Articles parus dans des revues à comité de lecture depuis 2006

Cacho F., G. Cailletaud, C. Rivero, P. Gergaud, O. Thomas, H. Jaouen. Numerical modeling of stress build up during nickel silicidation under anisothermal annealing. Materials Science and Engineering B, vol. 135, p. 95, 2006 http://dx.doi.org/10.1016/j.mseb.2006.08.044

Gergaud P., Goudeau P., Sicardy O., Tamura N., Thomas O. Residual stress analysis in micro- and nao-structures materials by X-ray diffraction. International Journal of Materials and Product Technology, vol. 26, p. 3-4, 2006

Michel J.P., Lacaze E., Goldmann M., Gailhanou M., de Boissieu M., Alba M. Structure of smectic defect cores: X-ray study of 8CB liquid crystal ultrathin films. Physical Review Letters, vol. 96, n° 2, p. 027803, 2006 http://dx.doi.org/10.1103/PhysRevLett.96.027803

Ney D., Federspiel X., Thomas O., Gergaud P. Stress induced electromigration backflow effect in copper interconnects. IEEE Transactions on Device and Materials Reliability, vol. 6, p. 175 2006

Ney D., X. Federspiel, O. Thomas, P. Gergaud. Stress induced electromigration backflow effect in copper interconnects. IEEE Transactions on  Device & Materials Reliability, vol. 6, p. 175, 2006 http://dx.doi.org/10.1109/TDMR.2006.877862

Roussel J.M., Bellon P. Interface sharpening and broadening during annealing of Cu/Ni multilayers : a kinetic Monte Carlo study. Physical Review B, vol. 73, n° 8, p. 085403, 2006 http://dx.doi.org/10.1103/PhysRevB.73.085403

Thomas O., A. Loubens, P. Gergaud, Labat S. X-ray scattering: a powerful probe of lattice strains in materials with small dimensions. Applied Surface Science, vol. 253, p. 182, 2006 http://dx.doi.org/10.1016/j.apsusc.2006.05.082

Belin T., Millot N., Bovet N., Gailhanou M. In situ and time resolved study of the gamma/alpha-Fe2O3 transition in nanometric particles. Journal of Solid State Chemistry, vol 180, n° 8, p 2377-2385, 2007 http://dx.doi.org/10.1016/j.jssc.2007.06.013

Benoudia M.C., Roussel J.M., Labat S., Thomas O., Beke D.L., Langer G., Kis-Varga M. Investigating interdiffusion in Mo/V multilayers from x-ray scattering and kinetic simulations. Defect and Diffusion Data, vol. 264, p. 13, 2007

Eberlein M., Escoubas S., Gailhanou M., Thomas O.,Micha J.-S., Rohr P., Coppard R. Investigation by high-resolution X-ray diffraction of the local strains induced in Si by periodic arrays of oxide filled trenches. Physica Status Solidi (a), vol. 8, p. 2542-2547, 2007 http://dx.doi.org/10.1002/pssa.200675654

Gailhanou H., Van Miltenburg, Rogez J., Olives J., Amouric M., Gaucher E.C., Blanc P. Thermodynamic properties of anhydrous smectite MX-80, illite Imt-2 and mixed layer illitesmectite ISCz-1 as determined by calorimetric methods. Part I : Heat capacities, heat contents and entropies. Geochimica et Cosmochimica Acta, p. 5463-5473, 2007

Gailhanou M., Loubens A., Micha J.-S., Charlet B., Minkevich A.A.,  Fortunier R., Thomas O. Strain field in silicon on insulator lines using high resolution x-ray diffraction. Applied Physics Letters, vol. 90, p. 111914, 2007 http://dx.doi.org/10.1063/1.2713335

Gheribi A., Roussel J.M., Rogez J. Phenomenological Hugoniot curves for transition metals up to 1 Tpa. Journal of Physics : Condensed Matter, vol. 19, p. 476218-1726, 2007 http://dx.doi.org/10.1088/0953-8984/19/47/476218

Imbert B., Guichet C., Bonnetier S., Zoll S., Juhel M., Hopstaken M., Clifton P., Thomas O. Impact of surface preparation on  nickel-platinum alloy silicide phase formation. Microelectronic Engineering, vol. 84, 2523, 2007 http://dx.doi.org/10.1016/j.mee.2007.05.030

Labat S., Chamard V., Thomas O. Local strain in a 3D nanocrystal revealed by 2D coherent X-ray diffraction imaging. Thin Solid Films, vol.  515, p. 5557, 2007 http://dx.doi.org/10.1016/j.tsf.2006.12.031

