Participation de l'IM2NP à la MRS 2019 à Boston aux Etats Unis

Boston, Etats-Unis

06/12/2019

Plusieurs chercheur.e.s de l'IM2NP ont participé à la conférence MRS (Materials Research Society) en décembre 2019 à Boston, Etats Unis.

Les contributions nombreuses comprenaient:

. La co-organisation du symposium MT06: In situ characterization of dynamic phenomena during materials synthesis par:

Ashwin Shahani, University of Michigan

Guillaume Reinhart, Institut Matériaux Microélectronique Nanosciences de Provence, IM2NP

Damien Tourret, IMDEA

Amy Clarke, Colorado School of Mines

. La présentation des travaux suivants:

SESSION EN16.02: Metal Oxides for Gas Sensors II

1- Invited paper : 1:30 PM - 2:00 PM *EN16.02.01 - Advanced Materials—Challenges and Opportunities for Gas Sensing Performances Sandrine Bernardini; Aix Marseille Univ, Université de Toulon, CNRS, France

2- Oral - 3:45 PM 4:00PM : EN16.02.07- BTEX Gas Sensor Based on Hematite Nanocrystals—Preparation and Characterization Luís F. da Silva1, Tomas Fiorido2, Sandrine Bernardini2, Ariadne C. Catto1, João V. de Palma1, Waldir Avansi1, Khalifa Aguir2 and Marc Bendahan2; 1Universidade Federal de São Carlos, Brazil; 2Université Aix-Marseille, France

3- Poster : EN16.03.03- Preparation of Nanostructures and Their Application as UV-Light Assisted Gas Sensors Ariadne C. Catto1, Luís F. da Silva1, Sandrine Bernardini2, Khalifa Aguir2 and Waldir Avansi1; 1Universidade Federal de São Carlos, Brazil; 2Aix Marseille Univ, Université de Toulon, CNRS, IM2NP, France

SESSION MT06.02: Solidification and X-Ray Analysis

Oral 10:45 AM - MT06.02.03 In Situ and Real-Time Observation of Ni-Based Alloy Directional Solidification by X-Radiography Guillaume Reinhart¹,David Grange²,Nathalie Mangelinck-Noël³,Ngadia Taha Niane²,Vincent Maguin^2,4,Gildas Guillemot⁴,Charles-André Gandin⁴,Henri Nguyen-Thi¹Aix-Marseille Univ - IM2NP¹,Safran Tech²,CNRS - M2NP³,PSL - MINES ParisTech - CEMEF⁴

SESSION MT06.11: Semiconductors—Solidification

Oral 9:30 AM - MT06.11.03 Simultaneous In Situ X-Ray Diffraction Topography and Radiography Imaging for Defect Characterization During Silicon Growth Maike Becker¹,Gabrielle Regula¹,Serge Neves Dias¹,Hadjer Ouaddah¹,Guillaume Reinhart¹,Nathalie Mangelinck-Noël¹Aix-Marseille Univ., Université de Toulon, CNRS, IM2NP¹