th European Solid State Device Research Conference (ESSDERC'2008), Edinburgh, Ecosse, - pxxx 15-19 septembre 2008

Martinuzzi S., C. Trassy, I. Périchaud, J. Degoulange.- N-type mc-Si wafers from the metallurgical route.- Proc. of 33rd IEEE Photovoltaic Specialists Conference, San Diego USA, 2008 -

Math G., Benard C., Ogier J.L., Goguenheim D.- Geometry effects on the NBTI degradation of PMOS transistors.- Proceedings of the 2008 IEEE International Integrated Reliability Workshop, South Lake Tahoe (USA), p.xxx, 12-16th 2008

Merlen A., Chevallier V., Turquat C., Muller C., Valmalette J. C., Müller R., Goux L. and Wouters D.J.- Switching mechanism in CuTCNQ-based memory structures studied by Raman spectroscopy.- XXI International Conference on Raman Spectroscopy ICORS, London, United Kingdom, august 2008

Munteanu D., Autran J.L.- 3D simulation analysis of bipolar amplification in planar double-gate and FinFET with independent gates.- Proceedings of the European Workshop on Radiation and its Effects on Components and Systems (RADECS 2008), Jyväskylä, Finlande, - p. 198-202, 10-12 septembre, 2008

Munteanu D., Autran J.L.- Transient response of 3D multi-channel nanowire MOSFETs submitted to heavy ion irradiation: a 3D simulation study.- Proceedings of the European Workshop on Radiation and its Effects on Components and Systems (RADECS 2008), Jyväskylä, Finlande, - p. 280-283, 10-12 septembre, 2008

Munteanu D., Moreau M., Autran J.L.- Compact model of the ballistic subthreshold current in independent double-gate MOSFETs.- Proceedings of the 11th International NSTI Nanotech Conference (Nanotech'2008) - Workshop on Compact Modeling (WCM 2008), 1-6 juin 2008, Boston, USA, p. 877-880, 2008

Nowakowski P., A. Kopia, S. Villain, J. Kusinski, J-R Gavarri.- RuO2 thin films deposited by spin coating on silicon substrates: pH dependence of microstructure and catalytic properties. - Electron Microscopy, EM'2008, XIII International Conference on Electron Microscopy of Solids, - Zakopane, 8-11 june 2008

Pic D., Regnier A., Pean V., Ogier J.L., Goguenheim D.- Dynamic stress method for accurate NVM oxide robustness evaluation for automotive applications.- Proceedings of the 19th European Symposium Reliability on Electron Devices, Failure Physics and Analysis (ESREF) Conference, Maastricht - The Netherlands, p.xxx, September 29th -October 2nd 2008

Postel-Pellerin J., Canet P., Lalande F., Bouchakour R., Jeuland F., Bertello B., Villard B.- A Full TCAD simulation and 3D parasitic capacitances extraction in 90nm NAND flash memories.- Proceedings of 9^th IEEE Non-Volatile Memory Technology Symposium (NVMTS 2008), Pacific Grove, USA, November 11-14, 2008, p. 86-89 - http://dx.doi.org/10.1109/NVMT.2008.4731200

Raguet J.R., Calenzo P., Deleruyelle D., Laffont R., Guiraud A., Bouchakour R., Bidal V., Boivin P., Mirabel J-M.- Investigation of a new three bit cell concept.- Proceedings of 9^th IEEE Non-Volatile Memory Technology Symposium (NVMTS 2008), Pacific Grove, USA, November 11-14, 2008, p. 95-99 - http://dx.doi.org/10.1109/NVMT.2008.4731202

Reinhart G., Iles G.N, McIntyre G.J., Fitch A.N., Jarvis D.J.- An overview of the ESA-ESRF-ILL collaboration in the framework of the IMPRESS integrated project.- in "MRS Symposium Proceedings", MRS Fall Meeting, Boston, Massachusetts, 1-5 decembre 2008, vol. 1128-U03-11, 2008

