Equipe Mécanique des Nano-Objets (MNO)

 4D-STEM Viewer

The 4D-STEM Viewer tool allows you to view images and diffraction patterns reconstructed from raw data files (.mrc) recorded during 4D-STEM measurements. It enables you to generate bright-field, dark-field, and annular dark-field images, with adjustable numerical apertures. It also offers the ability to generate diffraction patterns associated with selected regions of the image, 1D diffraction spectra (intensity as a function of spatial frequencies), and to construct orientation maps from multi-wave diffraction patterns.
Processed data can be exported as data files (.csv) or images (.png, .jpeg, .pdf, etc.) with adjustable resolution. 4D-STEM Viewer is compatible with Windows and Mac OS operating systems (see installers below) and free*.

(*) When publishing data processed using the 4D-STEM Viewer tool, please cite: F. Mignerot, O. Thomas, M. Texier, journal XX (2026) XXXX.

Contact:  florent.mignerot@gmail.com,  michael.texier@univ-amu.fr