Sponsors Messages |
ALTEC
Equipment
Modular EpiCentre Deposition Stage for MBE applications:
the EC-I series is the latest model in the very
successful range of EpiCentre stages, providing
state-of-the-art performance for various growth and
deposition techniques including MBE, sputtering and
CVD... [More]
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Ircon
Ircon extends Modline 7 series by two new infrared
thermometers and a new processor box. The new 7V line
has been especially designed for the semiconductor
industry, while the 75 series now comprises a new high
temperature model dedicated to heat treating and
annealing... [More]
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LayTec
LayTec is a market leader of integrated metrology for
thin-film deposition and other high value generating
processes. LayTec?s equipment is used in a broad range of
applications like optoelectronics, electronics, PV,
displays, optics and photonics, SEMI and flash memory
production, automotive industry and others. Our latest
news: EpiCurve®, EpiCurve® TT,
EpiTT... [More] |
Riber
Riber has launched the new Compact 21 Discover 3-inch
substrate MBE research system. The entire vacuum
hardware of the Compact 21 Discover is conveniently
presented in a fully open way to permit a unique 360°
access to the system for easy cell filling, maintenance
and new accessory additions.... [More]
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Tescan
Orsay Holding
TESCAN ORSAY HOLDING group develops SEM and DualBeam for
semiconductor applications, in particular:
- MAIA and GAIA: FEG SEM and DualBeam based on an
immersion electronic column (for higher resolution at
low voltage)
- New GM large chamber with stage able to accommodate
12" wafers
- New softwares dedicated to semiconductors
- New accessories included into the SEM (FIB): AFM ,
TOF -SIMS , laser interferometer stage...
[More] |
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Recently Published |

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Formation of Monocrystalline Silicon-Based Mie
Resonators via Silicon-on-Insulator Dewetting
M. Abbarchi et al.
We report the capabilities of a dewetting-based
process, independent of the sample size, to
fabricate Si-based resonators over large scales
starting from commercial silicon-on-insulator
(SOI) substrates... [More]
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Selective area epitaxy of InAs/AlGaSb tunnel
diodes
L. Desplanque et al.
In this study, selective area (SA) growth of
InAs by molecular beam epitaxy (MBE) is used to
define small area near broken gap AlGaSb/InAs
tunnel diodes grown on a GaSb:p+ (001)
substrate... [More]
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Nonequilibrium diffusion of reactive solid
islands
F. Leroy, Y. Saito, F. Cheynis, E.
Bussmann, O. Pierre-Louis, P. Müller
In this paper we report on the combined effects
of reactivity, wetting, and shape changes on the
random motion of crystalline Si islands on
amorphous SiO2 substrates during
annealing. For this purpose nanoparticle motion
and size evolution are studied both
experimentally (in situ and real time
experiments) and theoretically (kinetic Monte
Carlo simulations (KMC) including chemical
reactivity)... [More]
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LEEM study of the dynamics of solid state
dewetting
F. Leroy, F. Cheynis, P. Müller
Using low-energy electron microscopy (LEEM), we
have studied, in-situ and in real time, the
dewetting of Si(001) and Ge(001) thin films on
amorphous silicon dioxide substrates... [More]
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Low Temperature Epitaxy in a Plasma Enhanced
Chemical Vapor Deposition environment
LPICM
Can we grow epitaxial silicon films at low
temperature (~200 °C) in a PECVD environment?
the most common answer is: no. Still, this is
what researchers at LPICM have been convincingly
doing over the past years... [More]
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High quality (11-22) semipolar GaN nearly free
of basal stacking faults grown on 2 in.
patterned sapphire substrate by MOCVD
F. Tendille et al.
High quality semipolar (11-22) GaN layers have
been achieved by MOCVD on 2 -in. sapphire wafers
by performing the selective area growth of GaN
nitride from the inclined c-facets of a
patterned sapphire substrate (PSS)... [More]
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Of Interest for the Epitaxy Community |
Equipement
disposal: X-Ray Diffractometer Seifert DRX 3003-PTS
Diffractometer currently in use. Good general condition.
From 1997. 10 month X-ray Tube.
High Resolution X-Ray diffractomer equipped with a Gobel
mirror, 2 or 4 bounce Ge (220) monochomator or 2 or 4
bounce Ge (440) monochomator, a 2 bounce Ge(220)
analyzer, a 0.24° long plate collimator, a 4-axis
goniometer (2theta up to 165°, phi 360°, chi -90°-90°).
Possibility to perform Bond measurements with the
detector at negative 2theta positions. Collimator for
pole figures. Regularly controlled by Seifert technical
service.