Remy L., Coll P., Picot F., Mico P., Portal J-M.- Metal filling impact on standard cells: definition of the metal fill corner concept.- Proceedings of 21^st Annual Symposium on Integrated Circuits and System Design, Gramado, Brazil, September 1-4, 2008, p. 16-21 - http://doi.acm.org/10.1145/1404371.1404387

Remy L., Portal J-M., Coll P., Picot F., Mico P.- Test structure generation to quantify filling impact.- Proceedings of 3^rd IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS 2008), Tozeur, Tunisia, March 25-27, 2008, p. 1-5 - http://dx.doi.org/10.1109/DTIS.2008.4540252

Rigaud F., Portal J-M., Aziza H., Nee D., Vast J., Argoud F., Borot B.- Mixed test structure for soft and hard defect detection.- Proceedings of IEEE International Conference on Microelectronic Test Structures (ICMTS 2008), Edinburgh, Scotland, March 24-27, 2008, p. 52-55 - http://doi.acm.org/10.1109/ICMTS.2008.4509313

Robert-Inacio F., Angulo J., Dinet E.- Contour and detail detection for spatially adaptive median filtering.- Proceedings of the 3^rd IS&T International Conference on Colour in Graphics, Imaging and Vision, Barcelona-Terrassa, Spain, pp 388-393, 9-13 juin 2008

Robert-Inacio F., Bussone S., Chassaing G., Mazière Y.- Object Detection and Identification Applied to Planes and Aircraft for Airport Surveillance.- Proceedings of IVCNZ08, Christchurch, New Zealand, 6 pages, 26-28 novembre, 2008 - DOI : 10.1109/IVCNZ.2008.4762083

Robert-Inacio F., Le Fur P.- Symmetry Detection for Astronomical Object Study.- Proceedings of IVCNZ08, Christchurch, New Zealand, 6 pages, 26-28 novembre, 2008 - DOI: 10.1109/IVCNZ.2008.4762082

Roche J., Rahajandraibe W., Zaid L., Bracmard G. - A Low-Noise Fast-Settling Phase Locked Loop with Loop bandwidth Enhancement.- IEEE International Conference on Electronics, Circuits and Systems (ICECS 2008), Malta, pp. 165 – 168, 3 September, 2008 - DOI : 10.1109/NEWCAS.2008.4606347

Roche J., Rahajandraibe W., Zaid L., Bracmard G. - A New Adaptation Scheme for Low Noise and Fast Settling Analog Phase Locked Loop.- Proc. of the IEEE Midwest Symposium on Circuits and Systems (MWSCAS 2008), Knoxville, USA, pp. 197 – 200, 10-13 August 2008 - DOI: 10.1109/MWSCAS.2008.4616770

Roche, J., Rahajandraibe, W., Zaid, L., Bracmard, G.- A Low Noise Fast-Settling Phase Locked Loop with Loop Bandwidth Enhancement.- IEEE-NEWCAS and TAISA International Conference , Montreal, Canada, pp. 165 – 168, 22-25 June, 2008 - DOI: 10.1109/NEWCAS.2008.4606347

Rudolff F., Bracmard G., Kussener E.- 700mV- Référence de courant auto-polarisée sans contrainte d’inversion.- Proceedings of FTFC 2008", Journées Faible Tension Faible Consommation, p. , 2008

Rudolff F., Bracmard G., Kussener E.- Current Reference Without Inversion Constraint for Low Power. Applications by using CAD Tool.- Proceedings of SAME, Journées Faible Tension Faible Consommation, p……., 2008

Sellier M., Portal J-M., Borot B., Colquhoun S., Ferrant R., Bœuf F., Farcy A.- Predictive Delay Evaluation on Emerging CMOS Technologies: A Simulation Framework.- Proceedings of IEEE International Symposium on Quality Electronic Design (ISQED 2008), San Jose, USA, March 17-19 2008, p. 492-497 - http://doi.ieeecomputersociety.org/10.1109/ISQED.2008.137

Serre S., Lacoste V., Castellani-Coulié K., Paul D.- Optimization using Monte Carlo calculations of a Bonner sphere spectrometer extended to high energies for the neutron environments characterization.- IEEE Proceedings of Radiation and its Effects on Components and Systems, - Jyväskylä, Finland, september 2008

