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T. Francois,
Jean Coignus,
L. Grenouillet,
J.P. P Barnes,
N. Vaxelaire,
J. Ferrand,
I. Bottala-Gambetta,
M. Gros-Jean,
S. Jeannot,
Pierre Boivin,
Philippe Chiquet,
Marc Bocquet,
E. Nowak,
F Gaillard,
Ferroelectric HfO2 for Memory Applications: Impact of Si Doping Technique and Bias Pulse Engineering on Switching Performance, 2019 IEEE 11th International Memory Workshop (IMW), 2019, 66, pp.1-4
(10.1109/IMW.2019.8739664)
(hal-02399691) |
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Philippe Chiquet,
Maxime Chambonneau,
V. Della Marca,
J. Postel-Pellerin,
Pierre Canet,
Sarra Souiki Souiki-Figuigui,
Guillaume Idda,
Jean-Michel Portal,
David Grojo,
Phenomenological modelling of non-volatile memory threshold voltage shift induced by nonlinear ionization with a femtosecond laser, Scientific Reports, 2019, 9
(10.1038/s41598-019-43344-x)
(hal-02137915) |
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J. Postel-Pellerin,
Gilles Micolau,
Philippe Chiquet,
Maminirina Joelson,
Jean-Baptiste Decitre,
A global modeling approach of the leakage phenomena in dielectrics, E3S Web of Conferences, 2019, 88, pp.05002
(10.1051/e3sconf/20198805002)
(hal-02618292) |
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V. Della Marca,
J. Postel-Pellerin,
T. Kempf,
A. Regnier,
Philippe Chiquet,
Marc Bocquet,
Quantitative correlation between Flash and equivalent transistor for endurance electrical parameters extraction, Microelectronics Reliability, 2018, 88-90, pp.159 - 163
(10.1016/j.microrel.2018.06.116)
(hal-01900789) |
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Maxime Chambonneau,
Sarra Souiki Souiki-Figuigui,
Philippe Chiquet,
Vincenzo Della Marca,
J. Postel-Pellerin,
Pierre Canet,
Jean-Michel Portal,
David Grojo,
Suppressing the memory state of floating gate transistors with repeated femtosecond laser backside irradiations, Applied Physics Letters, 2017, 110, pp.161112 - 161112
()
(hal-01655116) |
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J. Postel-Pellerin,
Philippe Chiquet,
V. Della Marca,
Simulation of the programming efficiency and the energy consumption of Flash memories during endurance degradation, International Semiconductor Conference (CAS), 2016, 2016
(10.1109/SMICND.2016.7783052)
(hal-01436469) |
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Philippe Chiquet,
J. Postel-Pellerin,
C. Tuninetti,
S. Souiki-Figuigui,
P. Masson,
Effect Of Short Pulsed Program/Erase Cycling On Flash Memory Devices, Workshop on New Perspectives in Measurements, Tools and Techniques for system’s reliability, maintainability and safety, 2016
()
(hal-01437034) |
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V. Della Marca,
M. Chambonneau,
S. Souiki-Figuigui,
J. Postel-Pellerin,
P. Canet,
Philippe Chiquet,
Edith Kussener,
F. Yengui,
R. Wacquez,
David Grojo,
Jean-Michel Portal,
M. Lisart,
NVM cell degradation induced by femtosecond laser backside irradiation for reliability tests, 2016 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2016
(10.1109/IRPS.2016.7574580)
(hal-01418479) |
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J. Postel-Pellerin,
Philippe Chiquet,
Gilles Micolau,
D. Boyer,
Indirect measurement of low tunneling currents through dielectrics using floating gate structures, IEEE International Conference on Dielectrics (ICD), 2016, pp.1065-1068
()
(hal-01594071) |
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Philippe Chiquet,
J. Postel-Pellerin,
C. Tuninetti,
S. Souiki-Figuigui,
P. Masson,
Enhancement of flash memory endurance using short pulsed program/erase signals, ACTA IMEKO, 2016, 5, pp.29-36
(10.21014/acta_imeko.v5i4.422)
(hal-01451431) |
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G. Micolau,
J. Postel-Pellerin,
Philippe Chiquet,
M. Joelson,
Chahine Abbas,
D. Boyer,
Caroline Giroux,
Toward an innovative stochastic modeling of electric charges losses trough dielectrics, Inter-Disciplinary Underground Science and Technology (i-DUST) Conference, 2016, 12, pp.9
(10.1051/e3sconf/20161204004)
(hal-01451874) |
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J. Postel-Pellerin,
Philippe Chiquet,
V. Della Marca,
T. Wakrim,
G. Just,
J.L. Ogier,
Improving Flash memory endurance and consumption with ultra-short channel-hot-electron programming pulses, 2014 International Semiconductor Conference (CAS), 2014
(10.1109/SMICND.2014.6966433)
(hal-01760566) |
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Philippe Chiquet,
Pascal Masson,
J. Postel-Pellerin,
Romain Laffont,
Gilles Micolau,
Frédéric Lalande,
Arnaud Regnier,
Experimental setup for non-destructive measurement of tunneling currents in semiconductor devices, Measurement - Journal of the International Measurement Confederation (IMEKO), 2014, 54, pp.234-240
(10.1016/j.measurement.2014.02.015)
(hal-01315418) |
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Philippe Chiquet,
P. Masson,
Gilles Micolau,
R. Laffont,
F. Lalande,
J. Postel-Pellerin,
A. Regnier,
Determination of physical properties of semiconductor-oxide-semiconductor structures using a new fast gate current measurement protocol., 11th IEEE International Conference on Solid Dielectrics, 2013
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(hal-01315415) |