Future owner will be responsible for the removal costs
Contacts:
NPSC:
&-8221;Nanophysique et Semiconducteur&-8221; Group - Institut
Néel-CNRS and INAC&-8211;CEA, Grenoble
Joint
laboratory Annealsys and Institut des Nanotechnologies
de Lyon for CVD/ALD process development
Annealsys is pleased to announce the creation of a joint
laboratory (InCVD) with Institut des Nanotechnologies de
Lyon (INL - UMR CNRS 5270) supported by the French
National Research Agency (ANR: Agence Nationale de la
Recherche). The InCVD laboratory is dedicated to
innovating chemical vapor deposition processes and
associated materials and will be directed by Dr
Catherine Dubourdieu (INL) in association with Dr
Jean-Manuel Decams (Annealsys)... [More]
New
epitaxy equipment at NanoTecMat technological platform
A silicon-germanium MBE equipment (SG800 from DCA
Instruments) was recently installed at NanoTecMat
technological platform. This MBE chamber is designed for
200mm wafer size. It is connected to a cluster tool type
UHV central distribution chamber allowing future
expansion with additional growth chambers, analysis
chambers or other processing chambers... [More]
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Upcoming Events |
28
th SYMPOSIUM ON SURFACE SCIENCE 2015
Sunday, March 22 - Saturday, March 28, 2015
Les Arcs 1800, Bourg Saint Maurice, France
Organizers: P. Müller, G. Renaud, F. Leroy, F. Cheynis
and S. Curiotto
All information and online-registration is provided on
the web page: http://www.cinam.univ-mrs.fr/3s15
2015 Compound
Semiconductor Week (CSW)
June 28th to July 2nd, 2015
Santa Barbara, California, USA
Organizers: U. Mishra, D. Huffaker, K. Choquette and T.
Palacios
As in previous editions, the 2015 Compound Semiconductor
Week will be the common venue for the 42nd International
Symposium on Compound Semiconductors (ISCS), and the
27th International Conference on Indium Phosphide and
Related Materials (IPRM).
More information about the conference and the submission
process can be found on the web page: http://csw2015.ece.ucsb.edu
XXIIIe
Congres General Société Française de Physique
August 24th to 28th, 2015
Strasbourg, France
Colloque 18: "Capillarite: du macroscopique au
nanoscopique" (pdf)
Organizers: T. Frisch, P. Muller, A. Pocheau, O.
Pierre-Louis, M. Plapp and Y. Pomeau
More information about the conference: http://sfp2015.fr/
2015 PULSE
Summer School
September 14th to 18th,
2015
Porquerolles, France
Organizers: J.-N. Aqua, I. Berbezier, C. Fontaine and N.
Gogneau
The school is dedicated to PhD students, young but also
junior scientists. It will provide both a reminder of
the basic understanding of epitaxy together with a
description of its modern applications.
You will find all the details about this school on http://pulse-school.sciencesconf.org
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Job Opportunities / Research |
PhD
Position - LAAS (Toulouse, France)
This research proposal aims at growing gold-free
nanowires on silicon in the <001> direction using
new nanotechnology advances.
The research work will be conducted in the MPN group of
the LAAS-CNRS under the supervision of Dr.
Sebastien Plissard. The PhD candidate will benefit from
the state of the art clean-room environment of the lab,
and from the broad knowledge of the group in the fields
of nanoelectronics, nanowire growth, nano fabrication
and material characterization. The project is funded by
the French Ministry of Higher Education and Research and
should start
around October 2015... [More]
Title: "Bottom Up" Integration of High Mobility
III-V Nanowires on Silicon
Laboratory:
LAAS, UMR
CNRS, Paul Sabatier University, Toulouse, France
Contact: sebastien.plissard@laas.fr
Postdoctoral
Position - CINaM (Marseille, France)
This proposal for a post-doc position is supported by
the French Agency for Research.
The main goal of our project is to develop a basic
understanding of the statics and dynamics of
solid-solid-vacuum triple lines via a study of the
dynamics of dewetting of a thin film. More precisely we
want to tackle two problems (i) the influence of
chemical reactivity at the triple line and (ii) the role
of substrate heterogeneity (topographical or chemical)
on the triple line behaviour... [More]
Title:
Triple-line dynamics and solid-state dewetting
Keywords:
Dewetting, Thin films, LEEM, Atomic probes
Duration: 18
mois
Laboratory: CINaM,
UMR CNRS, Marseille, France
Contact: muller@cinam.univ-mrs.fr
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