Simon J.J., Escoubas L., Monestier F., Torchio Ph., Flory F., and Cathelinaud M.- Optical coating for organic solar cells.- Proceedings of the 51^st SVC Annual Technical Conference, Society of Vacuum Coaters 2008, Symposium on Cleantech Energy Conversion and Storage, pp. 25-28, Chicago (USA), April 19-24 2008

Telandro T., Asada A., Courmontagne Ph.- Synthetic Aperture SONAR image despeckling methods assessment.- Proceedings of OCEANS 2008 – MTS/IEEE Kobe Techno-Ocean, Vol. 1-3, pp. 692-699, 2008 - DOI: 10.1109/OCEANSKOBE.2008.4531015

Texier M., Acciarri M., Binetti S., Cavalcoli D., Cavallini A., Chrastina D., Isella G., Lancin M., Le Donne A., Tomasi A., Pichaud B., Pizzini S., Rossi M.- Structural characterization of nanocrystalline silicon layers grown by LEPECVD for optoelectronic applications.- Microscopy of Semiconducting Materials XV proc., ed. A.G. Cullis, P.A. Midgley, Springer proceedings in Physics, Vol 120, p. 305, 2008 - http://dx.doi.org/10.1007/978-1-4020-8615-1_66

Texier M., Lancin M., Regula G., Pichaud B.- Core composition of partial dislocations in N-Doped 4H-SiC determined by TEM techniques, dislocation core reconstruction and image contrast analysis.- Microscopy of Semiconducting Materials XV Proc., Cambridge, United Kingdom, 2-5 avril 2007, ed. A.G. Cullis, P.A. Midgley, Springer proceedings in Physics, Vol 120, p. 157, 2008 - http://dx.doi.org/10.1007/978-1-4020-8615-1_33

Thibault J.., Alfonso C., Alexandre L., Jurczak G., Leroux Ch., Saikaly W., Charaï A.- An analytical approach of the HOLZ lines splitting on relaxed samples, European Microscopy Congress.- EMC2008, 14th European Microscopy Congress, september 2008, Aachen, Germany

Thomas M., Deleruyelle D., Kever T., Demolliens A., Turquat Ch., Muller Ch., Böttger U., Waser R.- From micrometric to nanometric scale switching of CuTCNQ-based non-volatile memory structures.- Proceedings of 9^th IEEE Non-Volatile Memory Technology Symposium (NVMTS 2008), Pacific Grove, USA, November 11-14, 2008, p. 1-4 - http://dx.doi.org/10.1109/NVMT.2008.4731190

Tuominen J., Hiltunen J., Wojdyla A., Karppinen M., Suutala A., Jantunen H., Bouffaron R., and Escoubas L.- Direct patterning of micro-optical structures by combined nanoimprinting and lithography.- Proceedings SPIE, 6992, 69920B , 2008

Uppal H. J., S. Bernardini, E. Efthymiou, S. N. Volkos, B. Hamilton, A. R. Peaker.- Uppal H. J., S. Bernardini, E. Efthymiou, S. N. Volkos, B. Hamilton, A. R. Peaker.- EMRS spring meeting, symposium J, - Strasbourg 2008

2009

Bescond M., Lannoo M., Raymond L., Michelini F., Pala M. G.- Influence of Ionized Impurities in Silicon Nanowire MOS Transistors.- 13TH INTERNATIONAL WORKSHOP ON COMPUTATIONAL ELECTRONICS, p. 137, 2009

Boivin P., Bouchakour R., Calenzo P., Fornara P., Laffont R., Niel S., Raguet JR.- Investigation of a new low cost and low consumption single poly-silicon memory.- Proceedings of 2nd International Multi-Conference on Engineering and Technological Innovation, IMETI2009, Orlando, Florida, p. 342-346, 10-13 July 2009

Bourja L., Benlhachemi A., Ezahri M., Bakiz B., Villain S., Gavarri J. R.- Synthesis and characterization of nanosized Ce_1-xBi_xO _2-x solid solutions for catalytic applications.- Taibah International Chemistry Conference (TICC 2009), Taibah University, Al-Madinah Al-Munawarah-Saudi Arabia, 23-25 March,

Bravaix A., Guerin C., Huard V., D. Roy, Roux J.-M., Vincent E.- Hot-Carrier Acceleration Factors for Low Power Management in DC-AC stressed 40nm NMOS node at High Temperature.- Proceedings of the 47^th IEEE International Reliability Physics Symposium (IRPS), Montreal, Quebec, Canada, 26-30 avril, 2009, p. 531-548.