Minkevich A.A.,  Gailhanou M., Micha J.-S.,  Charlet B., Chamard V., Thomas O. Inversion of the diffraction pattern from an inhomogeneously strained crystal using an iterative algorithm. Physical Review B, vol 76, p104106, 2007 http://dx.doi.org/10.1103/PhysRevB.76.104106

Streit S., Gutt C., Chamard V., Robert A., Sprung M., Sternemann H., Tolan M. Two-Dimensional Dynamics of Metal Nanoparticles on the Surface of Thin Polymer Films Studied with Coherent X-Rays. Physical Review Letters, vol. 98, 047801, 2007 http://dx.doi.org/10.1103/PhysRevLett.98.047801

Chamard V., Stangl J, Labat S, Mandl B, Lechner RT, Metzger TH. Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent X-ray diffraction. Journal of Applied Crystallography, vol. 41, p. 272-280, 2008 http://dx.doi.org/10.1107/S0021889808001167

Eberlein M., Escoubas S., Gailhanou M., Thomas O., Rohr P., Coppard R. Influence of crystallographic orientation on local strains in silicon: a combined high-resolution X-ray diffraction and finite element modeling investigation. Thin Solid Films, vol.516, p. 8042–8048, 2008 http://dx.doi.org/10.1016/j.tsf.2008.04.061

Escoubas S., Brillet H., Mesarotti T., Raymond G., Thomas O., Morin P. Local strains induced in silicon channel by a periodic array of nitride capped poly lines investigated by High-Resolution X-Ray Diffraction. Material Science and Engineering B, vol. 154-155, p. 129-132, 2008 http://dx.doi.org/10.1016/j.mseb.2008.08.016

Imbert B., M. Gregoire, S. Zoll, R. Beneyton, S. Del-Medico, C. Trouiller, O. Thomas. Nitrogen impurity effects on nickel silicide formation at low temperatures – New “nitrogen co-plasma” approach. Microelectronic Engineering, vol. 85, p. 2005-2008, 2008 http://dx.doi.org/10.1016/j.mee.2008.04.021

Imbert B., Zoll S., Garnier P., Pernet B., Galpin D., Beneyton R., Juhel M., Mur P., Carron V., Thomas O. Self-aligned nickel-platinum silicide oxidation. Material Science and Engineering B, vol. 154-155, p.155-158, 2008 http://dx.doi.org/10.1016/j.mseb.2008.08.010

Kaouache B., S. Labat, O. Thomas, S. Maitrejean, V. Carrreau. Texture and strain in narrow copper damascene interconnect  lines: an x-ray diffraction analysis. Microelectronic Engineering, vol. 85, p. 2175-2178, 2008 http://dx.doi.org/10.1016/j.mee.2008.06.017

Minkevich A., T. Baumbach, M. Gailhanou, O. Thomas. Applicability of an iterative inversion algorithm to the diffraction pattern from inhomogeneously strained crystals. Physical Review B, vol.  78, p. 174110, 2008 http://dx.doi.org/10.1103/PhysRevB.78.174110

Richard M.-I., Chen G., Schülli T.U., Renaud G., Bauer G. Coalescence of domes and superdomes at a low growth rate or during annealing: towards the formation of flat-top superdomes. Surface Science, vol. 602, 2157, 2008 http://dx.doi.org/10.1016/j.susc.2008.04.024

Thomas O. Diffraction analysis of elastic strains in micro and nano-structures. Zeitschrift für Kristallographie, vol. 223, p. 569-574, 2008 http://dx.doi.org/10.1524/zkri.2008.1215

Vartanyants I. A., Zozulya A. V., Mundboth K., Yefanov O. M., Richard M.-I., Wintersberger E., Stangl J., Diaz A., Mocuta C., Metzger T.H., Bauer G., Boeck T., and Schmidtbauer M. Crystal truncation planes revealed by three-dimensional reconstruction of reciprocal space. Physical Review B, vol. 77, p. 115317, 2008 http://dx.doi.org/10.1103/PhysRevB.77.115317

Amara H, Roussel JM, Bichara C, Gaspard JP, Ducastelle F. Tight-binding potential for atomistic simulations  of carbon interacting with transition metals : Application to the Ni-C system. Physical Review B, vol. 79, p. 014109, 2009 http://dx.doi.org/10.1103/PhysRevB.79.014109

Beutier G., Marty A., Livet F., Haznar A., Dudzik E., Stanescu S., Chamard V. and van der Laan G. Magnetic memory in discrete media observed by coherent soft x-ray resonant scattering. New Journal of Physics, vol. 11, p. 113026, 2009 http://dx.doi.org/10.1088/1367-2630/11/11/113026

Chamard V., Diaz A., Stangl J.  et Labat S. Structural investigation of InAs nanowires with coherent x-rays. Journal of Strain Analysis, vol. 44, p.533, 2009 http://dx.doi.org/10.1243/03093247JSA573