Brunet L., Garros X., Andrieu F., Reimbold G., Vincent E., Bravaix A. Boulanger F.- New method to extract interface states density at the Back and the Front gate interfaces of FDSOI transistors from CV-GV measurements.- Proceedings of IEEE Int. SOI Conference, p. 978-979, 2009

Cavassilas N., S. d’Ambrosio and M. Bescond.- Quantum simulations of hole transport in Si, Ge, SiGe and GaAs double-gate pMOSFETs: orientation and strain effects.- International Electron Device Meeting (IEDM) Tech. Digest, Baltimore (USA), p. 67, December 2009

Courmontagne P., Telandro T., Asada A.- An improvement on SAS image formation.- Proceedings of OCEANS 2009 MTS/IEEE, 2009 - DOI: 10.1109/OCEANSE.2009.5278297

Courmontagne Ph., Telandro T., Asada A.- Pulse-compression: coupling the Matched Filter and the Stochastic Matched Filter.- Proceedings of UAM 2009, 2009 -

Demolliens A., Muller Ch., Deleruyelle D., Spiga S., Cianci E., Fanciulli M., Nardi F., Cagli C., Ielmini D.- Reliability of NiO-based resistive switching memory (ReRAM) elements with pillar W bottom electrode.- Proceedings of 1^st IEEE International Memory Workshop (IMW 2009), Monterey, USA, May 16-19, 2009, p. 25-27

Egels M., T. Deleruyelle, P. Pannier, E. Bergeret .- Miniaturisation d’antennes pour applications RFID faible coût.- 16èmes Journées Nationales Microondes, 26-28 mai 2009, Grenoble, France

Ferrando F., Nouveau G., Philip B., Pradeilles P., Soulenq V., Van-Staen G., Courmontagne Ph.- A voice recognition system for a submarine piloting.- Proceedings of OCEANS 2009 MTS/IEEE, 2009 - DOI: 10.1109/OCEANSE.2009.5278189

Fourquin O., M. Battista, R. Cubillo, J. Gaubert, S. Bourdel, N. Dehaese.- Amplificateur faible bruit UWB 6-8.5GHz intégrant la transition puce/carte.- 16èmes Journées Nationales Microondes, 26-28 mai 2009, Grenoble, France

Gadenne V., Desbief S., Patrone L.- Single and Mixed Self-Assembled Monolayers of Phenyl Species on SiO₂ with Various Ring to Ring Interactions.- in “Concepts in Molecular and Organic Electronics”, Materials Research Society Symposium Proceedings vol. 1154, N. Koch, E. Zojer, S-W. Hla, X. Zhu (eds.), Warrendale, PA, USA, 1154-B05-23, p.29, 2009 - doi :10.1557/PROC-1154-B05-23

Ginez O., Portal J-M., Aziza H.- An On-Line Testing Scheme for Repairing Purposes in Flash Memories.- Proceedings of IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2009).- Liberec, Czech Republic, April 15-17, 2009, p. 120-123 - http://doi.ieeecomputersociety.org/10.1109/DDECS.2009.5012110

Ginez O., Portal J-M., Muller Ch.- Design and Test Challenges in Resistive Switching RAM (ReRAM): An Electrical Model for Defect Injections.- Proceedings of 14^th IEEE European Test Symposium (ETS 2009), Seville, Spain, May 25-29, 2009, p. 61-66 - http://doi.ieeecomputersociety.org/10.1109/ETS.2009.23

Goux L., Lisoni J.G., Courtade L., Muller Ch., Jurczak M., Wouters D.J.- On the bipolar and unipolar switching mechanisms observed in NiO-based memory elements made by thermal oxidation of Ni.- Proceedings of 1^st IEEE International Memory Workshop (IMW 2009), Monterey, USA, May 16-19, 2009, p. 13-14

Guigues F., Doussin O., Rudolff F., Samir A., Kussener E.- Référence de courant compactes et autopolarisées pour applications nanoWatt (50nA, 1V).- Proceedings of FTFC, Journées Faible Tension Faible Consommation, p., 2009

Haddad, F., Rahajandraibe, W., Zaid, L., Frioui, O.- Radio Frequency Tunable Polyphase Filter Design.- Proceedings of IEEE ICECS 2009, Tunisia, 13-16th December 2009, p. 21-24

Haddad, F.; Rahajandraibe, W., Zaid, L., Frioui, O., Bouchakour, R, - Design of radio frequency passive polyphase filter for 2.4 GHz wireless communication applications.- IEEE 10th Wireless and Microwave Technology Conference, 2009 (WAMICON '09), Floride, 20-21 April 2009. pp. 1 – 4 - DOI : 10.1109/WAMICON.2009.5207298

Huard V., Parthasarathy C.R., Bravaix A., Guerin C., Pion E.- CMOS Device Design-in Reliability Approach in Advanced Nodes.- Proceedings of the 47^th IEEE International Reliability Physics Symposium (IRPS), Montreal, Quebec, Canada, 26-30 avril, 2009, p. 624-633

Jauffret C., Pillon D. et Pignol A.C.- Leg-by-leg Bearings-Only TMA without Observer Maneuver.- The 12^th International Conference on Information Fusion, Seattle, USA, juillet 2009

Katcho N.A., M.I. Richard, O. Landré, G. Tourbot, M.G. Proietti, H. Renevier, V. Favre-Nicolin, B. Daudin, G. Chen, J.J. Zhang and G. Bauer.- Structural properties of Ge/Si(001) nano-islands and AlGaN nanowires by Diffraction Anomalous Fine Structure and Multiwavelength Anomalous Diffraction.- Journal of Physics: Conference Series, 190, 012129, 2009

Kazan M., Ottaviani L., Masri P. - Raman investigation of the effect of metal impurities at gettering sites on phonon and electron related properties of 4H-SiC n-n⁺ junctions.- ICSCRM’07 - International Conference on Silicon Carbide and Related Materials 2007, Otsu (Japon), 14 - 19 Octobre 07, Materials Science Forum, Vols 600-603, pp.465-468, 2009

Lemoigne P., V. Quenette, A. Juge, D. Rideau, S. Retailleau, _L. Zaïd_, C. Dufaza, C. Tavernier, and H. Jaouen.- Monitoring Variability of Channel Doping Profile in the 45nm Node MOSFET Through Reverse Engineering of Electrical Back- Bias Effect.- 39th European Solid-State Device Research Conference (ESSDERC), Athènes, Grèce, 14-18 septembre 2009 - Proceedings of the ESSDERC, vol. 1, p. 383, 4 pages, 2009

Li C., Bescond, M. Lannoo M.- Correlation effects in silicon nanowire MOSFETs.- Proceedings of the 13th International Workshop on Computational Electronics (IWCE13), p. 297, 2009

Lockwood DJ, Rowell N., Berbezier I., Ronda A.- Size-Dependent Quantum Efficiency of Luminescence in Self Assembled Germanium Nanocrystals.- ECS Transactions, vol. 25, p. 93, 2009

Maitrejean S., Carreau V., Thomas O., Labat S., Kaouache B., Verdier M., Lepinoux J., Bréchet Y., Legros M., Douin J., Brandstetter S., Cayron C., Sicardy O., Weygand D., Dubreuil O., Normandon P.- Cu Grain Growth in Damascene Narrow Trenches.- Stress-Induced Phenomena In Metallization, 1143, 135-150, 2009

Martinie S., Jaud M.-A., Munteanu D., Thomas O., Le Carval G., Autran J.L.- Performance study of Ballistic and Quasi-Ballistic on Double-Gate MOSFETs 6T SRAM cell.- Proceedings of 12^th International NSTI Nanotech Conference (Nanotech'2009) – MSM 2009, vol. 3, p. 359-362.