Connétable D., Thomas O. First principles calculations of the elastic constants of NiSi. Physical Review B, vol. 79, p. 094101, 2009 http://dx.doi.org/10.1103/PhysRevB.79.094101

Diaz A., Mocuta C., Stangl J., Mandl B., David C., Vila-Comamala J., Chamard V., Metzger T. et Bauer G. Coherent diffraction imaging of a single epitaxial InAs nano wire using a focused x-ray beam. Physical Review B, vol.79, p.125324, 2009 http://dx.doi.org/10.1103/PhysRevB.79.125324

Escoubas S., Brillet H., Mesarotti T., Raymond G., Thomas O., Morin P. Local strains induced in silicon channel by a periodic array of nitride capped poly lines investigated by high-resolution X-ray diffraction. Materials Science & Engineering B, vol. 154-155, p. 129-132, 2008

Escoubas S., Eberlein M., Rohr P. and Thomas O. High-resolution X-ray diffraction as a tool to investigate the evolution of local stress in sub-micrometric Si lines isolated by periodic arrays of oxide-filled trenches. Materials Science in Semiconductor Processing,  vol. 12, Issues 1-2, p. 64-70, 2009 http://dx.doi.org/10.1016/j.mssp.2009.07.007

Katcho N.A., M.I. Richard, O. Landré, G. Tourbot, M.G. Proietti, H. Renevier, V. Favre-Nicolin, B. Daudin, G. Chen, J.J. Zhang and G. Bauer. Structural properties of Ge/Si(001) nano-islands and AlGaN nanowires by Diffraction Anomalous Fine Structure and Multiwavelength Anomalous Diffraction. Journal of Physics: Conference Series, 190, 012129, 2009

Katcho N.A., M.I. Richard, O. Landré, G. Tourbot, M.G. Proietti, H. Renevier, V. Favre-Nicolin, B. Daudin, G. Chen, J.J. Zhang, Z. Zhong, M. Stoffel, O. Schmidt, G. Renaud, T. U. Schülli and G. Bauer. Combining spectroscopy and simulations to probe the structural properties of Ge/Si(001) nano-islands, ESRF highlights, 2009

Richard M.-I., Favre-Nicolin V., Renaud G., Schülli T. U., Priester C., Zhong Z., Metzger T.-H. Multiple Scattering effects in strain and composition analysis of nanoislands by grazing incidence x-rays. Applied Physics Letters, vol. 94, p. 013112, 2009 http://dx.doi.org/10.1063/1.3064157

Richard M.-I., N.A. Katcho, M.G. Proietti, H. Renevier, V. Favre-Nicolin, Z. Zhong, G. Chen, M. Stoffel, O. Schmidt, G. Renaud, T. U. Schülli, and G. Bauer. Structural properties of Ge/Si(001) Nano-Islands by  Diffraction Anomalous Fine Structure and Multiwavelength Anomalous Diffraction.  Eur. Phys. J. Special Topics,  167, 3, 2009

Richard M.-I., Schülli T.U., Renaud G., Wintersberger E., Chen G., Bauer G., Holy V. In situ x-ray scattering study on the evolution of Ge island morphology and relaxation for low growth rate: Advanced transition to superdomes. Physical Review B, vol. 80, p. 045313, 2009 http://dx.doi.org/10.1103/PhysRevB.80.045313

Roussel JM, Labat S, Thomas O. Relation between strain and composition in coherent epitaxial Cu/Ni multilayers:  Influence of strong concentration gradients. Physical Review B, vol. 79, p. 014111, 2009 http://dx.doi.org/10.1103/PhysRevB.79.014111

Schülli T.U., Vastola G., Richard M.-I., Malachias A., Renaud G., Uhlik F., Montalenti F., Chen G., Miglio L., Schäffler F., and Bauer G. Enhanced Relaxation and Intermixing in Ge islands Grown on Pit-Patterned Si(001) Substrates. Physical Review Letters, vol. 102, p.025502, 2009 http://dx.doi.org/10.1016/j.susc.2008.04.024

Richard M.-I., M. J. Highland, T. T. Fister, A. Munkholm, J. Mei, S. K. Streiffer, Carol Thompson, P. H. Fuoss and G. B. Stephenson. In-Situ Synchrotron X-Ray Studies of Strain and Composition Evolution during Metal-Organic Chemical Vapor Deposition of InGaN. Appl. Phys. Lett. 96,  2010

Vaxelaire N., Labat S., Chamard V., Thomas O., Jacques V., Picca F., Ravy S., Kirchlechner C. et Keckes J. Strain determination in polycrystalline thin film from retrieving cross-reciprocal space measurement : numerical feasibility and experimental methodology. Nuclear Instruments and Methods B, accepted.