Martinie S., Munteanu D., Le Carval G., Jaud M.-A., Autran J.L.- Analytical Modelling of Ballistic and Quasi-Ballistic Nanowires: Validation and Application to CMOS Architecture.- Proceedings of 12^th International NSTI Nanotech Conference (Nanotech'2009) – Workshop on Compact Modeling (WCM 2009), vol. 3, p. 570-573, 2009

Martinie S., Munteanu D., Le Carval G., Sarrazin E., Barraud S., Jaud M-A., Autran J.L.- Numerical simulation of ballistic/quasi-ballistic transport in FDSOI and Nanowire MOSFETs: analysis of CMOS inverter static performances.- Proceedings of 39^th European Solid State Device Research Conference (ESSDERC’2009) – Fringe Session, Athènes, Grèce, 14-18 septembre 2009

Martinie S., Sarrazin E., Munteanu D., Barraud S., Le Carval G., Autran J.L.- Compact Modeling of Quasi-Ballistic Transport and Quantum Mechanical Confinement in Nanowire MOSFETs: Circuit Performances Analysis.- Proceedings of International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2009), p. 139-142, 2009

Moreau M., Munteanu D. and Autran J.L.- Quantum Simulation Analysis of Gate Tunneling Current in High-k Gate Stack MIM Capacitors.- Proceedings of 39^th European Solid State Device Research Conference (ESSDERC’2009) – Fringe Session, Athènes, Grèce, 14-18 septembre 2009

Moreau M., Munteanu D., Autran J.L., Bellenger F., Mitard J., Houssa M.- Quantum Simulation of C-V and I-V Characteristics in Ge and III-V Materials/High-k MOS Devices - MRS Fall Meeting, déc-09 -

Ottaviani L., Kazan M., Masri P., Sauvage T.- Improvement of the thermal conductivity in 4H-SiC epitaxial layer by introducing gettering sites.- ICSCRM’07 - International Conference on Silicon Carbide and Related Materials 2007, Otsu (Japon), 14 - 19 Octobre 07, Materials Science Forum Vols 600-603, pp.525-528, 2009

Ottaviani L., Palais O., Barakel D., Pasquinelli M.- Minority carrier lifetime measurements in specific epitaxial 4H-SiC layers by the Microwave Photoconductivity Decay.- ECSCRM’08 - European Conference on Silicon Carbide and Related Materials, Barcelone (Espagne), 7 – 11 Septembre 08 - Materials Science Forum, Vols 615-617, p.295-298, 2009

Plantier J., Aziza H., Portal J-M., Relliaud C.- Investigation of EEPROM Memories Reliability During Endurance and Retention Tests.- Proceedings of 4^th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS 2009), Cairo, Egypt, April 6-7, 2009, p. 241-246

Postel-Pellerin J., Lalande F., Canet P., Bouchakour R., Jeuland F., Bertello B., Villard B.- TCAD Investigation of abnormal degradation of inhibited cells in NAND Flash structures.- Proceedings of IEEE International Conference on Simulation of Semiconductor Process and Devices, San Diego, USA, September 9-11, 2009, p. 234-236

Puget S., Bossu G., Fenouillet-Beranger C., Perreau P., Masson P., Lorenzini P., Mazoyer P., Portal J-M., Bouchakour R., Skotnicki T.- FDSOI Floating Body Cell eDRAM Using Gate-Induced Drain-Leakage (GIDL) Write Current for High Speed and Low Power Applications.- Proceedings of 1^st IEEE International Memory Workshop (IMW 2009), Monterey, USA, May 16-19, 2009, p. 1-2

Raymond L., Verga A., Vvedensky D.- Stochastic continuum model of submonolayer epitaxial growth.- 7th Workshop on Epitaxial Semiconductor on Patterned Substrate and Novel Index Surfaces, Materials Science in Semiconductor Processing, vol. 12, p. 2, 2009 - doi: 10.1016/j.mssp.2009.04.001

Remy L., Picot F., Mico P., Coll P., Portal J-M.- Definition of a DFM Filler Cell.- Proceedings of the 12th Technical and Scientific Meeting of ARCSIS, Rousset, FRANCE, 28-29 September 2009

Remy L., Picot F., Mico P., Coll P., Portal J-M.- DUTY : A New Approach of DFM / DFY Design Methodology.- Proceedings of the EMEA CDN Live 2009 (CDNLIVE'09), Munich, Germany, 18-20 May 2009

Remy Laurent, Hassan Lachkar, Jean-Marie Jonqueres, Philippe Coll, Olivier Rizzo, Claire Nauts, Jean-Michel Portal, Olivier Ginez, Philippe Mico, Fabrice Picot, Arnol Ginetti.- DFM Method and Tools Development.- Proceedings of the SAME 2009, Sophia Antipolis, FRANCE, 22-23 May 2009

Richard M.-I., Katcho N.A., Proietti M.G., H. Renevier, V. Favre-Nicolin, Z. Zhong, G. Chen, M. Stoffel, O. Schmidt, G. Renaud, T. U. Schülli, and G. Bauer.- Structural properties of Ge/Si(001) Nano-Islands by Diffraction Anomalous Fine Structure and Multiwavelength Anomalous Diffraction.- Eur. Phys. J. Special Topics, 167, 3, 2009

Rigaud F., Portal J-M., Dreux P., Vast J., Aziza H., Bas G.- Fast Embedded Characterization of FEOL Variations in MOS Devices.- Proceedings of IEEE International Conference on Microelectronic Test Structures, Oxnard, USA, March 30 – April 2, 2009, p. 205-208 - http://dx.doi.org/10.1109/ICMTS.2009.4814642

Robert-Inacio F.- Inscribed Convex Sets and Distance Maps: Application to Shape Classification and Spatially Adaptive Image Filtering.- Proceedings of VISAPP'09, Vol. 2, Lisbon, Portugal, pp 60-66, 05-08 février 2009

Robert-Inacio F.- Symmetry Detection for Road Sign Classification.- Proceedings of 10^th European Congress of Stereology and Image Analysis, Milan, Italy, 8 pages, 22-26 juin 2009

Robert-Inacio F., Outré D., Diop M.F.- Pattern Analysis for Computer-Aided Driving.- Proceedings of VISAPP'09, Vol. 1, Lisbon, Portugal, pp 259-264, 05-08 février 2009

Romann J., Chevallier V., Merlen A., Valmalette J.C.- Self-assembly and Raman spectroscopy of additive coated nanocrystals.- MRS Proceedings Spring Meeting, San Francisco, USA, April 13-17 2009, pp xx-xx 2009 (à paraître)

Streiffer S. K., R. V. Wang, M. J. Highland, T. T. Fister, M.-I. Richard, D. D. Fong, J. A. Eastman, P. H. Fuoss, C. Thompson, and G. B. Stephenson.- Reversible Chemical Switching of Ultra-Thin PbTiO3 Films.- to appear in Proceedings of the 14th US-Japan Seminar on Dielectric and Piezoelectric Materials, October 11-14, 2009, Welches, Oregon (USA).

Telandro V., Doussin O., Barthelemy H., Kussener E.- 20MHz- Générateur d’horloge pseudo-aléatoire.- Proceedings of FTFC, Journées Faible Tension Faible Consommation, p., 2009

Veirman J., Dubois S.,Enjalbert N., Garandet J.P., Martel B., Heslinga D.,Kraiem J., Perichaud I., Martinuzzi S.- B-P Compensation in SOG silicon : cure or curse ? - 24 th European Photovoltaic Solar Energy Conf., Hambourg, septembre 2009

Zarbout K., Si Ahmed A., Moya G., Damamme G., Bernardini J., Kallel A.- Characterisation of the conduction mechanisms in polycrystalline alumina.- IEEE Proceedings of 2009 International Conference on Electrical Insulation and Dielectric Phenomena, 09CH38046, p.325-328, 2009 - http://dx.doi.org/10.1109/CEIDP.2009